Parasitics Impact on the Performance of Rectifier Circuits in Sensing RF Energy Harvesting
Abstract
:1. Introduction
2. Design Process
3. Choice of Components
4. Circuit Design
Optimal Source Impedance
5. Parasitic Elements
5.1. Circuit Model
5.2. Discussion
5.3. Final Circuits
5.4. Performance Comparison of Passive Rectifiers
6. Conclusions
- The most harmful parasitics come from the components and not from the PCB. Therefore, if carefully chosen, cheaper PCBs can be utilized in order to reduce costs.
- Although the diode was known to be the limiting component in terms of losses, this work has demonstrated that it also causes a large deviation with respect to the expected frequency response. Actually, it has the most harmful parasitic element, contributing two-thirds of the total frequency displacements in both Cockcroft–Walton and half–wave circuits. In that sense, future MoS2 diodes could potentially help to improve the efficiency of rectifier circuits, since their parasitics are shown to be very low [24] compared to traditional Schottky diodes.
- The parasitic inductance associated with the capacitors is completely negligible. This fact allows one to use cheaper capacitors and reduce costs. It also allows one to use higher values of the capacitor in the rectifier stage, in order to reduce the DC output ripple when feeding the sensor. Note that the choice of this capacitor is a trade-off between the output ripple of the circuit, and its self-resonant frequency (SRF). The higher the value of the capacitor is, the lower the output ripple and the higher the parasitics. However, they do not affect the behavior of the circuit.
Author Contributions
Funding
Conflicts of Interest
References
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Model | Value | SRF (GHz) | Parasitic |
---|---|---|---|
4,841,372 (Fair-Rite) | 33 nH | 1.50 | 0.34 pF |
106–909 (Murata) | 8.2 nH | 4.00 | 0.19 pF |
795–8290 (TDK) | 4.3 nH | 7.64 | 0.10 pF |
464–6773 (AVX) | 33 pF | 2.20 | 0.16 nH |
532–2945 (TE Connect.) | 47 nH | 1.96 | 0.14 pF |
CW160,808 (Bourns) | 27 nH | 2.10 | 0.21 pF |
2,310,325 (Multicomp) | 2.7 pF | 4.97 | 0.38 nH |
ATC 500S (ATC) | 4.7 pF | 8.32 | 0.078nH |
2,809,454 (Kemet) | 27 pF | 4.84 | 0.040 nH |
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Alex-Amor, A.; Moreno-Núñez, J.; Fernández-González, J.M.; Padilla, P.; Esteban, J. Parasitics Impact on the Performance of Rectifier Circuits in Sensing RF Energy Harvesting. Sensors 2019, 19, 4939. https://doi.org/10.3390/s19224939
Alex-Amor A, Moreno-Núñez J, Fernández-González JM, Padilla P, Esteban J. Parasitics Impact on the Performance of Rectifier Circuits in Sensing RF Energy Harvesting. Sensors. 2019; 19(22):4939. https://doi.org/10.3390/s19224939
Chicago/Turabian StyleAlex-Amor, Antonio, Javier Moreno-Núñez, José M. Fernández-González, Pablo Padilla, and Jaime Esteban. 2019. "Parasitics Impact on the Performance of Rectifier Circuits in Sensing RF Energy Harvesting" Sensors 19, no. 22: 4939. https://doi.org/10.3390/s19224939
APA StyleAlex-Amor, A., Moreno-Núñez, J., Fernández-González, J. M., Padilla, P., & Esteban, J. (2019). Parasitics Impact on the Performance of Rectifier Circuits in Sensing RF Energy Harvesting. Sensors, 19(22), 4939. https://doi.org/10.3390/s19224939