Li, Y.; Zha, G.; Wei, D.; Yang, F.; Dong, J.; Xi, S.; Xu, L.; Jie, W.
Effect of Deep-Level Defects on the Performance of CdZnTe Photon Counting Detectors. Sensors 2020, 20, 2032.
https://doi.org/10.3390/s20072032
AMA Style
Li Y, Zha G, Wei D, Yang F, Dong J, Xi S, Xu L, Jie W.
Effect of Deep-Level Defects on the Performance of CdZnTe Photon Counting Detectors. Sensors. 2020; 20(7):2032.
https://doi.org/10.3390/s20072032
Chicago/Turabian Style
Li, Yingrui, Gangqiang Zha, Dengke Wei, Fan Yang, Jiangpeng Dong, Shouzhi Xi, Lingyan Xu, and Wanqi Jie.
2020. "Effect of Deep-Level Defects on the Performance of CdZnTe Photon Counting Detectors" Sensors 20, no. 7: 2032.
https://doi.org/10.3390/s20072032
APA Style
Li, Y., Zha, G., Wei, D., Yang, F., Dong, J., Xi, S., Xu, L., & Jie, W.
(2020). Effect of Deep-Level Defects on the Performance of CdZnTe Photon Counting Detectors. Sensors, 20(7), 2032.
https://doi.org/10.3390/s20072032