Sampath, V.; Maurtua, I.; Aguilar MartÃn, J.J.; Iriondo, A.; Lluvia, I.; Aizpurua, G.
Intraclass Image Augmentation for Defect Detection Using Generative Adversarial Neural Networks. Sensors 2023, 23, 1861.
https://doi.org/10.3390/s23041861
AMA Style
Sampath V, Maurtua I, Aguilar MartÃn JJ, Iriondo A, Lluvia I, Aizpurua G.
Intraclass Image Augmentation for Defect Detection Using Generative Adversarial Neural Networks. Sensors. 2023; 23(4):1861.
https://doi.org/10.3390/s23041861
Chicago/Turabian Style
Sampath, Vignesh, Iñaki Maurtua, Juan José Aguilar MartÃn, Ander Iriondo, Iker Lluvia, and Gotzone Aizpurua.
2023. "Intraclass Image Augmentation for Defect Detection Using Generative Adversarial Neural Networks" Sensors 23, no. 4: 1861.
https://doi.org/10.3390/s23041861
APA Style
Sampath, V., Maurtua, I., Aguilar MartÃn, J. J., Iriondo, A., Lluvia, I., & Aizpurua, G.
(2023). Intraclass Image Augmentation for Defect Detection Using Generative Adversarial Neural Networks. Sensors, 23(4), 1861.
https://doi.org/10.3390/s23041861