Fort, A.; Landi, E.; Moretti, R.; Mugnaini, M.; Liguori, C.; Paciello, V.; Dello Iacono, S.
Influence of Front-End Electronics on Metrological Performance of QCM Systems. Sensors 2024, 24, 3401.
https://doi.org/10.3390/s24113401
AMA Style
Fort A, Landi E, Moretti R, Mugnaini M, Liguori C, Paciello V, Dello Iacono S.
Influence of Front-End Electronics on Metrological Performance of QCM Systems. Sensors. 2024; 24(11):3401.
https://doi.org/10.3390/s24113401
Chicago/Turabian Style
Fort, Ada, Elia Landi, Riccardo Moretti, Marco Mugnaini, Consolatina Liguori, Vincenzo Paciello, and Salvatore Dello Iacono.
2024. "Influence of Front-End Electronics on Metrological Performance of QCM Systems" Sensors 24, no. 11: 3401.
https://doi.org/10.3390/s24113401
APA Style
Fort, A., Landi, E., Moretti, R., Mugnaini, M., Liguori, C., Paciello, V., & Dello Iacono, S.
(2024). Influence of Front-End Electronics on Metrological Performance of QCM Systems. Sensors, 24(11), 3401.
https://doi.org/10.3390/s24113401