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Journal: Sensors, 2024
Volume: 24
Number: 5157
Article:
Hybrid Bright-Dark-Field Microscopic Fringe Projection System for Cu Pillar Height Measurement in Wafer-Level Package
Authors:
by
Dezhao Wang, Weihu Zhou, Zili Zhang and Fanchang Meng
Link:
https://www.mdpi.com/1424-8220/24/16/5157
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