Klarák, J.; Andok, R.; Malík, P.; Kuric, I.; Ritomský, M.; Klačková, I.; Tsai, H.-Y.
From Anomaly Detection to Defect Classification. Sensors 2024, 24, 429.
https://doi.org/10.3390/s24020429
AMA Style
Klarák J, Andok R, Malík P, Kuric I, Ritomský M, Klačková I, Tsai H-Y.
From Anomaly Detection to Defect Classification. Sensors. 2024; 24(2):429.
https://doi.org/10.3390/s24020429
Chicago/Turabian Style
Klarák, Jaromír, Robert Andok, Peter Malík, Ivan Kuric, Mário Ritomský, Ivana Klačková, and Hung-Yin Tsai.
2024. "From Anomaly Detection to Defect Classification" Sensors 24, no. 2: 429.
https://doi.org/10.3390/s24020429
APA Style
Klarák, J., Andok, R., Malík, P., Kuric, I., Ritomský, M., Klačková, I., & Tsai, H. -Y.
(2024). From Anomaly Detection to Defect Classification. Sensors, 24(2), 429.
https://doi.org/10.3390/s24020429