Order Article Reprints

Carulla M, Barten R, Baruffaldi F, Bergamaschi A, Borghi G, Boscardin M, Brückner M, Butcher TA, Centis Vignali M, Dinapoli R, et al. Quantum Efficiency Measurement and Modeling of Silicon Sensors Optimized for Soft X-ray Detection. Sensors. 2024; 24(3):942. https://doi.org/10.3390/s24030942

Carulla, Maria, Rebecca Barten, Filippo Baruffaldi, Anna Bergamaschi, Giacomo Borghi, Maurizio Boscardin, Martin Brückner, Tim A. Butcher, Matteo Centis Vignali, Roberto Dinapoli, and et al. 2024. "Quantum Efficiency Measurement and Modeling of Silicon Sensors Optimized for Soft X-ray Detection" Sensors 24, no. 3: 942. https://doi.org/10.3390/s24030942

Carulla, M., Barten, R., Baruffaldi, F., Bergamaschi, A., Borghi, G., Boscardin, M., Brückner, M., Butcher, T. A., Centis Vignali, M., Dinapoli, R., Ebner, S., Ficorella, F., Fröjdh, E., Greiffenberg, D., Hammad Ali, O., Hasanaj, S., Heymes, J., Hinger, V., King, T., ... Zhang, J. (2024). Quantum Efficiency Measurement and Modeling of Silicon Sensors Optimized for Soft X-ray Detection. Sensors, 24(3), 942. https://doi.org/10.3390/s24030942