Li, J.; Zhao, M.; Liu, Y.; Chai, N.; Ye, F.; Qin, H.; Cheng, L.; Zhang, L.
Microstructure and Dielectric Properties of LPCVD/CVI-SiBCN Ceramics Annealed at Different Temperatures. Materials 2017, 10, 655.
https://doi.org/10.3390/ma10060655
AMA Style
Li J, Zhao M, Liu Y, Chai N, Ye F, Qin H, Cheng L, Zhang L.
Microstructure and Dielectric Properties of LPCVD/CVI-SiBCN Ceramics Annealed at Different Temperatures. Materials. 2017; 10(6):655.
https://doi.org/10.3390/ma10060655
Chicago/Turabian Style
Li, Jianping, Mingxi Zhao, Yongsheng Liu, Nan Chai, Fang Ye, Hailong Qin, Laifei Cheng, and Litong Zhang.
2017. "Microstructure and Dielectric Properties of LPCVD/CVI-SiBCN Ceramics Annealed at Different Temperatures" Materials 10, no. 6: 655.
https://doi.org/10.3390/ma10060655
APA Style
Li, J., Zhao, M., Liu, Y., Chai, N., Ye, F., Qin, H., Cheng, L., & Zhang, L.
(2017). Microstructure and Dielectric Properties of LPCVD/CVI-SiBCN Ceramics Annealed at Different Temperatures. Materials, 10(6), 655.
https://doi.org/10.3390/ma10060655