3.1. First DoE Model Based on the Line Roughness (Ra)
The DoE surfaces are presented in
Figure 4 and the topography measurements are given in
Table 2. As can be seen from the figure and table, the surfaces have very different aspects and also topographical values. The experiments at high velocity and low temperature are very much at the limit of melting the material. This may come from the approximations in the model and also some uncertainties on the parameters used in the simulations, especially the absorption coefficient. This is not a problem for these first experiments as they are basically a screening of the parameters in order to find their influence for later optimization.
A proper statistical analysis of the DoE values obtained for the line roughness
Ra revealed the effects of the parameters and interactions and they are given in
Figure 5 and Equation (3). This analysis of the parameters shows that three main parameters; the velocity (
v = +0.25), temperature (
T = −0.20) and overlap (
O = −0.14) have the biggest influence on the line roughness
Ra. In contrast, all interactions as well as the spot diameter have a much lesser influence. Thus, for the DoE model, only these three main influencing parameters were kept. To confirm that these parameters are relevant and significant, an
ANOVA with a 95% confidence interval was performed and the results are shown in
Table 5. In this table, only the terms with a
p-value (probability of error) equal or less than 0.05, which gives a 95% confidence interval or higher, are considered significant. In contrast, terms with
p-values larger than 0.1 are neglected. The
F value presented in
Table 5 is defined as:
where the mean square of terms (
MSTerms) is the ratio of the sum of squares within terms to its degree of freedom
, and similarly
. Equation (2) is a statistical test to verify the hypothesis that no differences exist between the two means (also known as a “null hypothesis”). If so, it means that the observed difference is due to either chance or noise alone. It is common practice that for effects with
F values larger than three times their standard error (residual) (
F > 3), the null hypothesis is rejected [
28]. Inspection of
Table 5 indicates that the model constructed from the selected main factors has an
F value of about 14.5 indicating that the model is significant. From this table, the model has a
p-value of 0.0001 revealing that there is only a 0.01% probability that this model occurs due to noise. The fact that all
p-values are less than 0.1 confirms that they all are significant so the model achieved a 95% certainty.
Figure 5.
Bar charts showing the half-effects of the parameters and interactions in decreasing order. A positive effect means an increase in the parameter leads to an increase in the roughness, a negative effect does the opposite.
Figure 5.
Bar charts showing the half-effects of the parameters and interactions in decreasing order. A positive effect means an increase in the parameter leads to an increase in the roughness, a negative effect does the opposite.
Table 5.
Analysis of variance (ANOVA) for Ra (SS: Sum of square; DF: degree of freedom; MS: mean square).
Table 5.
Analysis of variance (ANOVA) for Ra (SS: Sum of square; DF: degree of freedom; MS: mean square).
Parameter | SS | DF | MS | F | p-Value |
---|
Model | 1.72 | 3 | 0.57 | 14.51 | 0.0001 |
V | 0.87 | 1 | 0.87 | 21.94 | 0.0003 |
T | 0.35 | 1 | 0.35 | 8.94 | 0.0092 |
O | 0.24 | 1 | 0.24 | 6.19 | 0.0251 |
Curvature | 7.15 × 10−3 | 1 | 7.15 × 10−3 | 0.18 | 0.6765 |
Residual | 0.59 | 15 | 0.039 | | |
Lack of Fit | 0.16 | 12 | 0.013 | 0.094 | 0.9989 |
Pure Error | 0.43 | 3 | 0.14 | | |
Total | 2.32 | 19 | | | |
As mentioned in
Section 2.1, although the model is assumed to be linear, the
ANOVA proves that the
2k factorial design functions very well [
21]. Nevertheless, if the model was built taking into account the interaction terms, the model may be subjected to quadratic effects or second-order curvature [
21]. Under such circumstances, it is advised to control the model for curvature, and this can be achieved by adding center points. In
Table 5, the
p-value for the curvature is 0.68, which indicates that the quadratic effects seem not significant and so we can neglect the curvature assumption. We can conclude that this first-order model with the main factors and interactions is suitable.
The final equation in terms of coded values is written as follows:
The
R-square value (
R2), adjusted-
R2 and predicted-
R2 of this model are 0.91, 0.86, and 0.79, respectively. The
R2 is high enough for a simple semi-empirical model with just three main effects to describe the 16 experiments. The adjusted-
R2 for this simple model is very close as only three terms are kept in this model. A large difference between
R2 and adjusted-
R2 could be a sign of overfitting which is not the case for this model. The predicted-
R2 is also good which indicates that the model correctly predicts the measured point as illustrated in
Figure 6 which plots the predicted-
Ra (calculated from Equation (3)) versus the experimentally measured values. A high correlation coefficient of 0.93 is observed.
Figure 6.
Predicted Ra vs. measured Ra for the first DoE model.
Figure 6.
Predicted Ra vs. measured Ra for the first DoE model.
Based on the above analysis, we also found that the velocity is the main effect influencing the line roughness
Ra. One of the explanations for this result could be that an increase in the laser velocity tends to create a more elongated melt pool as observed via the FEM simulation in Meylan et al. [
22] (i.e., the width perpendicular to the travel direction becomes shorter). A narrower melt pool means a redistribution of the material on a smaller surface and so a reduced efficiency of the LP process. Another effect of a narrow melt pool is a larger temperature gradient that can lead to an increase in thermos-capillary flows and so be detrimental to the LP process. Finally, a lower velocity also implies more time for the redistribution of the material in the liquid state. As suggested by the model, a decrease in the velocity below the values tested in the first DoE may still have the potential to improve the roughness and, thus, we decided to vary this parameter to lower velocities for the DoE optimization.
The next parameter having an influence on Ra is the temperature. An increase in the temperature, and, by consequence, the laser power, also produces a larger and deeper melt pool. This means, as for the velocity, a redistribution of the material over a larger surface with the possibility of removing larger fluctuations of the surface. It is particularly true for rough samples such as the one employed in this study where the peak-to-valley height difference can be over 30 µm. Hence, it is necessary to produce a deep enough melt pool to eliminate this kind of surface variation. As for the velocity, the temperature will be varied in the DoE optimization as the model shows the potential for more roughness reduction at a higher temperature.
The overlap is the last main factor to have a significant influence on
Ra. In LP, a large overlap is also beneficial, and this was also observed by Chow et al. [
29]. A large overlap means that a large part of the previous line is re-melted and re-processed. This can improve the LP as it can remove some surface structure produced by the LP, in particular at the edge of the melted zone. Our model predicts also a better roughness for higher overlap. However, an increase in the overlap also leads to an exponential increase in the number of lines and so of processing time. In order to keep the process profitable, the overlap was kept to 90% for the DoE optimization.
Finally, the spot size diameters tested in this study do not have a significant influence on the line roughness Ra. By definition, the line roughness is a measure of the surface variations occurring over short lateral distances (in our case, the filter was set at 0.8 mm). It would still be expected that a smaller spot size of 0.6 mm does not remove the defects with a wavelength between 0.6 and 0.8 mm. However, it seems not to be the case as no significant differences are observed between the two tested spot sizes. A reason can be due to the Gaussian filter with a cut-off set at 0.8 mm. Actually, a Gaussian filter does not go from 100% transmission to 0% as a step function but gradually and so the filtering certainly starts to already cut some wavelengths above 0.5 mm. This would mean that the influence of the wavelength between 0.6 and 0.8 mm is reduced as compared to the shorter wavelength on the measurement of the Ra.
Figure 7 shows a typical example of a 17 × 7 mm
2 surface before and after LP with the conditions of DoE 4 in
Table 2.
Figure 7a,b are the unfiltered surfaces that are a combination of roughness and waviness.
Figure 7c,d show only the roughness after filtering and a cut-off of 0.8 mm. Finally,
Figure 7e,f are only the waviness part of the surface (beware of the change of the height scale for the waviness). By comparing the images before and after the LP process, a big reduction in the
Sa value is observed and a detailed inspection shows that most of the reduction is due to the diminution of the roughness (
Figure 7c,d). Indeed, the roughness map after LP (
Figure 7d) is mostly flat (single color yellow-green) with just a few shallow craters (see black arrows) randomly distributed over the surface. In contrast, the waviness map is only slightly affected by the LP process. The highest pics (in white) and lowest valleys (dark blue) have disappeared, and this explains the small reduction in the
Wa value from 1.21 to 1.07 µm. This result is not surprising since the waviness maps represent surface defects with a wavelength over 0.8 mm and the spot sizes used in the study were 0.6 and 0.9 mm with melt pool size slightly below these values. Therefore, the LP process cannot remove defects above a critical wavelength. Richter et al. [
12] have recently adapted a criterion developed for pulsed micro-polishing from Perry et al. [
30] to estimate the critical spatial frequency of defects that can be removed by LP. The width of the melt pool can be used as a first approximation for the critical wavelength (i.e., the inverse of the critical frequency) from the values presented by Richter et al. [
12]. Hence, it is clear that LP has just a minimal influence on the LP of surface defects bigger than the melt pool size and it is confirmed by the present results.
3.2. First DoE Model Based on the Waviness (Wa)
The same approach as for the roughness was applied to the waviness values shown in
Table 2. The half-effects are shown in
Figure 8a. For the waviness, the transition is not as clear between the significant parameters and the lesser ones. Consequently, as a first model, only the effects with values of the half-effect higher than |0.60| are selected. These effects are:
T,
v·
T,
Ø, and
Ø·
T·
O. As can be seen, the model is not as simple as for the roughness as there are two interactions between the factors that are significant. In addition, it is found that some interactions contain main parameters that are themselves not significant. It is the case for the velocity and overlap. Even if it is common to consider all main parameters that are significant in the interactions, we decided to do otherwise. The main reasons were two-fold. First, we wanted to keep the model as simple as possible. Second, taking into account the insignificant main parameters decreased the reliability of the model. The
ANOVA of the model with the selected effects is shown in
Table 6. The spot size (
Ø) parameter is just marginally significant as it is below 0.1, but above the 0.05 limit for 95% significance. This parameter was still kept as it improves the overall model. The curvature was not tested, as the spot size does not have a center point and is present in the model.
Table 6.
Analysis of variance (ANOVA) for Ra (SS: Sum of square; DF: degree of freedom; MS: mean square).
Table 6.
Analysis of variance (ANOVA) for Ra (SS: Sum of square; DF: degree of freedom; MS: mean square).
Parameter | SS | DF | MS | F | p-Value |
---|
Model | 0.43 | 4 | 0.11 | 7.2 | 0.0019 |
Ø | 0.055 | 1 | 0.055 | 3.69 | 0.074 |
T | 0.13 | 1 | 0.13 | 8.67 | 0.0101 |
T·v | 0.13 | 1 | 0.13 | 8.52 | 0.0106 |
Ø·T·O | 0.092 | 1 | 0.092 | 6.12 | 0.0258 |
Residual | 0.22 | 15 | 0.015 | | |
Lack of Fit | 0.15 | 12 | 0.012 | 0.47 | 0.8471 |
Pure Error | 0.077 | 3 | 0.026 | | |
Total | 0.65 | 19 | | | |
Figure 8.
(a) Bar charts showing the half-effects of the parameters and interactions in decreasing order for Wa. A positive effect means an increase in the parameter leads to an increase in the waviness, a negative effect does the opposite. (b) Wa predicted with the waviness model versus actual measured values.
Figure 8.
(a) Bar charts showing the half-effects of the parameters and interactions in decreasing order for Wa. A positive effect means an increase in the parameter leads to an increase in the waviness, a negative effect does the opposite. (b) Wa predicted with the waviness model versus actual measured values.
The final equation in terms of coded values is written as follows:
The
R-square value (
R2), adjusted-
R2 and predicted-
R2 of this model are 0.66, 0.57, and 0.43, respectively. Although, these values are lower than the ones for
Ra, this is not surprising since, as already explained, the LP process does not have a big influence on the waviness. This can be seen in the relatively low dispersion of the waviness values. As the process does not influence the waviness much, it is thus normal that the individual parameters have less effect on the waviness. The model is still acceptable as can be seen from the predicted value vs. the actual values plot in
Figure 8b. A relatively high correlation coefficient of 0.79 is observed.
Based on this model, some process maps can be made. They revealed that the optimum corners of high temperature and low speed with a high overlap are profitable for the process. This is an excellent result as these observations are consistent with the results obtained for the roughness
Ra. The main difference, in this case, is that the spot size has an influence as illustrated in
Figure 9a,b. Both figures show the influence of the temperature and velocity for an overlap of 90%, but in the first case (
Figure 9a) with the small spot size (0.6 mm) and the larger spot size (0.9 mm) in the second (
Figure 9b). It is evident that the corner of high temperature and low velocity gives a lower waviness for the larger spot size. For this reason, the larger spot size was selected for the DoE optimization. A larger optic to test an even higher spot size was not possible to organize due to time and cost constraints.
3.3. Optimization of the DoE
Following the results in
Section 3.1 and
Section 3.2, an optimization of the process parameters was performed to obtain the best LP with one scan. As explained, the temperature was increased, and the speed was lowered. In contrast, the overlap and spot size were kept constant at 90% and 0.9 mm to minimize the processing time. The test parameters and topography measurements are shown in
Table 4. A picture of the surfaces obtained with new tests is also shown in
Figure 10. Obviously, when comparing
Figure 10 with
Figure 4, all surfaces have been significantly improved with roughness well below 1 µm. The results are close to a minimum and so the linear assumption of the DoE is not valid. The evolution of the roughness and waviness as a function of temperature and velocity is shown in
Figure 11a,b, respectively. Based on
Figure 11a, an increase in the temperature to 2080 °C is still very beneficial for the LP process as it decreases both the roughness and waviness for a given velocity. Further increase in the temperature is not recommended as it does almost not affect the roughness and slightly increases the waviness of the surface. In
Figure 11b, it is seen that reducing the velocity below 50 mm/s does not lead to a significant decrease in the roughness or waviness. Actually, at 20 mm/s, even an increase in the waviness is observed. From an industrial point of view, reducing the velocity increases the processing time and so increases the processing cost. Hence, it is not advised to decrease the velocity below 35 mm/s.
The results observed in our DoE optimization are consistent with several studies where an increase in the energy density (ED) from the melting point leads first to a decrease in the roughness to an optimal followed by an increase in the roughness [
2,
14,
31]. Ukar et al. [
2] attributed this transition from shallow surface melting (SSM) to surface over-melt (SOM). According to them, the transition occurs when the thickness of the melt pool increases above the peak-to-valley height, which creates a material melt pool. In this melt pool, they argue that the convection flow starts to be dominant and creates waves in the melt pool that augments the roughness of the re-solidified part. Based on our results, we believe that it is more likely that the convection effects are always present in the melt pool, but the optimum temperature marks a transition at which the reduction in the roughness by LP is outbalanced by the creation of roughness by LP through convective flow or Marangoni effect as both increases with the temperature.
A velocity decrease does not always lead to a better LP and the origin of this behavior is not perfectly clear. Preliminary results show that variations of the velocity due to the linear stage employed in this work could explain the periodic variations (see black arrows in
Figure 12f) observed on the surface and so an increase in waviness.
Similarly to
Figure 7,
Figure 12 shows the topography measurement but for the test Optim 6 (35 mm/s; 2220 °C). It can be observed that the roughness is one of the lowest in
Table 4 and very close to the minimum possible with the current process. Already on the roughness measurement (
Figure 12d), lines due to the process are visible and an increase in the temperature does not decrease these lines. The only way to make them disappear would be to make a second passage of LP or another polishing method. The waviness of the polished sample, in this case, has almost no common feature with the original surface (
Figure 12e,f). The peaks and valleys in
Figure 12e are not recognizable in
Figure 12f. On the other hand, some periodic structures were added on the surface, and they might be due to the velocity variations of the linear stage. The major changes in the waviness go against the critical frequency limit developed for continuous laser [
12] discussed previously. However, as noted by Richter et al. [
12], the criterion already showed some errors especially to estimate the critical frequency in the direction of the displacement. The present results confirm the issue of directly transferring the critical frequency developed for pulse micro-polishing [
30]. As a continuous melt pool is always present, the transport of material is, thus, possible over distances longer than the melt pool under certain conditions. The change of the waviness perpendicularly to the displacement is not easy to explain. It can be due to the high overlap used (90%) which means that each region of the sample saw 10 times the laser beam. This could, then, redistribute the material over and over again till the original waviness topography is lost.
Figure 12.
Topography measurement for the test Otpim 6 before (left-hand side) and after (right-hand side) LP. (a,b) show the unfiltered filtered (Sa), (c,d) show only the roughness of the surface with a cut-off of 0.8 mm (Ra) (e,f) show only the waviness of the surface with a cut-off of 0.8 mm (Wa). For each line, the vertical color scale is the same in order to compare the surfaces and is indicated in the middle.
Figure 12.
Topography measurement for the test Otpim 6 before (left-hand side) and after (right-hand side) LP. (a,b) show the unfiltered filtered (Sa), (c,d) show only the roughness of the surface with a cut-off of 0.8 mm (Ra) (e,f) show only the waviness of the surface with a cut-off of 0.8 mm (Wa). For each line, the vertical color scale is the same in order to compare the surfaces and is indicated in the middle.
3.4. Microstructure of the Re-Melted Layer and Heat Affected Zone
A typical microstructure of a single line of LP is shown in
Figure 13a. The melted layer (see red arrow) has a maximum depth of 42 µm. Below the melted area, there is a large heat-affected zone (HAZ; see blue arrow). The HAZ appears clearly on the image as a lighter gray area with a maximum depth of around 210 µm. The HAZ consists mostly of untempered martensite and is almost not etched by the nital reagent. The round shapes visible at the periphery of the HAZ are, actually, not pores but an artefact resulting from the etching process. The bulk microstructure is found below the HAZ and consists of tempered martensite. The width and depth of the melted layer and HAZ are given in
Table 7.
As expected, an increase in the temperature leads to an increase in the size of the melted layer and HAZ. A reduction in the velocity has the same effect. The depth of the melted layer is close to the depth-to-valley height (≈30–40 µm) for most of the tests apart from the ones at 20 mm/s and the two highest temperatures (≈60–90 µm). This is also a sign that these conditions are in the SOM regime [
2] and explains the higher waviness obtained with these conditions.
The EBSD maps are also shown in
Figure 13b,c.
Figure 13b shows the inverse pole figure (IPF) of the surface and reveals the grains. The re-melted layer consists of relatively large grains that grow through the complete layer thickness (columnar growth) situated at the top right of
Figure 13b,c. The HAZ and bulk microstructures are not distinguished by these measurements. The main difference is an increase in black regions (grain boundaries) which is a sign of worse quality of the EBSD map. This is due to a martensitic transformation that creates a large strain of the lattice and small grains.
Figure 13c shows a phase distribution of austenite, martensite and ferrite. It is surprising that given the high cooling rate observed in LP, the re-melted layer consists only of residual austenite. An explanation is that the electro-machined surface has a different carbon concentration as compared to the bulk material (see
Table 8). The reason is that it is known that carbon promotes austenite stability. Hence, the austenite in the re-melted layer has become a stable phase, which is not the case for the bulk of the original tool steel. To confirm this hypothesis, the same LP treatment was performed on the disk of the same material but without an EDM surface. In this sample, no residual austenite was found in the re-melted layer and the martensitic transformation occurred as evident from
Figure 14. Actually, the microstructure of the re-melted layer is identical to the HAZ. The bulk microstructure was, in this case, not hardened steel and the grains are well visible outside the HAZ.
Figure 13.
(a) optical micrograph after etching of the cross-section of a single line made with the laser parameter of Optim 9. (b) EBSD inverse pole figure (IPF) map in color-coded as well as the grain boundaries in black of the same cross-section. (c) EBSD phase map (color coded).
Figure 13.
(a) optical micrograph after etching of the cross-section of a single line made with the laser parameter of Optim 9. (b) EBSD inverse pole figure (IPF) map in color-coded as well as the grain boundaries in black of the same cross-section. (c) EBSD phase map (color coded).
Table 7.
Measurements of the re-melted layer and HAZ for the optimization tests.
Table 7.
Measurements of the re-melted layer and HAZ for the optimization tests.
Tests Coded Factors | DoE Parameters Real Values | Power | Responses |
---|
| Ø | v | T | O | Width Melt | Depth Melt | Width HAZ | Depth HAZ |
---|
| [mm] | [mm/s] | [°C] | [%] | [W] | [µm] | [µm] | [µm] | [µm] |
---|
Optim 1 (1,−1,−1,1) | 0.9 | 20 | 1940 | - | 326 | 880 | 40 | 1133 | 262 |
Optim 2 (1,−1,0,1) | 0.9 | 20 | 2080 | - | 359 | 964 | 60 | 1230 | 291 |
Optim 3 (1,−1,1,1) | 0.9 | 20 | 2220 | - | 391 | 1015 | 87 | 1238 | 322 |
Optim 4 (1,0,−1,1) | 0.9 | 35 | 1940 | - | 365 | 809 | 31 | 1046 | 213 |
Optim 5 (1,0, 0,1) | 0.9 | 35 | 2080 | - | 401 | 850 | 36 | 1047 | 223 |
Optim 6 (1,0,1,1) | 0.9 | 35 | 2220 | - | 438 | 931 | 43 | 1086 | 254 |
Optim 7 (1,1,−1,1) = DoE 12 | 0.9 | 50 | 1940 | - | 399 | 629 | 19 | 896 | 142 |
Optim 8 (1,1,0,1) | 0.9 | 50 | 2080 | - | 438 | 821 | 28 | 998 | 200 |
Optim 9 (1,1,1,1) | 0.9 | 50 | 2220 | - | 478 | 871 | 42 | 1050 | 211 |
Table 8.
Chemical composition measured on the EDM surface and on for the bulk, below is the target values defines for X38CrMoV5-1 steel.
Table 8.
Chemical composition measured on the EDM surface and on for the bulk, below is the target values defines for X38CrMoV5-1 steel.
| C | Si | Mn | P | S | Cr | Mo | Ni | Cu | V | W | Fe |
---|
| % | % | % | % | % | % | % | % | % | % | % | % |
---|
EDM | 1.68 | 0.901 | 0.273 | 0.016 | 0.003 | 4.847 | 1.274 | 0.206 | 1.44 | 0.466 | 0.128 | 88.63 |
Bulk | 0.417 | 0.849 | 0.333 | 0.009 | 0.003 | 5.007 | 1.253 | 0.227 | 0.066 | 0.444 | 0.105 | 91.15 |
Min. | 0.33 | 0.8 | 0.25 | | | 4.8 | 1.1 | | | 0.3 | | |
Max. | 0.41 | 1.2 | 0.5 | 0.03 | 0.02 | 5.5 | 1.5 | | | 0.5 | | |
Figure 14.
EBSD maps of a disk made of X38CrMoV5-1 tool steel without electro-machined surface for (a) raw material and (b) after LP treatment.
Figure 14.
EBSD maps of a disk made of X38CrMoV5-1 tool steel without electro-machined surface for (a) raw material and (b) after LP treatment.