Problems and Solution Methods of Machine Scheduling in Semiconductor Manufacturing Operations: A Survey
Abstract
:1. Introduction
- (1)
- Complex processing steps. It is common for a single process flow to consist of 300–900 processing steps over hundreds of machines and perhaps ten or more major process flows in wafer fabrication [14].
- (2)
- Reentrant flows. Wafers need to revisit some workstations multiple times to build the prescribed circuitry patterns, which complicates the production system greatly.
- (3)
- Diverse machine types. Wafers are generally transported in a lot of 25 units by FOUPs. Fabs have four typical machine types, i.e., batch processing machines (multiple lots per process), lot processing machines (single lot per process), discrete processing machines (single wafer per process), and cluster tools. A production line is composed of a mixed combination of these machine types, where improper coordination could lead to increased flow variability and excessive delays.
- (4)
- Distinct processing characteristics. Depending on the nature of machines and jobs, SMOs incorporate distinct processing constraints, e.g., batch processing, auxiliary resources, sequence-dependent setups, and multiple orders per job (MOJ).
- (5)
- Integral decisions. SMOs scheduling needs to be coordinated with other shop-floor control decisions, e.g., preventive maintenance (PM) and advanced process control (APC).
2. Processing Characteristics, Classifications, and Notations
2.1. Processing Characteristics
- (1)
- Batch processing. Diffusion furnaces in the oxidation/diffusion and burn-in oven in the final testing operations are typical batch processing machines, where a batch of jobs can be processed simultaneously. However, jobs from different job families cannot be batched together in the diffusion furnace because the chemical elements of job families could be different, which may contaminate jobs from other families. This is usually referred to as incompatible job families. In batch machine scheduling problems, decisions include how to form batches and how to sequence batches. If jobs have unequal release times, the decision of whether to wait for impending jobs to build a fuller batch or to process current jobs in the batch right away should be determined. Mathirajan and Sivakumar [17] presented a literature meta-analysis for deterministic batch machine scheduling problems from SMOs, while Koo and Moon [23] provided a survey on real-time control strategies based on threshold and look-ahead policies for similar problems. More recently, Fowler and Mönch summarized the compatible and incompatible batch scheduling problems and the corresponding solution methodologies [24].
- (2)
- Auxiliary resource. Several SMOs rely on auxiliary resources to proceed. For instance, the photolithography step consists of coating, exposing, and developing operations to frame various regions in ICs. Patterns are transferred to wafer surfaces through reticles. Jobs can be processed only when both stepper machines and reticles are available. Since the patterns of different products and different layers of a product are not the same, and few reticles for each pattern are stocked, how to schedule jobs, machines, and reticles is a significant problem in this process. Similarly, test stations in the final testing stage require multiple auxiliary resources including tester, kit, and enabler assembly. Sometimes, jobs requiring the same auxiliary resources are processed serially in order to reduce machine setup time, which is also known as serial-batching, compared to the parallel-batching of batch processing machines.
- (3)
- Sequence-dependent setup times. Machine setup is a common procedure, which is defined as the time required to prepare necessary resources to perform a task. For example, impurity doping introduces controlled amounts of impurities into wafers in order to change their electronic properties, which could be different for various jobs. Hence, the dopant for each job or job family is not the same and thus needs to be changed frequently, in which case the sequence-dependent setup times should be considered. Setup times are sometimes job-family-based, which means jobs from incompatible families require longer setup times. A survey that specifically considers scheduling problems under setup times/costs can be found in [25].
- (4)
- Reentrant flows. Reentrant flows refer to jobs entering into production lines more than once, which is an intrinsic characteristic for many SMOs, especially for the photolithography and etching stations. Reentrant flows complicate production lines because jobs with different processing status compete for the same production resources. An inappropriate job scheduling with reentrant flows could lead to increased cycle times. Lin and Lee [26] summarized scheduling problems concerning reentrant flows and emphasized the commonly used solution methods.
- (5)
- Advance process control (APC). APC maintains machine process qualifications so as to prevent process excursions and increase tool utilization. Typical APC constraints include equipment health index, equipment qualification, preventive maintenance, and run-to-run control loop [27]. For instance, Obeid et al. [28] considered a qualification-run constraint, which refers to the action of conducting a test run if a machine has not processed certain job families for a pre-specified period that can either be measured in terms of time (time-based) or the number of jobs processed (count-based). Duc et al. [29] investigated preventive maintenance (PM) together with machine scheduling in the etching operation. As chemical substances are accumulated over time during the process, suitable PM schedules, i.e., regular cleaning should be maintained to prevent yield loss. Sometimes, a maximum processing time window or overlapping/nested time window should be imposed between two or more consecutive operations. Otherwise, wafers could be contaminated. More information about binding scheduling decisions with APC systems for SMOs could be found in [27].
- (6)
- Multiple order per jobs (MOJ). As shown in [30], if each customer order is assigned to one FOUP in the 300 mm wafer fab, an extremely large number of FOUPs would need to be maintained, which can increase AMHS congestion. In practice, orders from multiple customers are combined into a single job in the FOUP in order to reduce the AMHS workload. This is commonly termed as MOJ scheduling, which are challenging as delivery performance is assessed at the order level while scheduling is made at the job level. Depending on machine types, MOJ scheduling can be further divided into moj(item), moj(lot), and moj(batch) for item-, lot-, and batch-processing machines. For moj(item), job processing time is the sum of processing time of all wafers in all orders; for moj(lot), job processing time is equal to the processing time of a single wafer; for moj(batch), job processing time is equal to the longest processing time of the jobs containing different customer orders. The MOJ scheduling mainly involves two decisions, that is, how to group orders and how to schedule jobs.
- (7)
- Other characteristics. For instance, machine dedication indicates a machine may only be capable of processing a certain set of jobs. As specifications of new ICs evolve, old machines may not have the required processing capabilities. Hence, jobs should be scheduled to dedicated machines. In addition, process precedence constraint is a common constraint when studying scheduling problems involving multiple sequential operations.
2.2. Classifications and Notations
3. Single Machine
3.1. Deterministic Scheduling
3.1.1. Batch Machine Scheduling Problems
3.1.2. Non-Batch Machine Scheduling Problems
3.2. Stochastic and Dynamic Scheduling
4. Parallel Machines
4.1. Deterministic Scheduling
4.1.1. Batch Machine Scheduling Problems
4.1.2. Non-Batch Machine Scheduling Problems
4.2. Stochastic and Dynamic Scheduling
4.2.1. Batch Machine Scheduling Problems
4.2.2. Non-Batch Machine Scheduling Problems
5. Flow Shops
5.1. Deterministic Scheduling
5.1.1. Flow Shops
5.1.2. Hybrid (Flexible) Flow Shops
5.2. Stochastic and Dynamic Scheduling
5.2.1. Flow Shops
5.2.2. Hybrid (Flexible) Flow Shops
6. Job Shops
6.1. Deterministic Scheduling
6.2. Stochastic and Dynamic Scheduling
7. Discussion and Future Research Perspectives
7.1. Current Research Progress
7.2. Existing Solution Methods
7.2.1. Deterministic Scheduling Problems
7.2.2. Stochastic/Dynamic Scheduling Problems
7.3. Future Research Perspectives
7.3.1. New Problems Oriented
7.3.2. New Methodologies Oriented
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
Appendix A
Appendix B
References | Operations | Main Characteristics | Objectives | Approach/Result |
---|---|---|---|---|
[34] | burn-in oven | p-batch, , B | WRB, CACB, | |
[36] | burn-in oven | p-batch, , B | WRB, decomposition-based MILP heuristics | |
[37] | cleaning | p-batch, 2D packing, , B | MILP, constructive heuristics, BRKGA, HBL | |
[38] | burn-in oven | p-batch, , B | MILP, HMMAS, | |
[40] | burn-in oven | p-batch,, , B | ACO, DP | |
[41] | burn-in oven | p-batch, , , B | MILP, WIS, FFWIS-ERT, ACO | |
[42] | burn-in oven | p-batch, , , B | job distances, FRS, MDS, UD | |
[43] | burn-in oven | p-batch,, , B | constructive heuristic, SA | |
[44] | oxidation /diffusion | p-batch, incompatible, , B | MILP, lower bound, RKGA | |
[45] | non-specific | p-batch, incompatible, , B | , | constructive heuristics, NP-hard, O |
[46] | non-specific | P-batch, aux, deterioration | VNS, structural properties |
References | Operations | Main Characteristics | Objectives | Approach/Result |
---|---|---|---|---|
[47] | non-specific | moj(lot), moj(item) | MILP, constructive heuristics, structure properties, NP-hard | |
[48] | non-specific | moj(lot), moj(item) | GGA, RKGA | |
[49] | non-specific | moj(item) | MILP, B&B, structural properties | |
[50] | non-specific | moj(item), moj(lot) | MILP, GGAs, NP-hard | |
[52] | non-specific | moj(lot), incompatible, common due date | MILP, GA, RKGA, NP-hard | |
[53] | non-specific | s-batch, , APC | ) | MILP, structural properties, constructive heuristic, NP-hard |
[54] | cleaning | PM, | MILP, DP, SSA, NP-hard | |
[55] | cleaning | PM | MILP, heuristic, lower bound | |
[56] | non-specific | interfering job sets | (), () | negotiation mechanism, VNS |
References | Operations | Main Characteristics (Machine Environment) | Objectives | Approach/Result |
---|---|---|---|---|
[62] | burn-in oven | p-batch, , , B | lower bounds, ERT-LPT heuristic, GA, ACO | |
[63] | burn-in oven | p-batch, , , B | MILP, DMBHs, GRLPT | |
[64] | burn-in oven | p-batch, , , B () | MILP, lower bound, constructive heuristics | |
[65] | burn-in oven | p-batch, , Bm () | MILP, PSO | |
[66] | non-specific | p-batch, , B () | , , ) | LP-based heuristics, GA |
[67] | non-specific | p-batch, , , B | , EPC) | MILP, PACO, |
[68] | oxidation/ diffusion | p-batch, , B, incompatible | ATC-BATC, ACO, VNS | |
[69] | oxidation/ diffusion | p-batch, , B, incompatible | MILP, GA, ACO, ALNS | |
[70] | oxidation/ diffusion | p-batch,, B, incompatible | BRKGA, DH | |
[71] | oxidation/ diffusion | p-batch, , , B, incompatible | MA, GA | |
[72] | oxidation/ diffusion | p-batch, ,, B, incompatible | , EPC) | MILP, -constraint method, structural properties |
[73] | oxidation/ diffusion | p-batch, ,, B, incompatible | , EPC) | MILP, -constraint method, grouping GA, NSGA |
[75] | burn-in oven | p-batch, aux, incompatible () | backorder, throughput | MILP, LP relaxation, greedy heuristic |
[76] | non-specific | p-batch, ,, incompatible, B, () | VND | |
[77] | oxidation/ diffusion | p-batch, , prec, , B incompatible | VNS, GRASP |
References | Operations | Main Characteristics (Shop Environment) | Objectives | Approach/Result |
---|---|---|---|---|
[78] | photolithography | aux, , () | Lex(throughput, load balancing, TSC) | multi-stage MILP-based decomposition |
[79] | photolithography | aux, () | load balancing, reticle expiration, TSC) | B&C, two-phase MILP-based heuristic |
[80] | photolithography | , aux, () | , throughput | MA |
[81] | lithography | , , aux () | MILP, CP | |
[82] | photolithography | aux, incompatible (P2) | MILP, heuristics, worst-case performance | |
[83] | photolithography | aux, vehicles | CP | |
[84] | back-end operations | aux | throughput, ) | MIP, GRASP |
[85] | non-specific | aux, , () | , ) | MILP, EDDLC |
[86] | ion implantation | , , () | Lex(throughput, ) | MILP, hybrid TS |
[87] | non-specific | , ) | Lex(Tj, ) | MILP, SA |
[88] | final testing | recrc, aux, () | throughput | SARSA |
[89] | wafer probe | , aux | Lex(TSC, testers used) | ACO, TS, GA |
[90] | wafer probe | , aux | Lex(TSC, testers used) | iterated greedy heuristic |
[91] | wafer probe | , aux | Lex(TSC, testers used) | MILP, HAIS |
[92] | photolithography | , , aux () | MILP, constructive heuristic | |
[93] | photolithography | , , aux, PM deterioration () | Lex(total quality loss,Tj) | MILP |
[94] | photolithography | , , aux () | MILP, GA, VNS | |
[95] | non-specific | incompatible, , APC () | ) | NP-hard, MILP, SCH, QCH |
[96] | non-specific | incompatible, , APC () | , ) | MILP, CP, recursive heuristic, SA |
[97] | oxidation/ diffusion | static/dynamic MHF, () | throughput, quality risk) | MILP |
[98] | cleaning | , , PM () | NP-hard, MILP, Feature-extraction, DP | |
[99] | non-specific | APC, PM, MHF | , quality risk) | MILP, VNS, B&B |
[100] | final testing | batch arrivals | B&B, iterative heuristic | |
[101] | implantation | , , () | MINLP, GA, MSPHEDA | |
[102] | non-specific | Common due window () | MILP, constructive heuristics | |
[103] | non-specific | moj(item), moj(lot), , incompatible | MILP, structural properties, BRKGA | |
[210] | non-specific | , , prec | ATCSR, VNS | |
[211] | non-specific | () | , production cost) | NSGA-II |
[215] | planarization | s-batch, finite buffer capacity | DP, structural properties | |
[216] | final testing | aux, | SA, TS, GA | |
[217] | final testing | aux, () | MILP, GA |
References | Operations | Main Characteristics (Shop Environment) | Objectives | Approach/Result |
---|---|---|---|---|
[104] | oxidation/ diffusion | , p-batch, incompatible (Rm) | , , | MILP, time window decomposition |
[105] | oxidation/ diffusion | , , p-batch, incompatible (Rm) | VNS, time window decomposition | |
[106] | oxidation/ diffusion | , p-batch, incompatible | MILP, DP, MPC | |
[107] | photo-lithography | p-batch, recrc, incompatible | batch-oriented and family-oriented scheduling algorithm | |
[108] | oxidation/ diffusion | , , p-batch, incompatible | dispatching rules, look-ahead checks | |
[109] | oxidation/ diffusion | , p-batch, incompatible, recrc | real-time closed loop control | |
[110] | oxidation/ diffusion | p-batch, incompatible | LBADM, adaptive dispatching rule | |
[111] | photo-lithography | aux, , (Rm) | SA, TS, GA | |
[112] | photo-lithography | , , aux (Rm) | ,, load balancing | MILP, RTD |
[113] | photo-lithography | , aux, recrc (Rm) | improved ICA, variable time interval-based RH, local search | |
[114] | photo-lithography | , aux (Rm) | DQN | |
[115] | non-specific | , incompatible (Rm) | DRL, HGA | |
[116] | non-specific | , (Rm) | GA, OCBA | |
[117] | non-specific | , , PM (Rm) | DQL |
References | Operations | Main Characteristics(Shop Environment) | Objectives | Approach/Result |
---|---|---|---|---|
[118] | non-specific | , moj (item, lot, and batch), (F3) | MILP, GA | |
[119] | oxidation/ diffusion | , (F2) | P/NP analysis, DP, TSEDD-FIFO, worst-case performance | |
[120] | non-specific | , overlapping time window (F3) | MILP, dominance properties, B&B, lower bounds | |
[121] | wafer probe | limited buffer capacity, incompatible (Fm) | MILP, GA, TS, NEH | |
[124] | final testing | , p-batch (Fm) | MILP, HGA, HSA, PSO, adaptive learning | |
[125] | wet-etch station | NIS, ZW, LS, single robot (Fm) | MILP | |
[126] | wet-etch station | NIS, ZW, LS, single robot (Fm) | MILP-based decomposition | |
[127] | wet-etch station | ZW, LS, NIS, single robot (Fm) | MILP-based decomposition and aggregation heuristic | |
[128] | wet-etch station | p-batch, LS, ZW, NIS, single robot (Fm) | GA | |
[129] | non-specific | (HF2) | MILP, BFIFO, local search | |
[130] | back-end operations | (HF2) | MILP, GP, constructive heuristic | |
[131] | photolithography | aux, limited buffer capacity (HFc) | GA | |
[132] | back-end operations | , incompatible (HFFc) | MILP, two-stage heuristic | |
[133] | oxidation/ diffusion | , p-batch, incompatible (HF2) | MILP, NP-hard, stage-based decomposition, VNS | |
[134] | wafer fabrication and probe | (HF2) | MILP, RKGA, HGA, constructive heuristics | |
[135] | back-end operations | , recrc, aux (HFc) | Lex | partial MILP, three-phase approach, GRASP |
[136] | back-end operations | , recrc, aux (HFc) | Lex | three-phase decomposition, MILP |
[137] | non-specific | recrc, inventory buffer, stocker (HFc) | HSSGA | |
[218] | wet-etch station | recrc (HFc) | self-braking symbiotic organisms search algorithm | |
[219] | photolithography | , recrc, cluster tools (HFc) | MILP, constructive heuristic, GA | |
[220] | non-specific | jobs (F2) | waiting time variation | MILP, dominance properties, constructive heuristic |
References | Operations | Main Characteristics (Machine Environment) | Objectives | Approach/Result |
---|---|---|---|---|
[138] | diffusion | (F2) | IP-based RTD heuristic | |
[139] | non-specific | (F2) | pull-based scheduling algorithm | |
[141] | non-specific | (Fm) | simulation-based genetic programming | |
[142] | burn-in stations | (HF2) | list scheduling algorithms | |
[143] | wafer probe | (HF4) | bottleneck-focused scheduling, progress-based scheduling, RH | |
[144] | oxidation/ diffusion | (HFc) | MILP, RH | |
[145] | wafer probe | (HFc) | L-NGSA, NSGA2, SPEA2, simulation | |
[146] | photolithography | (HFc) | OBSOS-CA, simulation | |
[147] | assembly | stochastic processing time (HFc) | simulation optimization, PSO, OCBA | |
[148] | back-end operations | , demand and supply variations (HFc) | simulation optimization, OCBA, GA | |
[149] | non-specific | recrc (HFc) | , | learning-based dispatching rule |
References | Operations | Main Characteristics | Objectives | Approach/Result |
---|---|---|---|---|
[151] | wafer fabrication | , moj(lot), p-batch, recrc | MIP, CG heuristic | |
[152] | oxidation /diffusion | route graph, constructive heuristic, SA | ||
[153] | oxidation /diffusion | , p-batch, B, recrc | GRASP, batch-oblivious route-aware graph, SA | |
[154] | oxidation /diffusion | ,p-batch, B | , throughput, batch coefficient) | batch-oblivious route-aware graph |
[155] | oxidation /diffusion | ,, ,p-batch, B, prec | waiting time, batching coefficient | SBH, PBIA, SA |
[156] | final testing | aux | KMEA | |
[157] | final testing | aux | HEDA | |
[158] | final testing | aux | IWO | |
[159] | final testing | aux | cuckoo search, reinforcement learning | |
[160] | assembly | , incompatible, prec | MILP, MO-HGA, VND | |
[161] | packaging | prec | MILP, GA, simulation | |
[162] | packaging | recrc, | Q-learning | |
[163] | packaging | recrc, | DRL | |
[164] | oxidation /diffusion | p-batch, recrc,,, , B | throughput | DP, GA |
[205] | non-specific | , prec | hybrid PSO, GA |
References | Operations | Main Characteristics | Objectives | Approach/Result |
---|---|---|---|---|
[165] | non-specific | stochastic processing time | mean and standard deviation of cycle time | FCM, FBPN, nonlinear fluctuation smoothing rule |
[166] | wafer fabrication | stochastic processing time | mean and standard deviation of cycle time | nonlinear fluctuation smoothing rule, GA, FBNP |
[167] | wafer fabrication | p-batch | cycle time, machine utilization, on-time delivery, throughput | dispatching rule |
[168] | wafer fabrication | limited AMHS capacity | utilization, throughput | DNN |
[169] | photolitho-graphy | demand variation | order fill rate, inventory, shortage, cycle time | AUI rule |
[170] | wafer fabrication | , , p-batch, recrc, machine breakdown | on-time delivery rate, mean tardiness, | ECR3 rule |
[171] | wafer fabrication | dynamic job arrivals and line balance information | on-time delivery, mean and standard deviation of cycle time, machine utilization | multi-objective dispatching rule, TOPSIS |
[172] | wafer fabrication | dynamic job arrivals and line balance information | mean and standard deviation of cycle time, on-time delivery | decentralized multi-objective scheduling method |
[173] | back-end operations | , , recrc, aux | key device shortages, number of machines used, throughput | MILP, GRASP-based dispatching rules, simulation |
[174] | back-end operations | , , recrc, aux | key device shortages, number of machines used, throughput | GRASP-based dispatching rules |
[175] | photolitho-graphy | , , aux | machine utilization, on-time delivery | dedication load-based dispatching rules |
[176] | wafer fabrication | p-batch, recrc | wafer movement, utilization, throughput | closed-loop control based on load balancing |
[177] | wafer fabrication | hot jobs, p-batch | WIP, bottleneck utilization | ADR, BPNN, PSO |
[178] | wafer fabrication | hot jobs, p-batch | WIP movement | ADR, linear regression, GA |
[179] | wafer fabrication | p-batch, aux, recrc | throughput, TSC | dispatching rules |
[180] | wafer fabrication | , etc. | throughput, cycle time, on-time delivery rate, movement | dynamic dispatching rule |
[181] | wafer fabrication | dynamic job arrivals, load balancing | throughput, cycle time | SOM-based multi-rules selection method |
[182] | wafer fabrication | , p-batch, aux | throughput, utilization | extreme learning stochastic machine, multiple dispatching rules |
[183] | assembly | , aux, recrc | machine utilization | case-based reasoning, GA |
[184] | wafer fabrication | p-batch, recrc | throughput, cycle time | machine learning, simulation, dispatching rules |
[185] | wafer fabrication | p-batch, aux, recrc | reinforcement learning | |
[187] | wafer fabrication | , lot processing, p-batch, AMHS | average delay, average WIP, average cycle time | simulation optimization, GA, multiple dispatching rules |
[188] | wafer fabrication | , recrc | average cycle time | adaptive simulation-based optimization, GA |
[189] | non-specific | , etc. | simulation optimization, genetic programming | |
[190] | non-specific | , etc. | learning-based grey wolf optimizer | |
[191] | wafer fabrication | uncertain processing times, urgent orders etc. | on-time delivery rate | CNN-A3C, DRL |
[192] | packaging | aux, recrc etc. | machine loss times, job waiting times | case-based reasoning |
[193] | wafer fabrication | p-batch, aux, recrc etc. | throughput | DRL, dispatching rules |
[194] | wafer fabrication | , p-batch, recrc | mean and standard deviation of cycle time | closed-loop control, CONWIP, operation due date rule |
[195] | wafer fabrication | p-batch, machine breakdown | average and standard deviation of cycle time, WIP | closed-loop control, production release strategy, QTR rule |
[196] | wafer fabrication | , etc. | average and standard deviation of cycle time, WIP, throughput | release control |
[197] | non-specific | , etc. | throughput, mean cycle time, flow time, movement | closed-loop adaptive scheduling |
[198] | wafer fabrication | , , p-batch, recrc, incompatible, transportation | RH, SBH, VNS | |
[199] | wafer fabrication | , prec, recrc | RH, SBH, MILP, ACO | |
[200] | wafer fabrication | p-batch, recrc | hybrid-optimization scheduling | |
[201] | wafer fabrication | p-batch, aux, recrc | global scheduling approach | |
[202] | wafer fabrication | p-batch, recrc, prec | schedule stability, machine utilization | scheduling repair method |
[203] | wafer fabrication | uncertain processing time, machine breakdown | cycle time | operation-group-based soft scheduling approach |
[204] | oxidation/ diffusion | p-batch, , | job-priority based soft scheduling | |
[221] | wafer fabrication | lot merging and splitting | , cycle time, throughput | listing scheduling |
[222] | wafer fabrication | , recrc | operational due date | two-dimensional dispatching rule, local search, simulation |
Appendix C
Shop Environment | Reference | Problems | Theoretical Properties |
---|---|---|---|
Single machine | [34] | Batch jobs with similar processing time, WRB with complexity >> the BFLPT | |
[41] | Minimize Cmax is equivalent to minimizing the WIS | ||
[42] | Batch jobs with close processing and release times if there is residual capacity | ||
[44] | Optimal schedule inidicates all on-time jobs are processed before tardy jobs | ||
[47] | , | Optimal schedules are proved | |
[48] | , | Optimal job sequencing decisions are proved for both cases | |
[49] | B&B with strutural properties of smaller lot first sequencing | ||
[53] | Optimal schedule for the two job-family case is proved | ||
[55] | Lower bound based on a dummy schdule considering jobs and contamination sequencing | ||
Parallel machines | [62] | Lower bounds based on job splitting | |
[64] | Lower bound is provided | ||
[82] | LPT-based heuristics with worst-case performance ratio of 3/2 | ||
[100] | B&B with dominance properties from partial schedules | ||
[103] | Structure properties of optimal schedules are proved | ||
Flow shops | [119] | Optimal schedules when not considering incompatiable jobs, and heuristics with worst-case performance less than 2 is provided | |
[120] | Dominance properties based on partial schedules are provided | ||
[220] | Dominance properties based on partial schedules are provided |
Metaheuristics | References |
---|---|
Variable neighborhood search (VNS) | [46,56,68,77,87,94,99,105,133,198,210] |
Simulated annealing (SA) | [96,111,124,152,153,155,216] |
Tabu search (TS) | [86,89] |
Greedy randomized adaptive search procedure (GRASP) | [77,84,107,135,153,173] |
Genetic algorithms (GA) | [52,62,66,69,71,73,89,94,111,116,118,121,128,131,134,141,148,157,161,164,166,178,183,187,188,205,211,216,217,219] |
Memetic algorithms (MA) | [71,80] |
Ant colony optimization (ACO) | [40,41,62,67,68,69,89,199] |
Particle swarm optimization (PSO) | [65,124,147,177,205] |
References
- Chen, W.-K. VLSI Technology; CRC Press: Boca Raton, FL, USA, 2003. [Google Scholar]
- Mönch, L.; Uzsoy, R.; Fowler, J.W. A survey of semiconductor supply chain models part III: Master planning, production planning, and demand fulfilment. Int. J. Prod. Res. 2017, 56, 4565–4584. [Google Scholar] [CrossRef]
- Mönch, L.; Uzsoy, R.; Fowler, J.W. A survey of semiconductor supply chain models part I: Semiconductor supply chains, strategic network design, and supply chain simulation. Int. J. Prod. Res. 2018, 56, 4524–4545. [Google Scholar] [CrossRef]
- Uzsoy, R.; Fowler, J.W.; Mönch, L. A survey of semiconductor supply chain models Part II: Demand planning, inventory management, and capacity planning. Int. J. Prod. Res. 2018, 56, 4546–4564. [Google Scholar] [CrossRef]
- Wang, Q.; Huang, N.; Chen, Z.; Chen, X.; Cai, H.; Wu, Y. Environmental data and facts in the semiconductor manufacturing industry: An unexpected high water and energy consumption situation. Water Cycle 2023, 4, 47–54. [Google Scholar] [CrossRef]
- Eom, Y.-S.; Hong, J.-H.; Lee, S.-J.; Lee, E.-J.; Cha, J.-S.; Lee, D.-G.; Bang, S.-A. Emission Factors of Air Toxics from Semiconductor Manufacturing in Korea. J. Air Waste Manag. Assoc. 2006, 56, 1518–1524. [Google Scholar] [CrossRef] [PubMed]
- Li, K.; Zhang, X.; Leung, J.Y.-T.; Yang, S.-L. Parallel machine scheduling problems in green manufacturing industry. J. Manuf. Syst. 2016, 38, 98–106. [Google Scholar] [CrossRef]
- Lu, C.; Gao, L.; Li, X.; Zheng, J.; Gong, W. A multi-objective approach to welding shop scheduling for makespan, noise pollution and energy consumption. J. Clean. Prod. 2018, 196, 773–787. [Google Scholar] [CrossRef]
- Pinedo, M.L. Scheduling: Theory, Algorithms, and Systems, 3rd ed.; Springer: Berlin/Heidelberg, Germany, 2008. [Google Scholar]
- Vidal, J.C.; Mucientes, M.; Bugarín, A.; Lama, M. Machine scheduling in custom furniture industry through neuro-evolutionary hybridization. Appl. Soft Comput. 2011, 11, 1600–1613. [Google Scholar] [CrossRef]
- Cheng, C.-Y.; Chen, T.-L.; Wang, L.-C.; Chen, Y.-Y. A genetic algorithm for the multi-stage and parallel-machine scheduling problem with job splitting—A case study for the solar cell industry. Int. J. Prod. Res. 2013, 51, 4755–4777. [Google Scholar] [CrossRef]
- Schulze, M.; Rieck, J.; Seifi, C.; Zimmermann, J. Machine scheduling in underground mining: An application in the potash industry. OR Spectr. 2016, 38, 365–403. [Google Scholar] [CrossRef]
- Pfund, M.E.; Mason, S.J.; Fowler, J.W. Semiconductor manufacuring scheduling and dispatching, State of the art and survey of needs. In Handbook of Production Scheduling; Springer: Boston, MA, USA, 2006; pp. 213–241. [Google Scholar]
- Chien, C.F.; Peres, S.D.; Ehm, H.; Fowler, J.W.; Jiang, Z.; Krishnaswamy, S.; Lee, T.E.; Monch, L.; Uzsoy, R. Modelling and analysis of semiconductor manufacturing in a shrinking world: Challenges and successes. Eur. J. Ind. Eng. 2011, 5, 254. [Google Scholar] [CrossRef]
- Uzsoy, R.; Lee, C.-Y.; Martin-Vega, L.A. A review of production planning and scheduling models in semiconductor industry Part I: System characteristics, performance evaluation and production planning. IIE Trans. 1992, 24, 47–60. [Google Scholar] [CrossRef]
- Uzsoy, R.; Lee, C.-Y.; Martin-Vega, L.A. A review of production planning and scheduling models in the semiconductor industry Part II: Shop-Floor Control. IIE Trans. 1994, 26, 44–55. [Google Scholar] [CrossRef]
- Mathirajan, M.; Sivakumar, A. A literature review, classification and simple meta-analysis on scheduling of batch processors in semiconductor. Int. J. Adv. Manuf. Technol. 2006, 29, 990–1001. [Google Scholar] [CrossRef]
- Gupta, A.K.; Sivakumar, A.I. Job shop scheduling techniques in semiconductor manufacturing. Int. J. Adv. Manuf. Technol. 2006, 27, 1163–1169. [Google Scholar] [CrossRef]
- Mönch, L.; Fowler, J.W.; Dauzère-Pérès, S.; Mason, S.J.; Rose, O. A survey of problems, solution techniques, and future challenges in scheduling semiconductor manufacturing operations. J. Sched. 2011, 14, 583–599. [Google Scholar] [CrossRef]
- Pan, C.; Zhou, M.; Qiao, Y.; Wu, N. Scheduling Cluster Tools in Semiconductor Manufacturing: Recent Advances and Challenges. IEEE Trans. Autom. Sci. Eng. 2017, 15, 586–601. [Google Scholar] [CrossRef]
- May, G.S.; Spanos, C.J. Fundamentals of Semiconductor Manufacturing and Process Control; John Wiley & Sons, Inc.: Hoboken, NJ, USA, 2006. [Google Scholar]
- Mönch, L.; Fowler, J.W.; Mason, S.J. Production Planning and Control for Semiconductor Wafer Fabrication Facilities: Modeling, Analysis, and Systems; Springer: Berlin/Heidelberg, Germany, 2013. [Google Scholar]
- Koo, P.-H.; Moon, D.H. A Review on Control Strategies of Batch Processing Machines in Semiconductor Manufacturing. In Proceedings of the 7th IFAC Conference on Manufacturing Modelling, Management, and Control, Saint Petersburg, Russia, 19–21 June 2013; International Federation of Automatic Control: Saint Petersburg, Russia, 2013. [Google Scholar]
- Fowler, J.W.; Mönch, L. A survey of scheduling with parallel batch (p-batch) processing. Eur. J. Oper. Res. 2022, 298, 1–24. [Google Scholar] [CrossRef]
- Allahverdi, A. The third comprehensive survey on scheduling problems with setup times/costs. Eur. J. Oper. Res. 2015, 246, 345–378. [Google Scholar] [CrossRef]
- Lin, D.; Lee, C.K.M. A review of the research methodology for the re-entrant scheduling problem. Int. J. Prod. Res. 2011, 49, 2221–2242. [Google Scholar]
- Yugma, C.; Blue, J.; Dauzère-Pérès, S.; Obeid, A. Integration of scheduling and advanced process control in semiconductor manufacturing: Review and outlook. J. Sched. 2015, 18, 195–205. [Google Scholar] [CrossRef]
- Obeid, A.; Dauzère-Pérès, S.; Yugma, C. Scheduling on parallel machines with time constraints and Equipment Health Factors. In Proceedings of the IEEE International Conference on Automation Science and Engineering, Seoul, Republic of Korea, 20–24 August 2012; pp. 401–406. [Google Scholar] [CrossRef]
- Duc, L.M.; Tan, C.M.; Luo, M.; Leng, I.C.H. Maintenance Scheduling of Plasma Etching Chamber in Wafer Fabrication for High-Yield Etching Process. IEEE Trans. Semicond. Manuf. 2014, 27, 204–211. [Google Scholar] [CrossRef]
- Jia, J.; Mason, S.J. Semiconductor manufacturing scheduling of jobs containing multiple orders on identical parallel machines. Int. J. Prod. Res. 2009, 47, 2565–2585. [Google Scholar] [CrossRef]
- T’Kindt, V.; Billaut, J.C. Multicriteria Scheduling: Theory, Models and Algorithms; Springer: Berlin/Heidelberg, Germany, 2002. [Google Scholar]
- Ikura, Y.; Gimple, M. Efficient Scheduling Algorithms for a Single Batch Processing Machine. Oper. Res. Lett. 1986, 5, 61–65. [Google Scholar] [CrossRef]
- Uzsoy, R. Scheduling a Single Batch Processing Machine with Non-Identical Job Sizes. Int. J. Prod. Res. 1994, 32, 1615–1635. [Google Scholar] [CrossRef]
- Chen, H.; Du, B.; Huang, G.Q. Scheduling a batch processing machine with non-identical job sizes: A clustering perspective. Int. J. Prod. Res. 2011, 49, 5755–5778. [Google Scholar] [CrossRef]
- Damodaran, P.; Velez-Gallego, M. Heuristics for makespan minimisation on parallel batch processing machines with unequal job ready times. Int. J. Adv. Manuf. Technol. 2010, 49, 1119–1128. [Google Scholar] [CrossRef]
- Lee, Y.H.; Lee, Y.H. Minimising makespan heuristics for scheduling a single batch machine processing machine with non-identical job sizes. Int. J. Prod. Res. 2013, 51, 3488–3500. [Google Scholar] [CrossRef]
- Li, X.; Zhang, K. Single batch processing machine scheduling with two-dimensional bin packing constraints. Int. J. Prod. Econ. 2018, 196, 113–121. [Google Scholar] [CrossRef]
- Parsa, N.R.; Karimi, B.; Husseini, S.M. Minimizing total flow time on a batch processing machine using a hybrid max–min ant system. Comput. Ind. Eng. 2016, 99, 372–381. [Google Scholar] [CrossRef]
- Jolai, F.; Dupont, L. Minimizing mean flow times criteria on a single batch processing machine with non-identical jobs sizes. Int. J. Prod. Econ. 1998, 55, 273–280. [Google Scholar] [CrossRef]
- Shao, H.; Chen, H.P. Minimising makespan for single burn-in oven scheduling problems using ACO+DP approach. Int. J. Manuf. Res. 2010, 5, 271. [Google Scholar] [CrossRef]
- Xu, R.; Chen, H.; Li, X. Makespan minimization on single batch-processing machine via ant colony optimization. Comput. Oper. Res. 2012, 39, 582–593. [Google Scholar] [CrossRef]
- Zhou, S.; Chen, H.; Xu, R.; Li, X. Minimizing makespan on a single batch processing machine with dynamic job arrivals and non-identical job sizes. Int. J. Prod. Res. 2014, 52, 2258–2274. [Google Scholar] [CrossRef]
- Mathirajan, M.; Bhargav, V.; Ramachandran, V. Minimizing total weighted tardiness on a batch-processing machine with non-agreeable release times and due dates. Int. J. Adv. Manuf. Technol. 2010, 48, 1133–1148. [Google Scholar] [CrossRef]
- Dauzère-Pérès, S.; Mönch, L. Scheduling jobs on a single batch processing machine with incompatible job families and weighted number of tardy jobs objective. Comput. Oper. Res. 2013, 40, 1224–1233. [Google Scholar] [CrossRef]
- Cheng, B.; Cai, J.; Yang, S.; Hu, X. Algorithms for scheduling incompatible job families on single batching machine with limited capacity. Comput. Ind. Eng. 2014, 75, 116–120. [Google Scholar] [CrossRef]
- Lu, S.; Kong, M.; Zhou, Z.; Liu, X.; Liu, S. A hybrid metaheuristic for a semiconductor production scheduling problem with deterioration effect and resource constraints. Oper. Res. 2022, 22, 5405–5440. [Google Scholar] [CrossRef]
- Mason, S.J.; Chen, J.-S. Scheduling multiple orders per job in a single machine to minimize total completion time. Eur. J. Oper. Res. 2010, 207, 70–77. [Google Scholar] [CrossRef]
- Sobeyko, O.; Mönch, L. Genetic algorithms to solve a single machine multiple orders per job scheduling problem. In Proceedings of the Winter Simulation Conference, Baltimore, MD, USA, 5–8 December 2010; pp. 2493–2503. [Google Scholar] [CrossRef]
- Sarin, S.C.; Wang, L.; Cheng, M. A single-machine, single-wafer-processing, multiple-lots-per-carrier scheduling problem to minimize the sum of lot completion times. Comput. Oper. Res. 2012, 39, 1411–1418. [Google Scholar] [CrossRef]
- Sobeyko, O.; Mönch, L. Grouping genetic algorithms for solving single machine multiple orders per job scheduling problems. Ann. Oper. Res. 2015, 235, 709–739. [Google Scholar] [CrossRef]
- Qu, P.; Mason, S. Metaheuristic scheduling of 300-mm lots containing multiple orders. IEEE Trans. Semicond. Manuf. 2005, 18, 633–643. [Google Scholar] [CrossRef]
- Rocholl, J.; Mönch, L. Hybrid algorithms for the earliness-tardiness single-machine multiple orders per job scheduling problem with a common due date. RAIRO-Oper. Res. 2018, 52, 1329–1350. [Google Scholar] [CrossRef]
- Cai, Y.; Kutanoglu, E.; Hasenbein, J.; Qin, J. Single-machine scheduling with advanced process control constraints. J. Sched. 2012, 15, 165–179. [Google Scholar] [CrossRef]
- Pang, J.; Zhou, H.; Tsai, Y.-C.; Chou, F.-D. A scatter simulated annealing algorithm for the bi-objective scheduling problem for the wet station of semiconductor manufacturing. Comput. Ind. Eng. 2018, 123, 54–66. [Google Scholar] [CrossRef]
- Chung, T.-P.; Xue, Z.; Wu, T.; Shih, S.C. Minimising total completion time on single-machine scheduling with new integrated maintenance activities. Int. J. Prod. Res. 2019, 57, 918–930. [Google Scholar] [CrossRef]
- Ramacher, R.; Mönch, L. An automated negotiation approach to solve single machine scheduling problems with interfering job sets. Comput. Ind. Eng. 2016, 99, 318–329. [Google Scholar] [CrossRef]
- Sobeyko, O.; Mönch, L. A comparison of heuristics to solve a single machine batching problem with unequal ready times of the jobs. In Proceedings of the Winter Simulation Conference, Phoenix, AZ, USA, 11–14 December 2011; pp. 2006–2016. [Google Scholar] [CrossRef]
- Jia, W.; Jiang, Z.; Li, Y. A job-family-oriented algorithm for re-entrant batch processing machine scheduling. In Proceedings of the IEEE International Conference on Automation Science and Engineering, Madison, WI, USA, 17–20 August 2013; pp. 1022–1027. [Google Scholar] [CrossRef]
- Huang, J.; Down, D.G.; Lewis, M.E.; Wu, C. Dynamically scheduling and maintaining a flexible server. Nav. Res. Logist. 2022, 69, 223–240. [Google Scholar] [CrossRef]
- Jun, S.; Lee, S. Learning dispatching rules for single machine scheduling with dynamic arrivals based on decision trees and feature construction. Int. J. Prod. Res. 2021, 59, 2838–2856. [Google Scholar] [CrossRef]
- Lee, C.-Y.; Uzsoy, R.; Martin-Vega, L.A. Efficient Algorithms for Scheduling Semiconductor Burn-In Operations. Oper. Res. 1992, 40, 764–775. [Google Scholar] [CrossRef]
- Chen, H.; Du, B.; Huang, G.Q. Metaheuristics to minimise makespan on parallel batch processing machines with dynamic job arrivals. Int. J. Comput. Integr. Manuf. 2010, 23, 942–956. [Google Scholar] [CrossRef]
- Zhou, S.; Chen, H.; Li, X. Distance matrix based heuristics to minimize makespan of parallel batch processing machines with arbitrary job sizes and release times. Appl. Soft Comput. 2017, 52, 630–641. [Google Scholar] [CrossRef]
- Arroyo, J.E.C.; Leung, J.Y.-T. Scheduling unrelated parallel batch processing machines with non-identical job sizes and unequal ready times. Comput. Oper. Res. 2017, 78, 117–128. [Google Scholar] [CrossRef]
- Hulett, M.; Damodaran, P.; Amouie, M. Scheduling non-identical parallel batch processing machines to minimize total weighted tardiness using particle swarm optimization. Comput. Ind. Eng. 2017, 113, 425–436. [Google Scholar] [CrossRef]
- Lin, Y.-K.; Fowler, J.W.; Pfund, M.E. Multiple-objective heuristics for scheduling unrelated parallel machines. Eur. J. Oper. Res. 2013, 227, 239–253. [Google Scholar] [CrossRef]
- Jia, Z.-H.; Zhang, Y.-L.; Leung, J.Y.-T.; Li, K. Bi-criteria ant colony optimization algorithm for minimizing makespan and energy consumption on parallel batch machines. Appl. Soft Comput. 2017, 55, 226–237. [Google Scholar] [CrossRef]
- Almeder, C.; Mönch, L. Metaheuristics for scheduling jobs with incompatible families on parallel batching machines. J. Oper. Res. Soc. 2011, 62, 2083–2096. [Google Scholar] [CrossRef]
- Lausch, S.; Mönch, L. Metaheuristic approaches for scheduling jobs on parallel batch processing machines. In Heuristics, Metaheuristics and Approximate Methods in Planning and Scheduling; International Series in Operations Research and Management Science; Springer: Cham, Switzerland, 2016; Volume 236. [Google Scholar]
- Mönch, L.; Roob, S. A matheuristic framework for batch machine scheduling problems with incompatible job families and regular sum objective. Appl. Soft Comput. 2018, 68, 835–846. [Google Scholar] [CrossRef]
- Chiang, T.-C.; Cheng, H.-C.; Fu, L.-C. A memetic algorithm for minimizing total weighted tardiness on parallel batch machines with incompatible job families and dynamic job arrival. Comput. Oper. Res. 2010, 37, 2257–2269. [Google Scholar] [CrossRef]
- Rocholl, J.; Mönch, L.; Fowler, J.W. Electricity power cost-aware scheduling of jobs on parallel batch processing machines. In Proceedings of the Winter Simulation Conference, Gothenburg, Sweden, 9–12 December 2018; pp. 3420–3431. [Google Scholar] [CrossRef]
- Rocholl, J.; Mönch, L.; Fowler, J. Bi-criteria parallel batch machine scheduling to minimize total weighted tardiness and electricity cost. J. Bus. Econ. 2020, 90, 1345–1381. [Google Scholar] [CrossRef]
- Mönch, L.; Balasubramanian, H.; Fowler, J.W.; Pfund, M.E. Heuristic scheduling of jobs on parallel batch machines with incompatible job families and unequal ready times. Comput. Oper. Res. 2005, 32, 2731–2750. [Google Scholar] [CrossRef]
- Jula, P.; Leachman, R.C. Coordinated multistage scheduling of parallel batch-processing machines under multi resource constraints. Oper. Res. 2010, 58, 933–947. [Google Scholar] [CrossRef]
- Kohn, R.; Rose, O.; Laroque, C. Study on multi-objective optimization for parallel batch machine scheduling using variable neighbourhood search. In Proceedings of the Winter Simulation Conference, Washington, DC, USA, 8–11 December 2013; pp. 3654–3670. [Google Scholar] [CrossRef]
- Bilyk, A.; Mönch, L.; Almeder, C. Scheduling jobs with ready times and precedence constraints on parallel batch machines using metaheuristics. Comput. Ind. Eng. 2014, 78, 175–185. [Google Scholar] [CrossRef]
- Klemmt, A.; Lange, J.; Weigert, G.; Lehmann, F.; Seyfert, J. A multistage mathematical programming based scheduling approach for the photolithography area in semiconductor manufacturing. In Proceedings of the Winter Simulation Conference, Baltimore, MD, USA, 5–8 December 2010; pp. 2474–2485. [Google Scholar] [CrossRef]
- Yan, B.; Chen, H.Y.; Luh, P.B.; Wang, S.; Chang, J. Litho machine scheduling with convex hull analyses. IEEE Trans. Autom. Sci. Eng. 2013, 10, 928–937. [Google Scholar] [CrossRef]
- Bitar, A.; Dauzère-Pérès, S.; Yugma, C.; Roussel, R. A memetic algorithm to solve an unrelated parallel machine scheduling problem with auxiliary resources in semiconductor manufacturing. J. Sched. 2016, 19, 367–376. [Google Scholar] [CrossRef]
- Ham, A. Scheduling of Dual Resource Constrained Lithography Production: Using CP and MIP/CP. IEEE Trans. Semicond. Manuf. 2018, 31, 52–61. [Google Scholar] [CrossRef]
- Chung, T.; Gupta, J.N.D.; Zhao, H.; Werner, F. Minimizing the makespan on two identical parallel machines with mold constraints. Comput. Oper. Res. 2019, 105, 141–155. [Google Scholar] [CrossRef]
- Ham, A.; Park, M.-J.; Shin, H.-J.; Choi, S.-Y.; Fowler, J.W. Integrated Scheduling of Jobs, Reticles, Machines, AMHS and ARHS in a Semiconductor Manufacturing. In Proceedings of the Winter Simulation Conference (WSC), Orlando, FL, USA, 14–18 December 2020; pp. 1966–1973. [Google Scholar] [CrossRef]
- Deng, Y.; Bard, J.F.; Chacon, G.R.; Stuber, J. Scheduling back-end operations in semiconductor manufacturing. IEEE Trans. Semicond. Manuf. 2010, 23, 210–220. [Google Scholar] [CrossRef]
- Wang, I.-L.; Wang, Y.-C.; Chen, C.-W. Scheduling unrelated parallel machines in semiconductor manufacturing by problem reduction and local search heuristics. Flex. Serv. Manuf. J. 2013, 25, 343–366. [Google Scholar] [CrossRef]
- Chen, C.; Fathi, M.; Khakifirooz, M.; Wu, K. Hybrid tabu search algorithm for unrelated parallel machine scheduling in semiconductor fabs with setup times, job release, and expired times. Comput. Ind. Eng. 2022, 165, 107915. [Google Scholar] [CrossRef]
- Moser, M.; Musliu, N.; Schaerf, A.; Winter, F. Exact and metaheuristic approaches for unrelated parallel machine scheduling. J. Sched. 2022, 25, 507–534. [Google Scholar] [CrossRef]
- Zhang, Z.; Zheng, L.; Hou, F.; Li, N. Semiconductor final test scheduling with Sarsa(k,k) algorithm. Eur. J. Oper. Res. 2011, 215, 446–458. [Google Scholar] [CrossRef]
- Lin, S.-W.; Lee, Z.-J.; Ying, K.-C.; Lin, R.-H. Meta-heuristic algorithms for wafer sorting scheduling problems. J. Oper. Res. Soc. 2011, 62, 165–174. [Google Scholar] [CrossRef]
- Ying, K.-C. Scheduling identical wafer sorting parallel machines with sequence-dependent setup times using an iterated greedy heuristic. Int. J. Prod. Res. 2012, 50, 2710–2719. [Google Scholar] [CrossRef]
- Ying, K.-C.; Lin, S.-W. Efficient wafer sorting scheduling using a hybrid artificial immune system. J. Oper. Res. Soc. 2014, 65, 169–179. [Google Scholar] [CrossRef]
- Munoz, L.; Villalobos, J.R.; Fowler, J.W. Exact and heuristic algorithms for the parallel machine total completion time scheduling problem with dual resources, ready times, and sequence-dependent setup times. Comput. Oper. Res. 2022, 143, 105787. [Google Scholar] [CrossRef]
- Chen, L.; Yang, W.; Qiu, K.; Dauzère-Pérès, S. A lexicographic optimization approach for a bi-objective parallel-machine scheduling problem minimizing total quality loss and total tardiness. Comput. Oper. Res. 2023, 155, 106245. [Google Scholar] [CrossRef]
- Chen, H.; Guo, P.; Jimenez, J.; Dong, Z.S.; Cheng, W. Unrelated Parallel Machine Photolithography Scheduling Problem with Dual Resource Constraints. IEEE Trans. Semicond. Manuf. 2023, 36, 100–112. [Google Scholar] [CrossRef]
- Obeid, A.; Dauzère-Pérès, S.; Yugma, C. Scheduling job families on non-identical parallel machines with time constraints. Ann. Oper. Res. 2014, 213, 221–234. [Google Scholar] [CrossRef]
- Nattaf, M.; Dauzère-Pérès, S.; Yugma, C.; Wu, C.-H. Parallel machine scheduling with time constraints on machine qualifications. Comput. Oper. Res. 2019, 107, 61–76. [Google Scholar] [CrossRef]
- Kao, Y.-T.; Dauzère-Pérès, S.; Blue, J.; Chang, S.-C. Impact of integrating equipment health in production scheduling for semiconductor fabrication. Comput. Ind. Eng. 2018, 120, 450–459. [Google Scholar] [CrossRef]
- Pang, J.; Tsai, Y.-C.; Chou, F.-D. Feature-Extraction-Based Iterated Algorithms to Solve the Unrelated Parallel Machine Problem with Periodic Maintenance Activities. IEEE Access 2021, 9, 139089–139108. [Google Scholar] [CrossRef]
- Zhang, X.; Chen, L. A general variable neighborhood search algorithm for a parallel-machine scheduling problem considering machine health conditions and preventive maintenance. Comput. Oper. Res. 2022, 143, 105738. [Google Scholar] [CrossRef]
- Chung, T.-P.; Liao, C.-J.; Su, L.-H. Scheduling on identical machines with batch arrivals. Int. J. Prod. Econ. 2010, 123, 179–186. [Google Scholar] [CrossRef]
- Wang, H.-K.; Chien, C.-F.; Gen, M. An Algorithm of Multi-Subpopulation Parameters with Hybrid Estimation of Distribution for Semiconductor Scheduling with Constrained Waiting Time. IEEE Trans. Semicond. Manuf. 2015, 28, 353–366. [Google Scholar] [CrossRef]
- Rolim, G.A.; Nagano, M.S.; Prata, B.D.A. Formulations and an adaptive large neighborhood search for just-in-time scheduling of unrelated parallel machines with a common due window. Comput. Oper. Res. 2023, 153, 106159. [Google Scholar] [CrossRef]
- Rocholl, J.; Mönch, L. Decomposition heuristics for parallel-machine multiple orders per job scheduling problems with a common due date. J. Oper. Res. Soc. 2019, 72, 1737–1753. [Google Scholar] [CrossRef]
- Klemmt, A.; Weigert, G.; Werner, S. Optimisation approaches for batch scheduling in semiconductor manufacturing. Eur. J. Ind. Eng. 2011, 5, 338–359. [Google Scholar] [CrossRef]
- Kohn, R.; Rose, O. Study on optimization potential influencing factors in simulation studies focused on parallel batch machine scheduling using Variable Neighbourhood Search. In Proceedings of the Winter Simulation Conference, Berlin, Germany, 9–12 December 2012. [Google Scholar] [CrossRef]
- Tajan, J.B.C.; Sivakumar, A.I.; Gershwin, S.B. Heuristic control of multiple batch processors with incompatible job families and future job arrivals. Int. J. Prod. Res. 2012, 50, 4206–4219. [Google Scholar] [CrossRef]
- Jia, W.; Jiang, Z.; Li, Y. Combined scheduling algorithm for re-entrant batch-processing machines in semiconductor wafer manufacturing. Int. J. Prod. Res. 2015, 53, 1866–1879. [Google Scholar] [CrossRef]
- Kim, Y.-D.; Joo, B.-J.; Choi, S.-Y. Scheduling wafer lots on diffusion machines in a semiconductor wafer fabrication facility. IEEE Trans. Semicond. Manuf. 2010, 23, 246–254. [Google Scholar] [CrossRef]
- Jia, W.; Jiang, Z.; Li, Y. Closed loop control-based real-time dispatching heuristic on parallel batch machines with incompatible job families and dynamic arrivals. Int. J. Prod. Res. 2013, 51, 4570–4584. [Google Scholar] [CrossRef]
- Chen, L.; Xu, H.; Li, L.; Chen, L. Learning-based adaptive dispatching method for batch processing machines. In Proceedings of the Winter Simulations Conference, Washington, DC, USA, 8–11 December 2013; pp. 3756–3765. [Google Scholar]
- Hung, Y.-F.; Liang, C.-H.; Chen, J.C. Sensitivity search for the rescheduling of semiconductor photolithography operations. Int. J. Adv. Manuf. Technol. 2013, 67, 73–84. [Google Scholar] [CrossRef]
- Ham, A.M.; Cho, M. A Practical Two-Phase Approach to Scheduling of Photolithography Production. IEEE Trans. Semicond. Manuf. 2015, 28, 367–373. [Google Scholar] [CrossRef]
- Zhang, P.; Lv, Y.; Zhang, J. An improved imperialist competitive algorithm based photolithography machines scheduling. Int. J. Prod. Res. 2018, 56, 1017–1029. [Google Scholar] [CrossRef]
- Kim, T.; Kim, H.; Lee, T.-E.; Morrison, J.R.; Kim, E. On Scheduling a Photolithograhy Toolset Based on a Deep Reinforcement Learning Approach with Action Filter. In Proceedings of the Winter Simulation Conference (WSC), Phoenix, AZ, USA, 12–15 December 2021; pp. 1–10. [Google Scholar] [CrossRef]
- Chien, C.-F.; Lan, Y.-B. Agent-based approach integrating deep reinforcement learning and hybrid genetic algorithm for dynamic scheduling for Industry 3.5 smart production. Comput. Ind. Eng. 2021, 162, 107782. [Google Scholar] [CrossRef]
- Cao, Z.; Lin, C.; Zhou, M.; Zhou, C.; Sedraoui, K. Two-Stage Genetic Algorithm for Scheduling Stochastic Unrelated Parallel Machines in a Just-in-Time Manufacturing Context. IEEE Trans. Autom. Sci. Eng. 2022, 20, 936–949. [Google Scholar] [CrossRef]
- Lee, D.; Lee, D.; Kim, K. Self-growth learning-based machine scheduler to minimize setup time and tardiness in OLED display semiconductor manufacturing. Appl. Soft Comput. 2023, 145, 110600. [Google Scholar] [CrossRef]
- Liu, C.-H. A genetic algorithm based approach for scheduling of jobs containing multiple orders in a three-machine flowshop. Int. J. Prod. Res. 2010, 48, 4379–4396. [Google Scholar] [CrossRef]
- Yao, F.S.; Zhao, M.; Zhang, H. Two-stage hybrid flow shop scheduling with dynamic job arrivals. Comput. Oper. Res. 2012, 39, 1701–1712. [Google Scholar] [CrossRef]
- Kim, H.-J.; Lee, J.-H. Three-machine flow shop scheduling with overlapping waiting time constraints. Comput. Oper. Res. 2019, 101, 93–102. [Google Scholar] [CrossRef]
- Celano, G.; Costa, A.; Fichera, S. Constrained scheduling of the inspection activities on semiconductor wafers grouped in families with sequence-dependent set-up times. Int. J. Adv. Manuf. Technol. 2010, 46, 695–705. [Google Scholar] [CrossRef]
- Nawaz, M.; Enscore, E.E.; Ham, I. A heuristic algorithm for the m-machine, n-job flow-shop sequencing problem. Omega 1983, 11, 91–95. [Google Scholar] [CrossRef]
- Nowicki, E. The permutation flow shop with buffers. A tabu search approach. Eur. J. Oper. Res. 1999, 116, 205–219. [Google Scholar] [CrossRef]
- Noroozi, A.; Mokhtari, H.; Kamal Abadi, I.N. Research on computational intelligence algorithms with adaptive learning approach for scheduling problems with batch processing machines. Neurocomputing 2013, 101, 190–203. [Google Scholar] [CrossRef]
- Aguirre, A.M.; Méndez, C.A.; Castro, P.M. A novel optimization method to automated wet-etch station scheduling in semiconductor manufacturing systems. Comput. Chem. Eng. 2011, 35, 2960–2972. [Google Scholar] [CrossRef]
- Aguirre, A.M.; Méndez, C.A.; Gutierrez, G.; De Prada, C. An improvement-based MILP optimization approach to complex AWS scheduling. Comput. Chem. Eng. 2012, 47, 217–226. [Google Scholar] [CrossRef]
- Aguirre, A.M.; Méndez, C.A.; Castro, P.M. A hybrid scheduling approach for automated flowshops with material handling and time constraints. Int. J. Prod. Res. 2014, 52, 2788–2806. [Google Scholar] [CrossRef]
- Rotondo, A.; Young, P.; Geraghty, J. Sequencing optimisation for makespan improvement at wet-etch tools. Comput. Oper. Res. 2015, 53, 261–274. [Google Scholar] [CrossRef]
- Wang, I.-L.; Yang, T.; Chang, Y.-B. Scheduling two-stage hybrid flow shops with parallel batch, release time, and machine eligibility constraints. J. Intell. Manuf. 2012, 23, 2271–2280. [Google Scholar] [CrossRef]
- Qin, M.; Wang, R.; Shi, Z.; Liu, L.; Shi, L. A Genetic Programming-Based Scheduling Approach for Hybrid Flow Shop with a Batch Processor and Waiting Time Constraint. IEEE Trans. Autom. Sci. Eng. 2021, 18, 94–105. [Google Scholar] [CrossRef]
- Wu, M.-C.; Chiou, C.-W. Scheduling semiconductor in-line steppers in new product/process introduction scenarios. Int. J. Prod. Res. 2010, 48, 1835–1852. [Google Scholar] [CrossRef]
- Fu, M.; Askin, R.; Fowler, J.; Haghnevis, M.; Keng, N.; Pettinato, J.S.; Zhang, M. Batch production scheduling for semiconductor back-end operations. IEEE Trans. Semicond. Manuf. 2011, 24, 249–260. [Google Scholar] [CrossRef]
- Tan, Y.; Mönch, L.; Fowler, J.W. A hybrid scheduling approach for a two-stage flexible flow shop with batch processing machines. J. Sched. 2018, 21, 209–226. [Google Scholar] [CrossRef]
- Hekmatfar, M.; Fatemi Ghomi, S.; Karimi, B. Two stage reentrant hybrid flow shop with setup times and the criterion of minimizing makespan. Appl. Soft Comput. 2011, 11, 4530–4539. [Google Scholar] [CrossRef]
- Bard, J.F.; Gao, Z.; Chacon, R.; Stuber, J. Daily scheduling of multi-pass lots at assembly and test facilities. Int. J. Prod. Res. 2013, 51, 7047–7070. [Google Scholar] [CrossRef]
- Gao, Z.; Bard, J.F.; Chacon, R.; Stuber, J. An assignment-sequencing methodology for scheduling assembly and test operations with multi-pass requirements. IIE Trans. 2015, 47, 153–172. [Google Scholar] [CrossRef]
- Lin, C.-C.; Liu, W.-Y.; Chen, Y.-H. Considering stockers in reentrant hybrid flow shop scheduling with limited buffer capacity. Comput. Ind. Eng. 2020, 139, 106154. [Google Scholar] [CrossRef]
- Ham, M.; Lee, Y.H.; An, J. IP-Based Real-Time Dispatching for Two-Machine Batching Problem with Time Window Constraints. IEEE Trans. Autom. Sci. Eng. 2011, 8, 589–597. [Google Scholar] [CrossRef]
- Jia, W.; Chen, H.; Liu, L.; Jiang, Z.; Li, Y. Full-batch-oriented scheduling algorithm on batch processing workstation of β1 → β2 type with re-entrant flow. Int. J. Comput. Integr. Manuf. 2017, 30, 1029–1042. [Google Scholar] [CrossRef]
- Jia, W.; Chen, H.; Liu, L.; Jiang, Z.; Li, Y. A slack optimization unified model of regrouping and sequencing batches for β1 → β2 manufacturing system. Proc. Inst. Mech. Eng. Part B J. Eng. Manuf. 2017, 233, 665–672. [Google Scholar] [CrossRef]
- Branke, J.; Groves, M.J.; Hildebrandt, T. Evolving control rules for a dual-constrained job scheduling scenario. In Proceedings of the Winter Simulation Conference, Washington, DC, USA, 11–14 December 2016; pp. 2568–2579. [Google Scholar] [CrossRef]
- Kim, Y.-D.; Kang, J.-H.; Lee, G.-E.; Lim, S.-K. Scheduling algorithms for minimizing tardiness of orders at the burn-in workstation in a semiconductor manufacturing system. IEEE Trans. Semicond. Manuf. 2011, 24, 14–26. [Google Scholar] [CrossRef]
- Bang, J.-Y.; Kim, Y.-D. Scheduling algorithms for a semiconductor probing facility. Comput. Oper. Res. 2011, 38, 666–673. [Google Scholar] [CrossRef]
- Jung, C.; Pabst, D.; Ham, M.; Stehli, M.; Rothe, M. An Effective Problem Decomposition Method for Scheduling of Diffusion Processes Based on Mixed Integer Linear Programming. IEEE Trans. Semicond. Manuf. 2014, 27, 357–363. [Google Scholar] [CrossRef]
- Dugardin, F.; Yalaoui, F.; Amodeo, L. New multi-objective method to solve reentrant hybrid flow shop scheduling problem. Eur. J. Oper. Res. 2010, 203, 22–31. [Google Scholar] [CrossRef]
- Gong, S.; Huang, R.; Cao, Z. An improved symbiotic organisms search algorithm for low-yield stepper scheduling problem. In Proceedings of the IEEE Conference on Automation Science and Engineering, Xi’an, China, 20–23 August 2017; pp. 289–294. [Google Scholar] [CrossRef]
- Lin, J.T.; Chen, C.-M.; Chiu, C.-C.; Fang, H.-Y. Simulation optimization with PSO and OCBA for semiconductor back-end assembly. J. Ind. Prod. Eng. 2013, 30, 452–460. [Google Scholar] [CrossRef]
- Lin, J.T.; Chen, C.-M. Simulation optimization approach for hybrid flow shop scheduling problem in semiconductor back-end manufacturing. Simul. Model. Pract. Theory 2015, 51, 100–114. [Google Scholar] [CrossRef]
- Kim, N.; Barde, S.; Bae, K.; Shin, H. Learning per-machine linear dispatching rule for heterogeneous multi-machines control. Int. J. Prod. Res. 2021, 61, 162–182. [Google Scholar] [CrossRef]
- Mason, S.J.; Fowler, J.W.; Carlyle, W.M. A modified shifting bottleneck heuristic for minimizing total weighted tardiness in complex job shops. J. Sched. 2002, 5, 247–262. [Google Scholar] [CrossRef]
- Jampani, J.; Mason, S.J. A column generation heuristic for complex job shop multiple orders per job scheduling. Comput. Ind. Eng. 2010, 58, 108–118. [Google Scholar] [CrossRef]
- Knopp, S.; Dauzere-Peres, S.; Yugma, C. Flexible job-shop scheduling with extended route flexibility for semiconductor manufacturing. In Proceedings of the Winter Simulation Conference 2014, Savannah, GA, USA, 7–10 December 2014; pp. 2478–2489. [Google Scholar] [CrossRef]
- Knopp, S.; Dauzère-Pérès, S.; Yugma, C. A batch-oblivious approach for Complex Job-Shop scheduling problems. Eur. J. Oper. Res. 2017, 263, 50–61. [Google Scholar] [CrossRef]
- Tamssaouet, K.; Dauzere-Peres, S.; Yugma, C.; Knopp, S.; Pinaton, J. A study on the integration of complex machines in complex job shop scheduling. In Proceedings of the Winter Simulation Conference, Gothenburg, Sweden, 9–12 December 2018; pp. 3561–3572. [Google Scholar] [CrossRef]
- Yugma, C.; Dauzère-Pérès, S.; Artigues, C.; Derreumaux, A.; Sibille, O. A batching and scheduling algorithm for the diffusion area in semiconductor manufacturing. Int. J. Prod. Res. 2012, 50, 2118–2132. [Google Scholar] [CrossRef]
- Wang, S.; Wang, L. A knowledge-based multi-agent evolutionary algorithm for semiconductor final testing scheduling problem. Knowl.-Based Syst. 2015, 84, 1–9. [Google Scholar] [CrossRef]
- Wang, S.; Wang, L.; Liu, M.; Xu, Y. A hybrid estimation of distribution algorithm for the semiconductor final testing scheduling problem. J. Intell. Manuf. 2015, 26, 861–871. [Google Scholar] [CrossRef]
- Sang, H.-Y.; Duan, P.-Y.; Li, J.-Q. An effective invasive weed optimization algorithm for scheduling semiconductor final testing problem. Swarm Evol. Comput. 2018, 38, 42–53. [Google Scholar] [CrossRef]
- Cao, Z.; Lin, C.; Zhou, M.; Huang, R. Scheduling semiconductor testing facility by using cuckoo search algorithm with reinforcement learning and surrogate modeling. IEEE Trans. Autom. Sci. Eng. 2018, 16, 825–837. [Google Scholar] [CrossRef]
- Chou, C.-W.; Chien, C.-F.; Gen, M. A Multi objective Hybrid Genetic Algorithm for TFT-LCD Module Assembly Scheduling. IEEE Trans. Autom. Sci. Eng. 2014, 11, 692–705. [Google Scholar] [CrossRef]
- Chung, B.-S.; Lim, J.; Park, I.-B.; Park, J.; Seo, M.; Seo, J. Setup change scheduling for semiconductor packaging facilities using a genetic algorithm with an operator recommender. IEEE Trans. Semicond. Manuf. 2014, 27, 377–387. [Google Scholar] [CrossRef]
- Park, I.-B.; Huh, J.; Kim, J.; Park, J. A Reinforcement Learning Approach to Robust Scheduling of Semiconductor Manufacturing Facilities. IEEE Trans. Autom. Sci. Eng. 2020, 17, 1420–1431. [Google Scholar] [CrossRef]
- Park, I.-B.; Park, J. Scalable Scheduling of Semiconductor Packaging Facilities Using Deep Reinforcement Learning. IEEE Trans. Cybern. 2021, 53, 3518–3531. [Google Scholar] [CrossRef] [PubMed]
- Wu, K.; Huang, E.; Wang, M.; Zheng, M. Job scheduling of diffusion furnaces in semiconductor fabrication facilities. Eur. J. Oper. Res. 2022, 301, 141–152. [Google Scholar] [CrossRef]
- Chen, T. An optimized tailored nonlinear fluctuation smoothing rule for scheduling a semiconductor manufacturing factory. Comput. Ind. Eng. 2010, 58, 317–325. [Google Scholar] [CrossRef]
- Chen, T. A localised fuzzy-neural fluctuation smoothing rule for job scheduling in a wafer fab. Int. J. Manuf. Res. 2012, 7, 409–425. [Google Scholar] [CrossRef]
- Li, L.; Yu, Q. Scheduling strategy of semiconductor production lines with remaining cycle time prediction. In Proceedings of the Winter Simulation Conference, Las Vegas, NV, USA, 3–6 December 2017; pp. 3679–3690. [Google Scholar] [CrossRef]
- Kim, H.; Lim, D.-E.; Lee, S. Deep Learning-Based Dynamic Scheduling for Semiconductor Manufacturing with High Uncertainty of Automated Material Handling System Capability. IEEE Trans. Semicond. Manuf. 2020, 33, 13–22. [Google Scholar] [CrossRef]
- Lee, Y.H.; Kim, J.W. Daily stepper scheduling rule in the semiconductor manufacturing for MTO products. Int. J. Adv. Manuf. Technol. 2011, 54, 323–336. [Google Scholar] [CrossRef]
- Chiang, T.-C.; Fu, L.-C. Rule-based scheduling in wafer fabrication with due date-based objectives. Comput. Oper. Res. 2012, 39, 2820–2835. [Google Scholar] [CrossRef]
- Yao, S.; Jiang, Z.; Li, N.; Zhang, H.; Geng, N. A multi-objective dynamic scheduling approach using multiple attribute decision making in semiconductor manufacturing. Int. J. Prod. Econ. 2011, 130, 125–133. [Google Scholar] [CrossRef]
- Yao, S.; Jiang, Z.; Li, N.; Geng, N.; Liu, X. A decentralised multi-objective scheduling methodology for semiconductor manufacturing. Int. J. Prod. Res. 2011, 49, 7227–7252. [Google Scholar] [CrossRef]
- Bard, J.F.; Jia, S.; Chacon, R.; Stuber, J. Integrating optimisation and simulation approaches for daily scheduling of assembly and test operations. Int. J. Prod. Res. 2014, 53, 2617–2632. [Google Scholar] [CrossRef]
- Jia, S.; Bard, J.F.; Chacon, R.; Stuber, J. Improving performance of dispatch rules for daily scheduling of assembly and test operations. Comput. Ind. Eng. 2015, 90, 86–106. [Google Scholar] [CrossRef]
- Chung, Y.H.; Cho, K.H.; Park, S.C.; Kim, B.H. Dedication load based dispatching rule for photolithograph machines with dedication constraint. In Proceedings of the Winter Simulation Conference, Washington, DC, USA, 11–14 December 2016; pp. 2731–2739. [Google Scholar] [CrossRef]
- Cui, M.; Li, L. A closed loop dynamic scheduling method based on load balancing for semiconductor wafer fabrication facility. In Proceedings of the IEEE Conference on Smart Manufacturing, Industrial and Logistics Engineering, Hsinchu, Taiwan, 8–9 February 2018; pp. 1–6. [Google Scholar] [CrossRef]
- Li, L.; Sun, Z.; Zhou, M.; Qiao, F. Adaptive dispatching rule for semiconductor wafer fabrication facility. IEEE Trans. Autom. Sci. Eng. 2013, 10, 354–364. [Google Scholar] [CrossRef]
- Li, L.; Min, Z. An efficient adaptive dispatching method for semiconductor wafer fabrication facility. Int. J. Adv. Manuf. Technol. 2016, 84, 315–325. [Google Scholar] [CrossRef]
- Lee, J.-H.; Kim, Y.; Kim, Y.B.; Kim, B.-H.; Jung, G.-H.; Kim, H.-J. A Sequential Search Method of Dispatching Rules for Scheduling of LCD Manufacturing Systems. IEEE Trans. Semicond. Manuf. 2020, 33, 496–503. [Google Scholar] [CrossRef]
- Yu, Q.; Yang, H.; Lin, K.-Y.; Li, L. A self-organized approach for scheduling semiconductor manufacturing systems. J. Intell. Manuf. 2021, 32, 689–706. [Google Scholar] [CrossRef]
- Shiue, Y.-R.; Guh, R.-S.; Lee, K.-C. Study of SOM-based intelligent multi-controller for real-time scheduling. Appl. Soft Comput. 2011, 11, 4569–4580. [Google Scholar] [CrossRef]
- Ma, Y.; Qiao, F.; Lu, J. Learning-based dynamic scheduling of semiconductor manufacturing system. In Proceedings of the 2016 IEEE International Conference on Automation Science and Engineering, Fort Worth, TX, USA, 21–25 August 2016; pp. 1394–1399. [Google Scholar]
- Lim, J.; Chae, M.-J.; Yang, Y.; Park, I.-B.; Lee, J.; Park, J. Fast Scheduling of Semiconductor Manufacturing Facilities Using Case-Based Reasoning. IEEE Trans. Semicond. Manuf. 2016, 29, 22–32. [Google Scholar] [CrossRef]
- Chan, C.W.; Ping Gan, B.; Cai, W. Towards Situation Aware Dispatching in a Dynamic and Complex Manufacturing Environment. In Proceedings of the Winter Simulation Conference (WSC), Orlando, FL, USA, 14–18 December 2020; pp. 528–539. [Google Scholar] [CrossRef]
- Shiue, Y.-R.; Lee, K.-C.; Su, C.-T. A Reinforcement Learning Approach to Dynamic Scheduling in a Product-Mix Flexibility Environment. IEEE Access 2020, 8, 106542–106553. [Google Scholar] [CrossRef]
- Fu, M.C. Optimization for simulation: Theory vs. Practice. INFORMS J. Comput. 2002, 14, 192–215. [Google Scholar] [CrossRef]
- Chang, X.; Dong, M.; Yang, D. Multi-objective real-time dispatching for integrated delivery in a Fab using GA based simulation optimization. J. Manuf. Syst. 2013, 32, 741–751. [Google Scholar] [CrossRef]
- Kuck, M.; Broda, E.; Freitag, M.; Hildebrandt, T.; Frazzon, E.M. Towards adaptive simulation-based optimization to select individual dispatching rules for production control. In Proceedings of the Winter Simulation Conference, Las Vegas, NV, USA, 3–6 December 2017; pp. 3852–3863. [Google Scholar] [CrossRef]
- Ghasemi, A.; Ashoori, A.; Heavey, C. Evolutionary Learning Based Simulation Optimization for Stochastic Job Shop Scheduling Problems. Appl. Soft Comput. 2021, 106, 107309. [Google Scholar] [CrossRef]
- Lin, C.; Cao, Z.; Zhou, M. Learning-Based Grey Wolf Optimizer for Stochastic Flexible Job Shop Scheduling. IEEE Trans. Autom. Sci. Eng. 2022, 19, 3659–3671. [Google Scholar] [CrossRef]
- Liu, J.; Qiao, F.; Zou, M.; Zinn, J.; Ma, Y.; Vogel-Heuser, B. Dynamic scheduling for semiconductor manufacturing systems with uncertainties using convolutional neural networks and reinforcement learning. Complex Intell. Syst. 2022, 8, 4641–4662. [Google Scholar] [CrossRef]
- Park, I.-B.; Huh, J.; Park, J. A Generation and Repair Approach to Scheduling Semiconductor Packaging Facilities Using Case-Based Reasoning. IEEE Access 2023, 11, 50631–50641. [Google Scholar] [CrossRef]
- Sakr, A.H.; Aboelhassan, A.; Yacout, S.; Bassetto, S. Simulation and deep reinforcement learning for adaptive dispatching in semiconductor manufacturing systems. J. Intell. Manuf. 2023, 34, 1311–1324. [Google Scholar] [CrossRef]
- Yoon, H.J.; Kim, J.G. Heuristic scheduling policies for a semiconductor wafer fabrication facility: Minimizing variation of cycle times. Int. J. Adv. Manuf. Technol. 2013, 67, 171–180. [Google Scholar] [CrossRef]
- Li, Y.; Jiang, Z.; Jia, W. An integrated release and dispatch policy for semiconductor wafer fabrication. Int. J. Prod. Res. 2014, 52, 2275–2292. [Google Scholar] [CrossRef]
- Singh, R.; Mathirajan, M. A New Stage-Wise Control Release Policy for Semiconductor Wafer Fabrication Systems. IEEE Trans. Semicond. Manuf. 2021, 34, 115–134. [Google Scholar] [CrossRef]
- Qiao, F.; Liu, J.; Ma, Y. Industrial big-data-driven and CPS-based adaptive production scheduling for smart manufacturing. Int. J. Prod. Res. 2021, 59, 7139–7159. [Google Scholar] [CrossRef]
- Drießel, R.; Mönch, L. An integrated scheduling and material-handling approach for complex job shops: A computational study. Int. J. Prod. Res. 2012, 50, 5966–5985. [Google Scholar] [CrossRef]
- Guo, C.; Zhibin, J.; Zhang, H.; Li, N. Decomposition-based classified ant colony optimization algorithm for scheduling semiconductor wafer fabrication system. Comput. Ind. Eng. 2012, 62, 141–151. [Google Scholar] [CrossRef]
- Kopanos, G.M.; Xenos, D.; Andreev, S.; O’Donnell, T.; Feely, S. Advanced Production Scheduling in a Seagate Technology Wafer Fab. In Proceedings of the Winter Simulation Conference (WSC), Orlando, FL, USA, 14–18 December 2020; pp. 1954–1965. [Google Scholar] [CrossRef]
- Barhebwa-Mushamuka, F.; Dauzère-Pérès, S.; Yugma, C. A global scheduling approach for cycle time control in complex manufacturing systems. Int. J. Prod. Res. 2021, 61, 559–579. [Google Scholar] [CrossRef]
- Qiao, F.; Ma, Y.; Zhou, M.; Wu, Q. A Novel Rescheduling Method for Dynamic Semiconductor Manufacturing Systems. IEEE Trans. Syst. Man Cybern. Syst. 2018, 50, 1679–1689. [Google Scholar] [CrossRef]
- Zhong, H.; Liu, M.; Hao, J.; Jiang, S. An Operation-Group Based Soft Scheduling Approach for Uncertain Semiconductor Wafer Fabrication System. IEEE Trans. Syst. Man Cybern. Syst. 2018, 48, 1332–1347. [Google Scholar] [CrossRef]
- Zhong, H.; Liu, M.; Bao, L. A job-priority based soft scheduling approach for uncertain work area scheduling in Semiconductor Manufacturing. Int. J. Prod. Res. 2021, 60, 5012–5028. [Google Scholar] [CrossRef]
- Jamrus, T.; Chien, C.F.; Gen, M.; Sethanan, K. Hybrid Particle Swarm Optimization Combined with Genetic Operators for Flexible Job-Shop Scheduling under Uncertain Processing Time for Semiconductor Manufacturing. IEEE Trans. Semicond. Manuf. 2018, 31, 32–41. [Google Scholar] [CrossRef]
- Fowler, J.W.; Mönch, L.; Ponsignon, T. Discrete-Event simulation for semiconductor wafer fabrication facilities: A tutorial. Int. J. Ind. Eng. 2015, 22, 661–682. [Google Scholar]
- Ouelhadj, D.; Petrovic, S. A survey of dynamic scheduling in manufacturing systems. J. Sched. 2009, 12, 417–431. [Google Scholar] [CrossRef]
- Lee, Y.H.; Ham, M.; Yoo, B.; Lee, J.S. Daily planning and scheduling system for the EDS process in a semiconductor manufacturing facility. Int. J. Adv. Manuf. Technol. 2009, 41, 568–579. [Google Scholar] [CrossRef]
- Xiao, J.; Yang, H.; Zhang, C.; Zheng, L.; Gupta, J.N.D. A hybrid Lagrangian-simulated annealing-based heuristic for the parallel-machine capacitated lot-sizing and scheduling problem with sequence-dependent setup times. Comput. Oper. Res. 2015, 63, 72–82. [Google Scholar] [CrossRef]
- Driessel, R.; Mönch, L. Variable neighborhood search approaches for scheduling jobs on parallel machines with sequence-dependent setup times, precedence constraints, and ready times. Comput. Ind. Eng. 2011, 61, 336–345. [Google Scholar] [CrossRef]
- Fallahi, A.; Shahidi-Zadeh, B.; Niaki, S.T.A. Unrelated parallel batch processing machine scheduling for production systems under carbon reduction policies: NSGA-II and MOGWO metaheuristics. Soft Comput. 2023. [Google Scholar] [CrossRef]
- Uetz, M. When greediness fails: Examples from stochastic scheduling. Oper. Res. Lett. 2003, 31, 413–419. [Google Scholar] [CrossRef]
- Asmundsson, J.; Rardin, R.L.; Uzsoy, R. Tractable Nonlinear Production Planning Models for Semiconductor Wafer Fabrication Facilities. IEEE Trans. Semicond. Manuf. 2006, 19, 95–111. [Google Scholar] [CrossRef]
- Fowler, J.W.; Robinson, J. Measurement and Improvement of Manufacturing Capacity (MIMAC) Final Report; Technical Report No. 95062861A-TR; SEMATECH, Inc.: Austin, TX, USA, 1995. [Google Scholar]
- Huang, E.; Wu, K. Job Scheduling at Cascading Machines. IEEE Trans. Autom. Sci. Eng. 2017, 14, 1634–1642. [Google Scholar] [CrossRef]
- Hung, Y.-F.; Wang, C.-C.; Wu, G.-H. Scheduling semiconductor multihead testers using metaheuristic techniques embedded with lot-specific and configuration-specific information. Math. Probl. Eng. 2013, 2013, 436701. [Google Scholar] [CrossRef]
- Wu, J.-Z.; Hao, X.-C.; Chien, C.-F.; Gen, M. A novel bi-vector encoding genetic algorithm for the simultaneous multiple resources scheduling problem. J. Intell. Manuf. 2012, 23, 2255–2270. [Google Scholar] [CrossRef]
- Cao, Z.; Gong, S.; Zhou, M.; Liu, K. A Self-braking Symbiotic Organisms Search Algorithm for Bi-objective Reentrant Hybrid Flow Shop Scheduling Problem. In Proceedings of the IEEE International Conference on Automation Science and Engineering, Munich, Germany, 20–24 August 2018; pp. 803–808. [Google Scholar] [CrossRef]
- Madathil, S.C.; Nambiar, S.; Mason, S.J.; Kurz, M.E. On scheduling a photolithography area containing cluster tools. Comput. Ind. Eng. 2018, 121, 177–188. [Google Scholar] [CrossRef]
- Yu, T.-S.; Kim, H.-J.; Lee, T.-E. Minimization of waiting time variation in a generalized two-machine flowshop with waiting time constraints and skipping jobs. IEEE Trans. Semicond. Manuf. 2017, 30, 155–165. [Google Scholar] [CrossRef]
- Bang, J.-Y.; Kim, Y.-D.; Choi, S.-W. Multiproduct Lot Merging–Splitting Algorithms for Semiconductor Wafer Fabrication. IEEE Trans. Semicond. Manuf. 2012, 25, 200–210. [Google Scholar] [CrossRef]
- Li, Y.; Jiang, Z.; Jia, W. API-based two-dimensional dispatching decision-making approach for semiconductor wafer fabrication with operation due date–related objectives. Int. J. Prod. Res. 2016, 55, 79–95. [Google Scholar] [CrossRef]
(Shop Environment) | (Processing Characteristics) | (Performance Measures) | |||
---|---|---|---|---|---|
Notation | Description | Notation | Description | Notation | Description |
1 | single machine | p-batch | parallel batch | total (weighted) completion time | |
Pm | identical m parallel machines | s-batch | serial batch | total (weighted) flow time | |
Qm | uniform m parallel machines | incompatible | incompatible job families | total (weighted) tardiness | |
Rm | unrelated m parallel machines | aux | auxiliary resources | total (weighted) number of tardy jobs | |
Fm | m-machine flow shop | recrc | reentrant flows | total (weighted) earliness and tardiness | |
HFc | c-stage hybrid flow shop | prec | process precedence | maximum lateness | |
HFFc | c-stage hybrid flexible flow shop | release time of job j | makespan | ||
Jm | m-machine job shop | , (B) | job size (batch capacity) | TSC | total setup time/cost |
FJc | c-stage flexible job shop | sequence-dependent setup times from job k to job l | throughput | total number of finished jobs | |
machine dedication | EPC | electric power cost | |||
time window | regular objectives |
Analytical Methods | Metaheuristics | Rule-Based Methods | |||
---|---|---|---|---|---|
MILP | Mixed Integer Linear Programming | VNS/ VND | Variable Neighborhood Search (Descent) | (B)ATC | (Batched) Apparent Tardiness Cost |
MINLP | Mixed Integer Nonlinear Programming | (B)RKGA | (Biased) Random Key Genetic Algorithm | ATCSR | Apparent Tardiness Cost with Setups and Ready times |
B&B | Branch and Bound | GA | Genetic Algorithm | FIFO | First In First Out |
B&C | Branch and Cut | MA | Memetic Algorithm | FCFS | First Come First Serve |
DP | Dynamic Programming | ACO | Ant Colony Optimization | ERT | Earliest Release Time |
CG | Column Generation | SA | Simulated Annealing | LST | Latest Start Time |
CP | Constraint Programming | TS | Tabu Search | SPT | Shortest Processing Time |
PSO | Particle Swarm Optimization | LPT | Longest Processing Time | ||
ALNS | Adaptive Large Neighborhood Search | EDD | Earliest Due Date | ||
GRASP | Greedy Randomized Adaptive Search Procedure |
Disclaimer/Publisher’s Note: The statements, opinions and data contained in all publications are solely those of the individual author(s) and contributor(s) and not of MDPI and/or the editor(s). MDPI and/or the editor(s) disclaim responsibility for any injury to people or property resulting from any ideas, methods, instructions or products referred to in the content. |
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
Share and Cite
Fang, J.; Cheang, B.; Lim, A. Problems and Solution Methods of Machine Scheduling in Semiconductor Manufacturing Operations: A Survey. Sustainability 2023, 15, 13012. https://doi.org/10.3390/su151713012
Fang J, Cheang B, Lim A. Problems and Solution Methods of Machine Scheduling in Semiconductor Manufacturing Operations: A Survey. Sustainability. 2023; 15(17):13012. https://doi.org/10.3390/su151713012
Chicago/Turabian StyleFang, Jianxin, Brenda Cheang, and Andrew Lim. 2023. "Problems and Solution Methods of Machine Scheduling in Semiconductor Manufacturing Operations: A Survey" Sustainability 15, no. 17: 13012. https://doi.org/10.3390/su151713012
APA StyleFang, J., Cheang, B., & Lim, A. (2023). Problems and Solution Methods of Machine Scheduling in Semiconductor Manufacturing Operations: A Survey. Sustainability, 15(17), 13012. https://doi.org/10.3390/su151713012