High-G Calibration Denoising Method for High-G MEMS Accelerometer Based on EMD and Wavelet Threshold
Abstract
:1. Introduction
2. Algorithm
2.1. Empirical Mode Decomposition (EMD)
2.2. Wavelet Threshold Denoising
2.3. Wavelet Thresholding Denoising Based on EMD
3. High-G MEMS Accelerometer
Structure and Structural Parameters of the HGMA
4. Experiment and Verification
4.1. Experiment
4.2. Verification
- Preparing stage: before the shock peak, and this part contains the noise signal and the bias characteristic of HGMA. As can be seen from Figure 7, the noise of original signal data is large (peak-peak value is near about 1000 g), and EMD, Wavelet and EMD + Wavelet methods all work well, and which are proved by denoising results.
- Shock stage: the main part of the calibration experiment, the peak value is about 28,030 g, and the pulse wide is about 10 μs. During this stage, the original signal data, EMD and EMD + Wavelet denoising signals almost overlapping, which indicates that these three curves contain the same information. However, the Wavelet denoising signal amplitude is 25,240 g, which is not the real peak value of original signal data, and the error is more than 10%. So, Wavelet method is not suitable for the calibration denoising.
- Vibration stage: after the shock peak, and this part mainly contains HGMA vibration information, which reflects the dynamic characteristic of HGMA. In this stage, it can be seen that the EMD denoising signal occurs distortion phenomenon and cannot reflect the frequency and amplitude information of original data any more. Meanwhile, the amplitude information of original signal data cannot be expressed after Wavelet denoising. Only EMD + Wavelet method follows the original signal data.
- Shock stage: the frequency peak of this stage is about 27.1 kHz, the original signal data and EMD + Wavelet denoising results have almost the same amplitude and shape (one amplitude is 2.8702 × 107, the other is 2.8701 × 107); the EMD denoising result amplitude is 2.7712 × 107; the Wavelet denoising result amplitude is 1.9523 × 107, which shows that EMD + Wavelet denoising method inherit the real amplitude and frequency information of original signal.
- Vibration stage: the frequency peak of vibration stage is about 525.8 kHz, the original signal data and EMD + Wavelet denoising results have almost the same amplitude and shape (one amplitude is 4.4310 × 107, the other is 4.4251 × 107); the EMD denoising result amplitude is 1.3410 × 105; the Wavelet denoising result amplitude is 2.2503 × 107, which shows that EMD + Wavelet denoising method inherit the real amplitude and frequency information of original signal.
5. Conclusions
Author Contributions
Funding
Conflicts of Interest
References
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Beam | Mass | |||||
---|---|---|---|---|---|---|
Parameters | Length (a1) | Width (b1) | Height (c1) | Length (a2) | Width (b2) | Height (c1) |
Size (μm) | 350 | 800 | 80 | 800 | 800 | 200 |
Mode Shapes | 1 | 2 | 3 | 4 |
---|---|---|---|---|
Resonant Frequency (kHz) | 408 | 667 | 671 | 1119 |
EMD | Wavelet | EMD + Wavelet | Original | ||
---|---|---|---|---|---|
Preparing Stage | Bias Stability Value @10−7s (g/h) | 2.9241 × 104 | 3.7970 × 104 | 3.6162 × 104 | 1.0591 × 106 |
Improves from Original | 97.2% | 96.6% | 96.4% | - | |
Shock Stage | Value | 2.7712 × 107 | 1.9523 × 107 | 2.8701 × 107 | 2.8702 × 107 |
Error from Original | 3.49% | 32.1% | 0.003% | - | |
Vibration Stage | Value | 1.3410 × 105 | 2.2503 × 107 | 4.4251 × 107 | 4.4310 × 107 |
Error from Original | 99.70% | 49.22% | 0.135% | - |
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Lu, Q.; Pang, L.; Huang, H.; Shen, C.; Cao, H.; Shi, Y.; Liu, J. High-G Calibration Denoising Method for High-G MEMS Accelerometer Based on EMD and Wavelet Threshold. Micromachines 2019, 10, 134. https://doi.org/10.3390/mi10020134
Lu Q, Pang L, Huang H, Shen C, Cao H, Shi Y, Liu J. High-G Calibration Denoising Method for High-G MEMS Accelerometer Based on EMD and Wavelet Threshold. Micromachines. 2019; 10(2):134. https://doi.org/10.3390/mi10020134
Chicago/Turabian StyleLu, Qing, Lixin Pang, Haoqian Huang, Chong Shen, Huiliang Cao, Yunbo Shi, and Jun Liu. 2019. "High-G Calibration Denoising Method for High-G MEMS Accelerometer Based on EMD and Wavelet Threshold" Micromachines 10, no. 2: 134. https://doi.org/10.3390/mi10020134
APA StyleLu, Q., Pang, L., Huang, H., Shen, C., Cao, H., Shi, Y., & Liu, J. (2019). High-G Calibration Denoising Method for High-G MEMS Accelerometer Based on EMD and Wavelet Threshold. Micromachines, 10(2), 134. https://doi.org/10.3390/mi10020134