Quality Prediction and Control in Wire Arc Additive Manufacturing via Novel Machine Learning Framework
Abstract
:1. Introduction
- A surrogate model contains one response but with multiple process variables. It is difficult to reversely infer and indicate the domain of the process variable based on single/multiple response data (e.g., (: process variables, : process response).
- A surrogate model primarily focuses on the possibility of the response deviation and cannot provide a numerical level of such deviation.
- Machine learning models, such as k-nearest neighbors (KNN), naïve Bayes mainly focus on predicting the categorical response. Therefore, the quantitative analysis of the desired bead shape is not achievable.
- Other machine learning models, such as response surface methodology (RSM), dominantly use a second-degree polynomial model to indicate the input-output relationship. Still, the reverse indication of the input from the desired output cannot be obtained.
- Develop a quantitative process-quality machine learning framework of influential process parameters towards deposition quality for stainless steel on the WAAM process.
- Classify the correlated process parameters and construct a qualitative model towards the deposition shape level from the correlated parameters.
- Printable zone development is based on quantitative models in the network that control the deposition shape at a certain level.
- A predictive model for controlling the deposited bead shape (width, height, and penetration depth) based on sets of input process parameters.
2. Methodology
Algorithm: Machine learning framework for decomposed vectorized data. |
Algorithm: Machine Learning Framework Construction |
Input: Decomposed Variables {} from {}: |
Output: Point-wise Populated (), and Scored Response {S} |
1. Initialize , {} |
2. : |
3. ) |
4. |
5. |
6. Weight function = |
7. Update {} and {} |
8. Return , S |
- Objectives:
- Randomized: {, ,…, }
- Objectives: , : targeted response
- Randomized: {}
3. Result and Discussion
4. Conclusion and Future Recommendations
- Prediction models are eased to be adapted based on the increasing amount of collected data.
- Prediction provides a quantitative analysis of the process-quality relation.
- The reversely computed printable zone provides a numerical control to the WAAM system.
- An increase in the current would result in a wider bead width and height.
- An increase in the voltage would result in a wider bead width, and the bead height would first increase then decrease.
- An increase in the speed would first result in a wider bead width and then reduce the width, and it shows similar changes for the bead height. In contrast, the depth of penetration would decrease with the increase in the speed.
- Wider bead width will lead to a smaller bead height and a larger depth of penetration.
Author Contributions
Funding
Conflicts of Interest
References
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Analytical Process Parameters | Research Output |
---|---|
Wire feed speed (WFS), travel speed (TS), the ratio between WFS and TS [9] |
|
Heat input [11] |
|
Deposition direction, nozzle tip distance, and gas pressure [12] |
|
Path planning trajectory [13] |
|
Vibration [14] |
|
Air cooling, idle time [15,16] |
|
Term | Coef | SE Coef | T-Value | p-Value | VIF |
---|---|---|---|---|---|
Constant | 4.050 | 0.488 | 8.30 | 0.000 | |
I (Amps) | 0.00840 | 0.00274 | 3.06 | 0.003 | 1.28 |
U (Volts) | 0.03083 | 0.00475 | 6.49 | 0.000 | 1.21 |
Speed (mm/min) | −0.0780 | 0.00409 | −1.91 | 0.042 | 1.41 |
Term | Coef | SE Coef | T-Value | p-Value | VIF |
---|---|---|---|---|---|
Constant | 3.566 | 0.172 | 20.78 | 0.000 | |
I (A) | −0.002465 | 0.000965 | −2.55 | 0.014 | 1.28 |
U (V) | 0.00506 | 0.00167 | 3.03 | 0.004 | 1.21 |
Speed (mm/min) | −0.00654 | 0.00144 | −4.55 | 0.000 | 1.41 |
Bead Width Model | Bead Height Model | Depth of Penetration Model | |
---|---|---|---|
Proposed Model | 0.997 | 0.993 | 0.9853 |
Regression | 0.9237 | 0.7181 | 0.8643 |
Tradition ANN | 0.464 | 0.857 | 0.80 |
Sample No. | Current (A) | Voltage (V) | Speed (mm/min) | BW (mm) | BH (mm) | DOP (mm) |
---|---|---|---|---|---|---|
1 Measured | 215 | 25 | 450 | 9.23 | 3.12 | 5.71 |
1 Predicted | 9.217 | 3.108 | 5.721 | |||
2 Measured | 215 | 27 | 450 | 9.3 | 3.41 | 2.54 |
2 Predicted | 9.218 | 3.451 | 2.551 | |||
3 Measured | 250 | 26 | 600 | 8.56 | 3.3 | 2.45 |
3 Predicted | 8.528 | 3.158 | 2.51 |
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Xiao, X.; Waddell, C.; Hamilton, C.; Xiao, H. Quality Prediction and Control in Wire Arc Additive Manufacturing via Novel Machine Learning Framework. Micromachines 2022, 13, 137. https://doi.org/10.3390/mi13010137
Xiao X, Waddell C, Hamilton C, Xiao H. Quality Prediction and Control in Wire Arc Additive Manufacturing via Novel Machine Learning Framework. Micromachines. 2022; 13(1):137. https://doi.org/10.3390/mi13010137
Chicago/Turabian StyleXiao, Xinyi, Clarke Waddell, Carter Hamilton, and Hanbin Xiao. 2022. "Quality Prediction and Control in Wire Arc Additive Manufacturing via Novel Machine Learning Framework" Micromachines 13, no. 1: 137. https://doi.org/10.3390/mi13010137
APA StyleXiao, X., Waddell, C., Hamilton, C., & Xiao, H. (2022). Quality Prediction and Control in Wire Arc Additive Manufacturing via Novel Machine Learning Framework. Micromachines, 13(1), 137. https://doi.org/10.3390/mi13010137