Wen, B.; Sekine, S.; Osawa, S.; Shimizu, Y.; Matsukuma, H.; Archenti, A.; Gao, W.
A Comparison of the Probes with a Cantilever Beam and a Double-Sided Beam in the Tool Edge Profiler for On-Machine Measurement of a Precision Cutting Tool. Machines 2021, 9, 271.
https://doi.org/10.3390/machines9110271
AMA Style
Wen B, Sekine S, Osawa S, Shimizu Y, Matsukuma H, Archenti A, Gao W.
A Comparison of the Probes with a Cantilever Beam and a Double-Sided Beam in the Tool Edge Profiler for On-Machine Measurement of a Precision Cutting Tool. Machines. 2021; 9(11):271.
https://doi.org/10.3390/machines9110271
Chicago/Turabian Style
Wen, Bo, Sho Sekine, Shinichi Osawa, Yuki Shimizu, Hiraku Matsukuma, Andreas Archenti, and Wei Gao.
2021. "A Comparison of the Probes with a Cantilever Beam and a Double-Sided Beam in the Tool Edge Profiler for On-Machine Measurement of a Precision Cutting Tool" Machines 9, no. 11: 271.
https://doi.org/10.3390/machines9110271
APA Style
Wen, B., Sekine, S., Osawa, S., Shimizu, Y., Matsukuma, H., Archenti, A., & Gao, W.
(2021). A Comparison of the Probes with a Cantilever Beam and a Double-Sided Beam in the Tool Edge Profiler for On-Machine Measurement of a Precision Cutting Tool. Machines, 9(11), 271.
https://doi.org/10.3390/machines9110271
