Research on Blast Furnace Tuyere Image Anomaly Detection, Based on the Local Channel Attention Residual Mechanism
Abstract
:1. Introduction
2. Related Work
3. Proposed Methods
3.1. The Structure and Working Principle of LSERNet
3.2. Construction of the Local Channel Attention Module LSEB (Local Squeeze-and-Excitation Block)
3.3. Construction of the RB (Residual Block) Module
4. Experiments
4.1. Data Set and Preprocessing
- The data should be augmented to make the model have a strong generalization ability and to avoid overfitting. The images were rotated randomly, and slight changes were added to enrich the dataset;
- In order to reduce the influence of the image noise, the region of interest of the image is intercepted;
- The size of the input image is 256 × 256, which reduces the amount of calculation and speeds up the operation of the model.
4.2. Experimental Parameter Setting
4.3. Model Evaluation Indicators
5. Analysis of the Results
5.1. k-Fold Cross-Validation Results
5.2. Comparison and Analysis of the Accuracy of the Different Models
5.3. Comparative Analysis of the Feature Extraction
6. Conclusions
- Compared with the original SE module, the LSEB module strengthens the ability of the feature extraction, does not ignore some important feature information, and makes full use of the regional information;
- Compared with other models, the LSERNet model constructed by us has achieved the highest accuracy in the case of the same model complexity as other models, which can effectively identify the abnormal working state of the blast furnace tuyere.
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
- Liu, Y.; Lei, Y.B.; Fan, J.L.; Wang, F.; Gong, Y.C.; Tian, Q. Survey on image classification technology based on small sample learning. Acta Autom. Sin 2021, 47, 297–315. [Google Scholar]
- Wu, S.; Xu, Y.; Zhao, D. Survey of object detection based on deep convolutional network. Pattern Recognit. Artif. Intell. 2018, 31, 45–46. [Google Scholar]
- Jing, Z.W.; Guan, H.Y.; Peng, D.F.; Yu, Y.T. Survey of research in image semantic segmentation based on deep neural network. Comput. Eng. 2020, 46, 1–17. [Google Scholar]
- Bengio, Y.; Courville, A.; Vincent, P. Representation Learning: A Review and New Perspectives. IEEE Trans. Pattern Anal. Mach. Intell. 2013, 35, 1798–1828. [Google Scholar] [CrossRef] [PubMed] [Green Version]
- Krizhevsky, A.; Sutskever, I.; Hinton, G.E. Imagenet classification with deep convolutional neural networks. Commun. ACM 2017, 60, 84–90. [Google Scholar] [CrossRef] [Green Version]
- Simonyan, K.; Zisserman, A. Very deep convolutional networks for large-scale image recognition. arXiv 2014, arXiv:1409.1556. [Google Scholar]
- Szegedy, C.; Liu, W.; Jia, Y.; Sermanet, P.; Reed, S.; Anguelov, D.; Erhan, D.; Vanhoucke, V.; Rabinovich, A. Going deeper with convolutions. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, Boston, MA, USA, 7–12 June 2015; pp. 1–9. [Google Scholar]
- Li, P.; Xie, J.; Wang, Q.; Zuo, W. Is second-order information helpful for large-scale visual recognition? In Proceedings of the IEEE International Conference on Computer Vision, Venice, Italy, 22–29 October 2017; pp. 2070–2078. [Google Scholar]
- Li, Y.; Wang, N.; Liu, J.; Hou, X. Factorized bilinear models for image recognition. In Proceedings of the IEEE International Conference on Computer Vision, Venice, Italy, 22–29 October 2017; pp. 2079–2087. [Google Scholar]
- Deng, J.; Dong, W.; Socher, R.; Li, L.; Li, K.; Li, F.F. ImageNet: A large-scale hierarchical image database. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, Miami, FL, USA, 20–25 June 2009; pp. 248–255. [Google Scholar]
- Wang, X.; Girshick, R.; Gupta, A.; He, K. Non-local neural networks. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, Salt Lake City, UT, USA, 18–22 June 2018; pp. 7794–7803. [Google Scholar]
- Gao, Z.; Xie, J.; Wang, Q.; Li, P. Global second-order pooling convolutional networks. In Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, Long Beach, CA, USA, 15–20 June 2019. [Google Scholar]
- He, K.; Zhang, X.; Ren, S.; Sun, J. Deep residual learning for image recognition. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, Las Vegas, NV, USA, 27–30 June 2016; pp. 770–778. [Google Scholar]
- Huang, G.; Liu, Z.; Maaten, L.; Weinberger, K.Q. Densely connected convolutional networks. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, Honolulu, HI, USA, 21–26 July 2017; pp. 2261–2269. [Google Scholar]
- Hu, J.; Shen, L.; Sun, G. Squeeze-and-excitation networks. arXiv 2017, arXiv:1709.01507. [Google Scholar]
- Wang, R.; Li, Z.; Yang, L.; Li, Y.; Zhang, H.; Song, C.; Jiang, M.; Ye, X.; Hu, K. Application of Efficient Channel Attention Residual Mechanism in Blast Furnace Tuyere Image Anomaly Detection. Appl. Sci. 2022, 12, 7823. [Google Scholar] [CrossRef]
- Chen, Y.; Kalantidis, Y.; Li, J.; Yan, S.; Feng, J. A2-Nets: Double attention networks. In Proceedings of the NIPS, Montréal, QC, Canada, 3–8 December 2018. [Google Scholar]
- Fu, J.; Liu, J.; Tian, H.; Li, Y.; Bao, Y.; Fang, Z.; Lu, H. Dual attention network for scene segmentation. In Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Long Beach, CA, USA, 15–20 June 2019; pp. 3141–3149. [Google Scholar] [CrossRef]
- Hu, J.; Shen, L.; Albanie, S.; Sun, G.; Vedaldi, A. Gather-excite: Exploiting feature context in convolutional neural networks. In Proceedings of the NeurIPS, Montréal, QC, Canada, 3–8 December 2018. [Google Scholar]
- Park, J.; Woo, S.; Lee, J.Y.; Kweon, I.S. Bam: Bottleneck attention module. arXiv 2018, arXiv:1807.06514. [Google Scholar]
- Woo, S.; Park, J.; Lee, J.; Kweon, I.S. CBAM: Convolutional block attention module. In Proceedings of the European Conference on Computer Vision, Munich, Germany, 8–14 September 2018; pp. 3–19. [Google Scholar]
- Li, X.; Hu, X.; Yang, J. Spatial group-wise enhance: Improving semantic feature learning in convolutional networks. arXiv 2019, arXiv:1905.09646. [Google Scholar]
- Zhang, Q.L.; Yang, Y.B. Sa-net: Shuffle attention for deep convolutional neural networks. In Proceedings of the 2021 IEEE International Conference on Acoustics, Speech and Signal Processing, Toronto, ON, Canada, 6–11 June 2021; pp. 2235–2239. [Google Scholar]
- Wang, Q.; Wu, B.; Zhu, P.; Li, P.; Zuo, W.; Hu, Q. ECA-Net: Efficient channel attention for deep convolutional neural networks. In Proceedings of the 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, Seattle, WA, USA, 13–19 June 2020; pp. 11531–11539. [Google Scholar]
Model | Batch Size | Learning Rate | Average Accuracy |
---|---|---|---|
LSERNet | 16 | 0.1 | 98.59% |
SE-ResNet50 | 32 | 0.1 | 97.52% |
ResNet50 | 32 | 0.001 | 97.42% |
LSE-ResNeXt | 16 | 0.1 | 97.94% |
SE-ResNeXt | 32 | 0.1 | 97.63% |
ResNeXt | 16 | 0.1 | 97.49% |
Disclaimer/Publisher’s Note: The statements, opinions and data contained in all publications are solely those of the individual author(s) and contributor(s) and not of MDPI and/or the editor(s). MDPI and/or the editor(s) disclaim responsibility for any injury to people or property resulting from any ideas, methods, instructions or products referred to in the content. |
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
Share and Cite
Song, C.; Li, Z.; Li, Y.; Zhang, H.; Jiang, M.; Hu, K.; Wang, R. Research on Blast Furnace Tuyere Image Anomaly Detection, Based on the Local Channel Attention Residual Mechanism. Appl. Sci. 2023, 13, 802. https://doi.org/10.3390/app13020802
Song C, Li Z, Li Y, Zhang H, Jiang M, Hu K, Wang R. Research on Blast Furnace Tuyere Image Anomaly Detection, Based on the Local Channel Attention Residual Mechanism. Applied Sciences. 2023; 13(2):802. https://doi.org/10.3390/app13020802
Chicago/Turabian StyleSong, Chuanwang, Ziyu Li, Yuming Li, Hao Zhang, Mingjian Jiang, Keyong Hu, and Rihong Wang. 2023. "Research on Blast Furnace Tuyere Image Anomaly Detection, Based on the Local Channel Attention Residual Mechanism" Applied Sciences 13, no. 2: 802. https://doi.org/10.3390/app13020802
APA StyleSong, C., Li, Z., Li, Y., Zhang, H., Jiang, M., Hu, K., & Wang, R. (2023). Research on Blast Furnace Tuyere Image Anomaly Detection, Based on the Local Channel Attention Residual Mechanism. Applied Sciences, 13(2), 802. https://doi.org/10.3390/app13020802