Xiong, X.; Shimizu, Y.; Chen, X.; Matsukuma, H.; Gao, W.
Uncertainty Evaluation for Measurements of Pitch Deviation and Out-of-Flatness of Planar Scale Gratings by a Fizeau Interferometer in Littrow Configuration. Appl. Sci. 2018, 8, 2539.
https://doi.org/10.3390/app8122539
AMA Style
Xiong X, Shimizu Y, Chen X, Matsukuma H, Gao W.
Uncertainty Evaluation for Measurements of Pitch Deviation and Out-of-Flatness of Planar Scale Gratings by a Fizeau Interferometer in Littrow Configuration. Applied Sciences. 2018; 8(12):2539.
https://doi.org/10.3390/app8122539
Chicago/Turabian Style
Xiong, Xin, Yuki Shimizu, Xiuguo Chen, Hiraku Matsukuma, and Wei Gao.
2018. "Uncertainty Evaluation for Measurements of Pitch Deviation and Out-of-Flatness of Planar Scale Gratings by a Fizeau Interferometer in Littrow Configuration" Applied Sciences 8, no. 12: 2539.
https://doi.org/10.3390/app8122539
APA Style
Xiong, X., Shimizu, Y., Chen, X., Matsukuma, H., & Gao, W.
(2018). Uncertainty Evaluation for Measurements of Pitch Deviation and Out-of-Flatness of Planar Scale Gratings by a Fizeau Interferometer in Littrow Configuration. Applied Sciences, 8(12), 2539.
https://doi.org/10.3390/app8122539