Huang, P.-H.; Zhang, Z.-X.; Hsu, C.-H.; Wu, W.-Y.; Ou, S.-L.; Huang, C.-J.; Wuu, D.-S.; Lien, S.-Y.; Zhu, W.-Z.
Deposition Mechanism and Characterization of Plasma-Enhanced Atomic Layer-Deposited SnOx Films at Different Substrate Temperatures. Nanomaterials 2022, 12, 2859.
https://doi.org/10.3390/nano12162859
AMA Style
Huang P-H, Zhang Z-X, Hsu C-H, Wu W-Y, Ou S-L, Huang C-J, Wuu D-S, Lien S-Y, Zhu W-Z.
Deposition Mechanism and Characterization of Plasma-Enhanced Atomic Layer-Deposited SnOx Films at Different Substrate Temperatures. Nanomaterials. 2022; 12(16):2859.
https://doi.org/10.3390/nano12162859
Chicago/Turabian Style
Huang, Pao-Hsun, Zhi-Xuan Zhang, Chia-Hsun Hsu, Wan-Yu Wu, Sin-Liang Ou, Chien-Jung Huang, Dong-Sing Wuu, Shui-Yang Lien, and Wen-Zhang Zhu.
2022. "Deposition Mechanism and Characterization of Plasma-Enhanced Atomic Layer-Deposited SnOx Films at Different Substrate Temperatures" Nanomaterials 12, no. 16: 2859.
https://doi.org/10.3390/nano12162859
APA Style
Huang, P. -H., Zhang, Z. -X., Hsu, C. -H., Wu, W. -Y., Ou, S. -L., Huang, C. -J., Wuu, D. -S., Lien, S. -Y., & Zhu, W. -Z.
(2022). Deposition Mechanism and Characterization of Plasma-Enhanced Atomic Layer-Deposited SnOx Films at Different Substrate Temperatures. Nanomaterials, 12(16), 2859.
https://doi.org/10.3390/nano12162859