Li, Q.; Dong, J.; Han, D.; Xu, D.; Wang, J.; Wang, Y.
Structural Engineering Effects on Hump Characteristics of ZnO/InSnO Heterojunction Thin-Film Transistors. Nanomaterials 2022, 12, 1167.
https://doi.org/10.3390/nano12071167
AMA Style
Li Q, Dong J, Han D, Xu D, Wang J, Wang Y.
Structural Engineering Effects on Hump Characteristics of ZnO/InSnO Heterojunction Thin-Film Transistors. Nanomaterials. 2022; 12(7):1167.
https://doi.org/10.3390/nano12071167
Chicago/Turabian Style
Li, Qi, Junchen Dong, Dedong Han, Dengqin Xu, Jingyi Wang, and Yi Wang.
2022. "Structural Engineering Effects on Hump Characteristics of ZnO/InSnO Heterojunction Thin-Film Transistors" Nanomaterials 12, no. 7: 1167.
https://doi.org/10.3390/nano12071167
APA Style
Li, Q., Dong, J., Han, D., Xu, D., Wang, J., & Wang, Y.
(2022). Structural Engineering Effects on Hump Characteristics of ZnO/InSnO Heterojunction Thin-Film Transistors. Nanomaterials, 12(7), 1167.
https://doi.org/10.3390/nano12071167