Wang, J.; Li, Z.; Chen, Q.; Ding, K.; Zhu, T.; Ni, C.
Detection and Classification of Defective Hard Candies Based on Image Processing and Convolutional Neural Networks. Electronics 2021, 10, 2017.
https://doi.org/10.3390/electronics10162017
AMA Style
Wang J, Li Z, Chen Q, Ding K, Zhu T, Ni C.
Detection and Classification of Defective Hard Candies Based on Image Processing and Convolutional Neural Networks. Electronics. 2021; 10(16):2017.
https://doi.org/10.3390/electronics10162017
Chicago/Turabian Style
Wang, Jinya, Zhenye Li, Qihang Chen, Kun Ding, Tingting Zhu, and Chao Ni.
2021. "Detection and Classification of Defective Hard Candies Based on Image Processing and Convolutional Neural Networks" Electronics 10, no. 16: 2017.
https://doi.org/10.3390/electronics10162017
APA Style
Wang, J., Li, Z., Chen, Q., Ding, K., Zhu, T., & Ni, C.
(2021). Detection and Classification of Defective Hard Candies Based on Image Processing and Convolutional Neural Networks. Electronics, 10(16), 2017.
https://doi.org/10.3390/electronics10162017