Naftaly, M.; Das, S.; Gallop, J.; Pan, K.; Alkhalil, F.; Kariyapperuma, D.; Constant, S.; Ramsdale, C.; Hao, L.
Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques. Electronics 2021, 10, 960.
https://doi.org/10.3390/electronics10080960
AMA Style
Naftaly M, Das S, Gallop J, Pan K, Alkhalil F, Kariyapperuma D, Constant S, Ramsdale C, Hao L.
Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques. Electronics. 2021; 10(8):960.
https://doi.org/10.3390/electronics10080960
Chicago/Turabian Style
Naftaly, Mira, Satyajit Das, John Gallop, Kewen Pan, Feras Alkhalil, Darshana Kariyapperuma, Sophie Constant, Catherine Ramsdale, and Ling Hao.
2021. "Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques" Electronics 10, no. 8: 960.
https://doi.org/10.3390/electronics10080960
APA Style
Naftaly, M., Das, S., Gallop, J., Pan, K., Alkhalil, F., Kariyapperuma, D., Constant, S., Ramsdale, C., & Hao, L.
(2021). Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques. Electronics, 10(8), 960.
https://doi.org/10.3390/electronics10080960