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Journal: Electronics, 2024
Volume: 13
Number: 3476
Article:
DynER: Optimized Test Case Generation for Representational State Transfer (REST)ful Application Programming Interface (API) Fuzzers Guided by Dynamic Error Responses
Authors:
by
Juxing Chen, Yuanchao Chen, Zulie Pan, Yu Chen, Yuwei Li, Yang Li, Min Zhang and Yi Shen
Link:
https://www.mdpi.com/2079-9292/13/17/3476
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