Nonlinearities Associated with Impaired Sensors in a Typical SHM Experimental Set-Up
Abstract
:1. Introduction
2. Materials and Methods
2.1.Experimental Set-Up
- A and C Are fully bonded;
- B is partially bonded, with an adhesive area equal to a circular segment with the “cut off” chord at 75% of the sensor diameter, along x-axis in Figure 3 (Teflon patch in red);
- D is bonded for the half of the contact area.
2.2. SHM Techniques
2.2.1. ToF Evaluation Method
2.2.2. Nonlinear Method by Using Subharmonics
- G is the shear modulus of the sensor material; κ is a coefficient to model the short-plate character of this structure and, for a rectangular cross-section, is equal to 5/6;
- Cl is the linear compliance, and is calculated as the ratio between the free-end, out-of-plane deflection and the corresponding force applied at the same point about the same direction; Cl(x) is another linear compliance that is calculated as the ratio of the out-of-plane deflection at a generic point of abscissa x to the force that is applied at the cantilever free end;
- Ca(x), the axial compliance, represents the ratio between the axial displacement at a point of abscissa x and the axial force that would be applied at the cantilever free end;
- Cc(x), the cross compliance, is the ratio of the slope of the deformed cantilever being measured at the point of abscissa x to the free-end, out-of-plane force.
3. Numerical Simulations
4. Results and Discussion
- the ToF associated with the intact (fully bonded) sensor should be known a priori: in this way the time-shift (otherwise wrongly interpreted) allows to identify the damaged sensor;
- the debonded region must be oriented to the exciting sensor like in the present case of investigation: the ToF actually indicates the presence of debonding when it occurs between approaching edge and propagation wavefront as reported also in [22]. If this condition is not satisfied, the ToF can be useless in the identification of impaired sensors;
- a comparison with an undamaged sensor (in this case the sensor C) should be made to evaluate the time-shift, which makes this approach requiring a baseline.
- the excitation at first subharmonic frequency (fe at 5.45 kHz in experiments and fe at 5.13 kHz in numerical simulations) led to voltage peak at sensor D higher than the received one at sensor B. The excitation at first subharmonic frequency (fe at 19.99 kHz in experiments and fe at 20.51 kHz in numerical simulations) led to voltage peak at sensor B higher than the received one at sensor D;
- for every exciting frequency (experimental cases or FE models), the higher voltage peak was produced by the impaired sensor which was characterised by having the damage resonance frequency equal to fe (LDR). This happens because a structure excited at its natural frequency, behaves with abnormal vibrations (as highlighted in Figure 9): in the specific case of the present investigation, the excitation from the sensor A resulted in higher voltage peak of the impaired sensor since its frequency was equal to the first natural frequency of the sensor debonded part that was free to vibrate as a cantilevered plate.
5. Conclusions
Author Contributions
Conflicts of Interest
References
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Mechanical Properties | Dielectric Properties | ||||||||
---|---|---|---|---|---|---|---|---|---|
Density ρ [kg/m3] | 7800 | Elastic Compliance S33 [m2/N] | 20.7 × 10−12 | Curie Temperature [K] | 623 | Relative Permittivity | 1650 | ||
Elastic Compliance S11 [m2/N] | 16.1 × 10−12 | Elastic Stiffness E33 [N/m2] | 10.0 × 1010 | Relative Permittivity | 1750 | Dielectric Loss Factor | 20 × 10−3 | ||
Electromechanical properties | |||||||||
Coupling factor | Piezoelectric charge coefficient | Piezoelectric Voltage Coefficient | |||||||
kp | 0.62 | k33 | 0.69 | d31 [C/N] | −180 × 10−12 | g31 [Vm/N] | −11.3 × 10−3 | ||
kt | 0.47 | k15 | 0.66 | d33 [C/N] | 400 × 10−12 | g33 [Vm/N] | 25.0 × 10−3 | ||
k31 | 0.35 | d15 [C/N] | 550 × 10−12 |
Actuator (Exciter) | Receiver | Experimental First Superharmonic Amplitude [dBu] | Numerical First Superharmonic Amplitude [dBu] |
---|---|---|---|
A | B | −33.8 | −44.5 |
D | −40.2 | −43.5 | |
B | A | −54.0 | −55.7 |
D | −53.2 | −56.1 | |
D | A | −52.0 | −56.9 |
B | −51.6 | −55.3 |
Actuator (Exciter) | Receiver | Experimental | Numerical | ||
---|---|---|---|---|---|
fe [kHz] | Fundamental Amplitude [dBu] | fe [kHz] | Fundamental Amplitude [dBu] | ||
A | B | 5.45 | −20.2 | 5.13 | −18.7 |
D | −15.1 | −13.3 | |||
B | 19.99 | −16.1 | 20.51 | −14.2 | |
D | −27.4 | −26.3 |
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Carrino, S.; Nicassio, F.; Scarselli, G. Nonlinearities Associated with Impaired Sensors in a Typical SHM Experimental Set-Up. Electronics 2018, 7, 303. https://doi.org/10.3390/electronics7110303
Carrino S, Nicassio F, Scarselli G. Nonlinearities Associated with Impaired Sensors in a Typical SHM Experimental Set-Up. Electronics. 2018; 7(11):303. https://doi.org/10.3390/electronics7110303
Chicago/Turabian StyleCarrino, Stefano, Francesco Nicassio, and Gennaro Scarselli. 2018. "Nonlinearities Associated with Impaired Sensors in a Typical SHM Experimental Set-Up" Electronics 7, no. 11: 303. https://doi.org/10.3390/electronics7110303
APA StyleCarrino, S., Nicassio, F., & Scarselli, G. (2018). Nonlinearities Associated with Impaired Sensors in a Typical SHM Experimental Set-Up. Electronics, 7(11), 303. https://doi.org/10.3390/electronics7110303