Ding, X.; Wang, Z.; Liu, J.; Zhou, M.; Chen, W.; Chen, H.; Mo, J.; Yu, F.
All-in-One Wafer-Level Solution for MMIC Automatic Testing. Electronics 2018, 7, 57.
https://doi.org/10.3390/electronics7050057
AMA Style
Ding X, Wang Z, Liu J, Zhou M, Chen W, Chen H, Mo J, Yu F.
All-in-One Wafer-Level Solution for MMIC Automatic Testing. Electronics. 2018; 7(5):57.
https://doi.org/10.3390/electronics7050057
Chicago/Turabian Style
Ding, Xu, Zhiyu Wang, Jiarui Liu, Min Zhou, Wei Chen, Hua Chen, Jiongjiong Mo, and Faxin Yu.
2018. "All-in-One Wafer-Level Solution for MMIC Automatic Testing" Electronics 7, no. 5: 57.
https://doi.org/10.3390/electronics7050057
APA Style
Ding, X., Wang, Z., Liu, J., Zhou, M., Chen, W., Chen, H., Mo, J., & Yu, F.
(2018). All-in-One Wafer-Level Solution for MMIC Automatic Testing. Electronics, 7(5), 57.
https://doi.org/10.3390/electronics7050057