Maerten, T.; Jaoul, C.; Oltra, R.; Duport, P.; Le Niniven, C.; Tristant, P.; Meunier, F.; Jarry, O.
Micrometric Growth Defects of DLC Thin Films. C 2019, 5, 73.
https://doi.org/10.3390/c5040073
AMA Style
Maerten T, Jaoul C, Oltra R, Duport P, Le Niniven C, Tristant P, Meunier F, Jarry O.
Micrometric Growth Defects of DLC Thin Films. C. 2019; 5(4):73.
https://doi.org/10.3390/c5040073
Chicago/Turabian Style
Maerten, Thibault, Cédric Jaoul, Roland Oltra, Patrice Duport, Christophe Le Niniven, Pascal Tristant, Frédéric Meunier, and Olivier Jarry.
2019. "Micrometric Growth Defects of DLC Thin Films" C 5, no. 4: 73.
https://doi.org/10.3390/c5040073
APA Style
Maerten, T., Jaoul, C., Oltra, R., Duport, P., Le Niniven, C., Tristant, P., Meunier, F., & Jarry, O.
(2019). Micrometric Growth Defects of DLC Thin Films. C, 5(4), 73.
https://doi.org/10.3390/c5040073