Recent Advances in Intelligent MEMS Sensors
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Electrical, Electronics and Communications Engineering".
Deadline for manuscript submissions: closed (20 October 2024) | Viewed by 1848
Special Issue Editor
Interests: multi-sensor navigation; under water remote sensing; underwater LiDAR
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
In recent years, the development of the Internet of Things, intelligent manufacturing, digital twins, autonomous driving and other fields has required urgent advances in intelligent MEMS sensor technology. Classical MEMS sensors can only output the measured signal, and cannot verify and diagnose the quality and authenticity of the measured signal by themselves; they also predict future development trends with difficulty. Intelligent MEMS sensors are the product of a fusion between sensor technology and artificial intelligence, and are capable of performing information collection, processing, and storage functions. Moreover, they are able to think logically, make judgments and determine corresponding treatments for special situations.
In addition to the ability of MEMS sensors to self-compensate the environmental temperature and intelligently reduce and filter noise, intelligent technologies such as fault self-diagnosis, detection range self-adjustment, sensitivity self-calibration, and zero-point self-adjustment are all key methods with which to improve the measurement accuracy and reliability of MEMS sensors. Meanwhile, the health management, array, integration, and signal processing of sensors are also key technologies that support intelligent MEMS sensors. This Special Issue aims to provide researchers with a platform for academic exchange in order to conduct in-depth discussions on intelligent MEMS sensors, seek high-quality work, and gain insights into the latest research results, including, but not limited to, the following topics:
- MEMS sensor fault diagnosis and prediction technology;
- MEMS sensor self-calibration method;
- MEMS sensor residual life prediction technology;
- MEMS detection method for abnormal values in sensor signals;
- MEMS self-compensation technology for sensor environmental interference;
- MEMS sensor health management;
- MEMS multi-sensor integration and fusion technology;
- MEMS array sensor signal processing technology;
- New technologies for manufacturing the technology of MEMS sensors;
- New effects and principles of MEMS sensors.
Prof. Dr. Changhui Jiang
Guest Editor
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