Microscopy in Material Science: Imaging, Analytics, and New Materials
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (20 November 2022) | Viewed by 17231
Special Issue Editor
2. Labex Damas, Université de Lorraine, 57073 Metz, France
Interests: physical properties of materials; electron microscopy; development of innovative procedures in SEM; modeling; metallurgy; semiconductors
Special Issue Information
Dear Colleagues,
Microscopy techniques have become essential in the field of academic or private research, ranging from life science to nanotechnology or fundamental physics as well as for quality control in various industries.
Numerous material properties are probed in these well-known microscopes, which are otherwise complementary: light microscope, transmission electron microscope (TEM and high-resolution TEM, scanning TEM), and scanning electron microscope (SEM). These versatile, high-performance tools enable access, with their own corresponding resolutions, to many material properties, such as structure, morphology, texture, microstructure, and chemical composition, and the identification of defects, mechanical behavior using in situ tensile testing inside a SEM or a TEM, and drift or charge carrier diffusion information in semiconductors, fluorescence, etc.
The evolution and optimization over the past few years of the microscopy-associated techniques for characterizing a wide range of materials at different scales, from the bulk to the atomic level, has allowed huge progress in the understanding of links between their features. The following list of methods is not exhaustive: convergent beam electron diffraction, electron energy loss spectroscopy, three-dimensional electron back-scatter diffraction, accurate electron channeling contrast imaging, transmission Kikuchi diffraction, chemical reaction using liquid-phase electron microscopy, electron-beam-induced current, time-resolved cathodoluminescence, correlative light and electron microscopy methods, digital image correlation approaches, etc. Furthermore, these techniques play an important role in the enhancement and development of new materials and more sophisticated structures.
This Special Issue is devoted to innovative microscopy procedures, either to improve resolution and detection limits or to probe new properties. The implementation of methods combining in situ microscopy characterizations and physical or chemical analyses is also encouraged. The topics of interest also include the processing of microscopy data by advanced digital techniques as well as simulations and modeling. Furthermore, the latest research studies where microscopy has played an important role are welcomed, such as in the development of new materials or advanced systems, in the improvement of their properties, or in the discovery of new properties.
Dr. Nabila Maloufi
Guest Editor
Manuscript Submission Information
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Keywords
- new procedures in microscopy
- SEM
- TEM
- modeling and simulations in microscopy
- in situ microscopy techniques
- new materials or complex systems and microscopy
- materials properties and microscopy
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