In Situ TEM and AFM for Investigation of Materials
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (31 October 2020) | Viewed by 19571
Special Issue Editor
Interests: bioengineering and cell mechanics; nanosciences and nanotechnology; optical methods; materials science and characterization; structural optimization
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
It is my great pleasure to announce the Special Issue “In Situ TEM and AFM for Investigation of Materials”, which will appear in the Materials journal next year.
The investigation of materials is a very hot topic attracting great interest from the scientific community. The development of new materials and the use of “traditional” materials in more demanding applications must be supported by efficient investigation techniques. The main concern is to increase the measurement resolution getting down to a nanometer or sub-nanometer scale. Electron microscopy and atomic force microscopy are two well established techniques for the nanoscale investigation of materials.
This Special Issue will focus on the advances in the in situ investigations of materials with atomic force microscopy (AFM) and transmission electron microscopy (TEM). The aim is to provide a forum on the state-of-the-art and frontier applications of AFM and TEM (including the development of new experimental setups) to material characterization and analysis for static and dynamic conditions. The submissions should be in the form of original research articles or authoritative review papers on the following topics (yet not limited to):
- Atomic force microscopy and atomic force spectroscopy;
- Transmission electron microscopy;
- Novel AFM/AFS/TEM setups;
- Hybrid methods and inverse methods;
- Material characterization/analysis for static and dynamic conditions (including viscous response and plasticity);
- Nanoscale measurements and nano-metrology (including the characterization of surface properties);
- In situ applications for materials science;
- In situ applications for bioengineering and biomechanics.
Prof. Luciano Lamberti
Guest Editor
Manuscript Submission Information
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Keywords
- transmission electron microscopy
- atomic force microscopy and spectroscopy
- nanoscience and nanotechnology
- static and dynamic analysis and characterization of materials
- metrology and surface characterization
- materials science
- aerospace engineering
- bioengineering and biomechanics
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