Advances in Detection of Trace Elements by Analytical Spectroscopy
A special issue of Molecules (ISSN 1420-3049). This special issue belongs to the section "Analytical Chemistry".
Deadline for manuscript submissions: closed (30 September 2023) | Viewed by 16371
Special Issue Editor
Interests: laser spectroscopy; spectroscopy with diode lasers; elemental analysis with inductively coupled plasma; reversible sorption preconcentration
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The detection of ultralow (trace) concentrations of different elements was and still is a challenging problem in analytical spectroscopy. The detection of trace elements is now a key problem in a wide spectrum of scientific and technologic applications: the production of pure materials, fundamental geochemistry, evaluation of the commercial efficiencies of new mineral resources and industrial wastes for recycling, ecological and food control, medicine, the development of new drugs etc. The continuous development of spectroscopic instrumentation, analytical methods and specific techniques of sample pretreatment has provided a noticeable increase in the sensitivities of different spectroscopic techniques and appropriate reductions to the limits of detection (LODs).
The meaning of the term “trace” has gradually changed over time according to the demands of science, industry, medical care, health protection etc. In the mid 20th century concentrations 1–10 ppm were considered as very low (trace), while by the end of the 20th century concentrations of 1–100 ppt were considered trace level! Importantly, the sensitivity of a specific spectroscopic technique is defined not only by low detectable concentrations but also low absolute detectable mass of the analytes, while the analysis of micrograms of sample appears to be very critical.
The second half of the 20th century saw the fast development of laser analytical spectroscopic techniques, such as laser-induced fluorescence, multistep resonance ionization spectroscopy, and laser-enhanced ionization. Extremely low LODs were demonstrated down to low ppt levels, which were the lowest at that time. The critical disadvantage of all laser-based techniques was their intrinsic “single element” nature. Only one element could be detected in a single measurement cycle. This disadvantage was overcome by the new analytical techniques based on inductively coupled plasma (ICP), which were explosively developed beginning in the 1980s. Both versions of ICP with atomic emission (ICP-AES) or mass-spectrometric (ICP-MS) detectors took the leading position in elemental analysis. Combining high sensitivity and multi-element capability both techniques have the drawback that they enable the analysis of mostly liquid samples. On the other hand, this feature has caused active development of different techniques and methods for solid sample pretreatment.
At present techniques for the direct analysis of solid samples are extremely popular: laser ablation (LA) with detection of the emission of the hot ablated material, the combination of LA with the analysis of the ablated material by ICP-MS, the X-ray fluorescence spectroscopy (XRF) of a bulk sample or total reflection XRF.
This Special Issue is devoted to the survey of the modern state of the art of different spectroscopic techniques for the detection of low concentrations or total quantities of analytes in different types of samples. Papers on different sample preparation techniques for the final detection of the analytes by spectroscopic techniques are also welcomed.
Prof. Dr. Michael Bolshov
Guest Editor
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Keywords
- analytical spectroscopy
- trace elements
- ICP
- ICP-AES
- ICP-MS
- LA-ICP-MS
- XRF
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