Characterization of Nanomaterials: Selected Papers from E-MRS Fall 2020
A special issue of Nanomaterials (ISSN 2079-4991).
Deadline for manuscript submissions: closed (15 December 2021) | Viewed by 18440
Special Issue Editors
Interests: functional nanomaterials; nanotechnologies; materials analysis; electronic materials; reliability
Special Issues, Collections and Topics in MDPI journals
2. Centre of Excellence in Microelectronics and Optoelectronics Processes of the Institute of New Technologies, CEMOP/UNINOVA, 2829-516 Caparica, Portugal
Interests: functional nanomaterials; paper electronics; advanced functional materials; thin film solar cells; nanotechnologies
Special Issues, Collections and Topics in MDPI journals
Interests: advanced electron microscopy; in-situ techniques; advanced functional nanomaterials
Interests: nano-scale materials; spectroscopy; neutron scattering; materials for energy storage and conversion
Special Issues, Collections and Topics in MDPI journals
Interests: advanced and in-situ electron microscopy; material reactions; thin film structures; energy materials; nanotechnology for cancer detection
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The characterization of nanomaterials is of great scientific interest and increasing industrial relevance, particularly for applications to high-tech products. This Special Issue of Nanomaterials, “Characterization of Nanomaterials”, aims to cover a broad range of subjects in the field of nanoanalysis and material characterization along the whole value and innovation chain. It focuses on the development and application of microscopy, spectroscopy and diffraction techniques. New findings relating to disruptive nanoanalysis techniques will be reported, and novel solutions in the field of material characterization for process and quality control will be presented. This Special Issue will include original research papers and comprehensive review articles covering the most recent progress and new developments in the nano-scale characterization of materials.
The papers in this Special Issue will be based on selected presentations at the web-based E-MRS European Nanoanalysis Symposium held on October 9, 2020. The symposium will bring together scientists and engineers from universities, research institutions, equipment manufacturers and industrial end-users. The discussions between the stakeholders will help to identify gaps in the fields of advancing nanoanalysis and material characterization and to propose actions to close them and to support the industrial exploitation of innovative materials.
Prof. Dr. Ehrenfried Zschech
Prof. Dr. Rodrigo Martins
Prof. Dr. Eva Olsson
Prof. Dr. Sabrina Sartori
Prof. Dr. Robert Sinclair
Guest Editors
Manuscript Submission Information
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Keywords
- material characterization
- nanoanalysis
- electron microscopy
- X-ray microscopy
- nanomechanics
- spectroscopy
- diffraction.
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