Sensing and Imaging for Defect Detection
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Sensing and Imaging".
Deadline for manuscript submissions: closed (20 September 2024) | Viewed by 20702
Special Issue Editors
Interests: NDT&E technology with ultrasonic, electromagnetic; imaging processing technology; high-imaging-resolution technology
Special Issues, Collections and Topics in MDPI journals
Interests: sensor technology; structural health monitoring technology
Special Issues, Collections and Topics in MDPI journals
Interests: sensor technology; robotics
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
With the progress made in science and technology, the quality of people's material and cultural lives has improved, meaning that the requirements for product quality and nondestructive testing technology have further increased. Nondestructive testing technology usually includes five conventional testing technologies, namely eddy current, penetration, magnetic particle, ultrasonic, and X-ray, along with their related new technologies. Usually, different materials need to be detected, and the defects that need to be detected are not the same—for example, for metals, defects include non-metallic pipe defects and slag inclusions, the metal not being welded through, porosity, etc.; for the power transmission of porcelain bottles such as ceramic materials, defects include cracks, porosity, etc.
This Special Issue calls for papers aimed at the detection of the most common defects, including surface defects, subsurface defects and so on. Recent advances in sensor technologies form the basis of the development of nondestructive testing technology, data acquirement processing, and image processing technology.
The editors welcome the submission of high-quality research papers not previously published in other journals as well as review articles discussing recent advancements in the development of sensing and imaging techniques for defect detection technology that can be easily used in the NDT&E field.
Prof. Dr. Haitao Wang
Dr. Yongkai Zhu
Dr. Fei Fei
Guest Editors
Manuscript Submission Information
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Keywords
- sensors NDT&E technology
- defect detection technology
- imaging technology
- data acquirement and processing
- sensing techniques
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Related Special Issue
- Sensing and Imaging for Defect Detection: 2nd Edition in Sensors (1 article)