Terahertz and Millimeter Wave Sensing and Applications (Volume II)
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Industrial Sensors".
Deadline for manuscript submissions: closed (30 April 2023) | Viewed by 4695
Special Issue Editors
Interests: terahertz and millimeter wave physics and applications; non-destructive testing; terahertz detectors
Special Issues, Collections and Topics in MDPI journals
Interests: millimeter wave and terahertz imaging; system development; measurement techniques
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
We are happy to launch this follow-up MDPI Special Issue on "Terahertz and Millimeter Wave Sensing and Applications (Volume II)". Thanks to the many valuable submissions to our previous Special Issue (“Terahertz and Millimeter Wave Sensing and Applications”; link here: https://www.mdpi.com/journal/sensors/special_issues/TMWSA), we could already present some recent developments in the field of terahertz- and millimeter-wave technologies. In particular, these technologies are continuously receiving attention in many fields of industrial and scientific applications. Ongoing developments of terahertz- and millimeter-wave sources, detectors, sensors, and measurement techniques have led to technological readiness for integration in modern industrial processes, for quality inspection, and for materials science and characterization. Many applications can be summarized under the general term “non-destructive testing” (NDT), where terahertz- and millimeter-wave technologies can reveal their unique potential. These contact-free, safe, and easy-to-use technologies can address many of today’s challenges in industrial production, maintenance, quality inspection, and materials research, replacing or complementing well-established NDT technologies in these areas. On the other hand, the field of terahertz- and millimeter-wave sensing addresses, e.g., gas spectroscopy, biomedical applications, monitoring of ultrafast dynamics, and many more.
In this Special Issue, we encourage authors from all fields of research and development related to terahertz- and millimeter-wave sensing and applications, with both industrial and scientific backgrounds, to submit original manuscripts with a focus on, but not limited to, practical industrial and/or scientific applications:
- New fields of terahertz applications and sensing;
- Non-destructive testing (NDT);
- Terahertz- and millimeter-wave imaging;
- Terahertz measurements and systems;
- Terahertz sources, detectors, and sensors.
Dr. Maris Bauer
Dr. Fabian Friederich
Guest Editors
Manuscript Submission Information
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Keywords
- new fields of terahertz applications and sensing
- non-destructive testing (NDT)
- terahertz- and millimeter-wave imaging
- terahertz measurements and systems
- terahertz sources, detectors, and sensors
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