Digital Twin and Fault Diagnosis
A special issue of Symmetry (ISSN 2073-8994). This special issue belongs to the section "Engineering and Materials".
Deadline for manuscript submissions: closed (30 November 2023) | Viewed by 1980
Special Issue Editors
Interests: digital twin; intelligent manufacturing; defect detection; manufacturing big data analytics
Interests: intelligent manufacturing; manufacturing big data and manufacturing information systems
Special Issues, Collections and Topics in MDPI journals
Interests: intelligent manufacturing; deep learning; machine learning; fault diagnosis; surface defect recognition
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Symmetry is one of the most important notions of digital twin and fault diagnosis. At present, modern information technology represented by the internet, big data, artificial intelligence, etc., is changing rapidly, a novel cycle of technological revolution and industrial transformation is flourishing, and intelligent industries are developing rapidly, with significant and far-reaching impacts in economic development, social progress, and global governance. Together with artificial intelligence, digital twins are the key to solving the problem of "intelligence". As a potential way to realize the interaction and integration of the physical world and the information world of intelligent manufacturing, digital twins have been gradually applied to all aspects of product life cycle, being of great significance for improving the quality of the development, manufacturing productivity, and predictive maintenance. The production process of products generates massive amounts of multi-source, heterogeneous data, which can be analyzed and processed in real-time using digital twin technology to obtain more comprehensive and valuable information, providing fault diagnosis and health management services for production equipment, whilst at the same time providing staff with technical guidance and management decision-making services. Although the application of digital twin technology is now very promising, opening up cross-domain hyper-convergence development, it still has many challenges. It is urgent to comprehend the symmetric phenomenon of digital twins and fault diagnosis, thereby developing breakthroughs and innovations in digital-twin-based technologies for system fault diagnosis, life prediction, and health management.
The purposes of this Special Issue are to present a symmetric study on digital twins and fault diagnosis, to demonstrate the benefits, and to anticipate potential challenges. We are pleased to invite submissions presenting original and high-quality research work on digital twins and fault diagnosis. We plan to consider submissions introducing novel research problems and concepts, developing novel and rigorous methodologies to tackle problems, and presenting innovative applications.
The scope of this Special Issue covers all topics related to digital twins and fault diagnosis, including, but not limited to, symmetry in the digital twin; data-driven process monitoring and fault diagnosis; digital twins in intelligent manufacturing; artificial intelligence in the digital twin; synchronization of physical and virtual entities; condition monitoring, fault diagnosis and predictive maintenance.
We look forward to receiving your contributions.
Dr. Qipeng Chen
Prof. Dr. Haisong Huang
Prof. Dr. Xinyu Li
Dr. Yiting Li
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Symmetry is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- digital twin
- fault diagnosis
- data driven
- condition monitoring
- predictive maintenance
- deep learning
- workshop scheduling
- defect detection
- intelligent manufacturing system
- natural language processing
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