Keppert, S.; Aichner, B.; Rohringer, P.; Bodea, M.-A.; Müller, B.; Karrer, M.; Kleiner, R.; Goldobin, E.; Koelle, D.; Pedarnig, J.D.;
et al. Temporal Evolution of Defects and Related Electric Properties in He-Irradiated YBa2Cu3O7−δ Thin Films. Int. J. Mol. Sci. 2024, 25, 7877.
https://doi.org/10.3390/ijms25147877
AMA Style
Keppert S, Aichner B, Rohringer P, Bodea M-A, Müller B, Karrer M, Kleiner R, Goldobin E, Koelle D, Pedarnig JD,
et al. Temporal Evolution of Defects and Related Electric Properties in He-Irradiated YBa2Cu3O7−δ Thin Films. International Journal of Molecular Sciences. 2024; 25(14):7877.
https://doi.org/10.3390/ijms25147877
Chicago/Turabian Style
Keppert, Sandra, Bernd Aichner, Philip Rohringer, Marius-Aurel Bodea, Benedikt Müller, Max Karrer, Reinhold Kleiner, Edward Goldobin, Dieter Koelle, Johannes D. Pedarnig,
and et al. 2024. "Temporal Evolution of Defects and Related Electric Properties in He-Irradiated YBa2Cu3O7−δ Thin Films" International Journal of Molecular Sciences 25, no. 14: 7877.
https://doi.org/10.3390/ijms25147877
APA Style
Keppert, S., Aichner, B., Rohringer, P., Bodea, M. -A., Müller, B., Karrer, M., Kleiner, R., Goldobin, E., Koelle, D., Pedarnig, J. D., & Lang, W.
(2024). Temporal Evolution of Defects and Related Electric Properties in He-Irradiated YBa2Cu3O7−δ Thin Films. International Journal of Molecular Sciences, 25(14), 7877.
https://doi.org/10.3390/ijms25147877