Non-Invasive Examination of Plant Surfaces by Opto-Electronic Means—Using Russet as a Prime Example
Abstract
:1. Introduction
2. Materials and Methods
2.1. Plant Material and Fruit Sourcing
2.2. Technique of Luster Measurement
2.3. Non-Invasive 3D Color Microscopy
2.4. Data Processing
3. Results and Discussion
3.1. Fine Structure, Geometry and Roughness of Russet Peel
3.2. Luster
3.3. Detection of Russet on Pome Fruits
4. Conclusions and Outlook
Acknowledgments
Author Contributions
Conflicts of Interest
References
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Traditional SEM/TEM | New Generation 3D Color Microscopy | |
---|---|---|
Sample size | small, e.g., 1 cm × 1 cm | n.a. |
Sample preparation | Large effort and timely | Not necessary |
Sample (gold) coating in high vacuum | Often necessary for better results | Not necessary |
Vacuum can lead to | Sample dehydration and tissue collapse | Specimen remains intact and unaffected |
Non-invasive examination | Invasive | Non-invasive; allows repetition of the same samples |
Examination | 2D | 3D |
Microscope dimension | Occupies most of an air-conditioned room | Large but portable |
Feature | Value |
---|---|
LED source (red) | 665 nm |
Luster values | 0 to 4000 a.u. |
Spot size | 3 or 5 mm diameter (optional) |
Distance measurement | 10–20 mm (center 15 mm) |
Power | 14.8 V (ca. 1 watt) |
Response time | <8 ms |
Weight | ca. 50 g |
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Klemm, M.; Röttger, O.; Damerow, L.; Blanke, M. Non-Invasive Examination of Plant Surfaces by Opto-Electronic Means—Using Russet as a Prime Example. Sensors 2016, 16, 452. https://doi.org/10.3390/s16040452
Klemm M, Röttger O, Damerow L, Blanke M. Non-Invasive Examination of Plant Surfaces by Opto-Electronic Means—Using Russet as a Prime Example. Sensors. 2016; 16(4):452. https://doi.org/10.3390/s16040452
Chicago/Turabian StyleKlemm, Matthias, Olga Röttger, Lutz Damerow, and Michael Blanke. 2016. "Non-Invasive Examination of Plant Surfaces by Opto-Electronic Means—Using Russet as a Prime Example" Sensors 16, no. 4: 452. https://doi.org/10.3390/s16040452
APA StyleKlemm, M., Röttger, O., Damerow, L., & Blanke, M. (2016). Non-Invasive Examination of Plant Surfaces by Opto-Electronic Means—Using Russet as a Prime Example. Sensors, 16(4), 452. https://doi.org/10.3390/s16040452