Kim, D.U.; Jeong, C.B.; Kim, J.D.; Lee, K.-S.; Hur, H.; Nam, K.-H.; Kim, G.H.; Chang, K.S.
Laser Scanning Confocal Thermoreflectance Microscope for the Backside Thermal Imaging of Microelectronic Devices. Sensors 2017, 17, 2774.
https://doi.org/10.3390/s17122774
AMA Style
Kim DU, Jeong CB, Kim JD, Lee K-S, Hur H, Nam K-H, Kim GH, Chang KS.
Laser Scanning Confocal Thermoreflectance Microscope for the Backside Thermal Imaging of Microelectronic Devices. Sensors. 2017; 17(12):2774.
https://doi.org/10.3390/s17122774
Chicago/Turabian Style
Kim, Dong Uk, Chan Bae Jeong, Jung Dae Kim, Kye-Sung Lee, Hwan Hur, Ki-Hwan Nam, Geon Hee Kim, and Ki Soo Chang.
2017. "Laser Scanning Confocal Thermoreflectance Microscope for the Backside Thermal Imaging of Microelectronic Devices" Sensors 17, no. 12: 2774.
https://doi.org/10.3390/s17122774
APA Style
Kim, D. U., Jeong, C. B., Kim, J. D., Lee, K. -S., Hur, H., Nam, K. -H., Kim, G. H., & Chang, K. S.
(2017). Laser Scanning Confocal Thermoreflectance Microscope for the Backside Thermal Imaging of Microelectronic Devices. Sensors, 17(12), 2774.
https://doi.org/10.3390/s17122774