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Journal: Sensors, 2023
Volume: 23
Number: 5326

Article: A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing
Authors: by Néstor Eduardo Sánchez-Arriaga, Divya Tiwari, Windo Hutabarat, Adrian Leyland and Ashutosh Tiwari
Link: https://www.mdpi.com/1424-8220/23/11/5326

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