Wang, J.; Chang, R.; Zhao, Z.; Pahwa, R.S.
Robust Detection, Segmentation, and Metrology of High Bandwidth Memory 3D Scans Using an Improved Semi-Supervised Deep Learning Approach. Sensors 2023, 23, 5470.
https://doi.org/10.3390/s23125470
AMA Style
Wang J, Chang R, Zhao Z, Pahwa RS.
Robust Detection, Segmentation, and Metrology of High Bandwidth Memory 3D Scans Using an Improved Semi-Supervised Deep Learning Approach. Sensors. 2023; 23(12):5470.
https://doi.org/10.3390/s23125470
Chicago/Turabian Style
Wang, Jie, Richard Chang, Ziyuan Zhao, and Ramanpreet Singh Pahwa.
2023. "Robust Detection, Segmentation, and Metrology of High Bandwidth Memory 3D Scans Using an Improved Semi-Supervised Deep Learning Approach" Sensors 23, no. 12: 5470.
https://doi.org/10.3390/s23125470
APA Style
Wang, J., Chang, R., Zhao, Z., & Pahwa, R. S.
(2023). Robust Detection, Segmentation, and Metrology of High Bandwidth Memory 3D Scans Using an Improved Semi-Supervised Deep Learning Approach. Sensors, 23(12), 5470.
https://doi.org/10.3390/s23125470