Tang, L.; Jia, X.; Ma, H.; Liu, S.; Chen, Y.; Tao, T.; Chen, L.; Wu, J.; Li, C.; Wang, X.;
et al. Microwave Absolute Distance Measurement Method with Ten-Micron-Level Accuracy and Meter-Level Range Based on Frequency Domain Interferometry. Sensors 2023, 23, 7898.
https://doi.org/10.3390/s23187898
AMA Style
Tang L, Jia X, Ma H, Liu S, Chen Y, Tao T, Chen L, Wu J, Li C, Wang X,
et al. Microwave Absolute Distance Measurement Method with Ten-Micron-Level Accuracy and Meter-Level Range Based on Frequency Domain Interferometry. Sensors. 2023; 23(18):7898.
https://doi.org/10.3390/s23187898
Chicago/Turabian Style
Tang, Longhuang, Xing Jia, Heli Ma, Shenggang Liu, Yongchao Chen, Tianjiong Tao, Long Chen, Jian Wu, Chengjun Li, Xiang Wang,
and et al. 2023. "Microwave Absolute Distance Measurement Method with Ten-Micron-Level Accuracy and Meter-Level Range Based on Frequency Domain Interferometry" Sensors 23, no. 18: 7898.
https://doi.org/10.3390/s23187898
APA Style
Tang, L., Jia, X., Ma, H., Liu, S., Chen, Y., Tao, T., Chen, L., Wu, J., Li, C., Wang, X., & Weng, J.
(2023). Microwave Absolute Distance Measurement Method with Ten-Micron-Level Accuracy and Meter-Level Range Based on Frequency Domain Interferometry. Sensors, 23(18), 7898.
https://doi.org/10.3390/s23187898