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Poghossian A, Schumacher K, Kloock JP, Rosenkranz C, Schultze JW, Müller-Veggian M, Schöning MJ. Functional Testing and Characterisation of ISFETs on Wafer Level by Means of a Micro-droplet Cell. Sensors. 2006; 6(4):397-404. https://doi.org/10.3390/s6040397

Poghossian, Arshak, Kerstin Schumacher, Joachim P. Kloock, Christian Rosenkranz, Joachim W. Schultze, Mattea Müller-Veggian, and Michael J. Schöning. 2006. "Functional Testing and Characterisation of ISFETs on Wafer Level by Means of a Micro-droplet Cell" Sensors 6, no. 4: 397-404. https://doi.org/10.3390/s6040397

Poghossian, A., Schumacher, K., Kloock, J. P., Rosenkranz, C., Schultze, J. W., Müller-Veggian, M., & Schöning, M. J. (2006). Functional Testing and Characterisation of ISFETs on Wafer Level by Means of a Micro-droplet Cell. Sensors, 6(4), 397-404. https://doi.org/10.3390/s6040397