Semiconductor Devices in Solid-State/Hybrid Circuit Breakers: Current Status and Future Trends
Abstract
:1. Introduction
- (i)
- “Fully controllable”: The conducting and breaking of CBs should be fully controllable either by automatic mechanical tripping or digital controls;
- (ii)
- “Higher switching speed”: CBs should break the fault current as soon as they could to avoid huge fault current destroying end equipment;
- (iii)
- “Low conduction loss”: CBs should maintain the same scale of conduction loss as previous MCBs, therefore the efficiency for normal operation must be appropriate;
- (iv)
- “Smaller arcing”: For both DC and AC applications, electric arcing should be avoided or suppressed to retain long lifetime of the CB itself, and at the same time, ensure definitized tripping of the CB system.
2. Review of Solid-State/Hybrid Circuit Breakers
2.1. Fast-Breaking Mechanical Devices
2.2. Basic Solid-State/Hybrid Circuit Breakers
2.3. CL-CBs with Switched Resistive Components
2.3.1. CL-CBs with Ordinary Resistors
2.3.2. CL-CBs with Positive Temperature Coefficient Thermistors
2.3.3. CL-CBs with Superconductors
2.4. CL-CBs with Other Switched Components
2.4.1. CL-CBs with Inductive Components
2.4.2. CL-CBs with Inductor-Capacitor (L-C) Components
2.5. Controllable Semicondcutor Devices for Current-Limiting
2.5.1. CL-CB with Semiconductor Power Switches
2.5.2. Active Bridge Configurations of CL-CBs
2.6. Summary
- (a)
- Mechanical switches, as one half of the HCB configuration, need more investigation about lifting the tripping speed;
- (b)
- HCBs with auxiliary semiconductor switches will be widely used for HVDC systems because of their natural superiority: no-arcing, acceptable switching speed, and low transmission power loss;
- (c)
- Superconductor-based circuit breakers are quite expensive and have huge size/weight, so they may be only used in HVDC systems because of their insensitivity of floor space. Further investigation could be on implementation and higher-temperature superconductors;
- (d)
- As current-limiting is becoming more intelligent, semiconductor devices will be widely applied, but their reliability must be taken into account;
- (e)
- Resistive CL-CB has really high power dissipation, it might be only used for short-term limiting;
- (f)
- Inductive CL-CB and L-C based CL-CB are sensitive to frequency changes, so the robustness is not perfect. The dynamic response must be analyzed before any conduction;
- (g)
- Bridge-connected CL-CB has the best flexibility and controllability, but may suffer from higher power loss and the need for other additional components. Active CL-CB with SSSC may be a good solution for DC/AC systems for its controllable reactive power generation capability and its multi-function of short-circuit protection;
- (h)
- Wide-band-gap (WBG) devices e.g., SiC MOSFET are recommended for fast breaking as well as current limiting, but the overall cost should be taken into consideration.
3. Novel Circuit Breaker Concepts with Different Power Devices
3.1. Basic HCB/SSCB Configuration in Low-Voltage AC/DC Grids
3.1.1. Fast Breaking of SSCB or HCB with WBG Devices
- (a)
- FMS carries the main current with low conduction loss;
- (b)
- SMS is to cut off fault current with a higher speed;
- (c)
- MOV absorbs the remaining energy of line inductance to avoid over voltage across SMS;
- (d)
- A mechanical disconnector is needed to ensure electrical insulation while all turned off.
3.1.2. Current Limitation Method with PWM Strategy
3.1.3. Current Limitation by Gate Voltage Control
3.1.4. A Novel Current-Limiting Method for Basic HCB in Low-Voltage AC Grids
3.1.5. Limitation of Basic SSCB/HCB Configurations
- (a)
- The switching speed of a basic HCB depends on the tripping performance of FMS, which limits the switching speed of HCBs to several milliseconds;
- (b)
- The power loss of basic SSCBs is high and not acceptable in many cases, therefore they are not suitable in many applications;
- (c)
- Current limiting by PWM introduces high power losses on MOV components and current limiting by gate voltage control introduces high power loss on semiconductor power devices, therefore the application area is limited;
- (d)
- Current limiting by phase shifting could only be used in AC systems and with large current harmonics;
- (e)
- Although SiC devices may confer an advantage to basic SSCB/HCB configurations with fast breaking (higher switching speed), PWM current limiting (higher switching speed and junction temperature), linear gate voltage control current limiting (higher junction temperature), the cost of SiC MOSFETs is still much higher than that of Si IGBTs, which bounds the spread of SiC MOSFETs in circuit breaker applications.
3.2. Novel CB Configurations with Different Semiconductor Devices
3.2.1. Configuration 1: HCB with Capacitor
3.2.2. Configuration 2: HCB with STS and Capacitor
3.2.3. Configuration 3: Pure SSCB with Thyristor and STS (A Better Solution)
3.2.4. Comparisons of These Configurations
3.3. Summary of Semiconductor Devices in CB Applications
4. Future Trends and Challenges for Semiconductor Devices in CB
4.1. HCB for HVDC or MVDC: Very High Power
4.2. SSCB for Medium Power: Very High Speed
4.3. SSCB for Low Voltage: Ultra High Speed Switching or Multi-Functional
- (a)
- Ultra-high-speed switching with SiC devices or GaN devices;
- (b)
- Current-limitation capability with WBG devices with higher junction temperature;
- (c)
- Integration of multi-functional operation for intelligent solid-state circuit breakers.
5. Conclusions
Author Contributions
Conflicts of Interest
Abbreviations
ABB | ASEA Brown Boveri Limited Company |
AC | Alternating current |
BJT | Bipolar Junction Transistor |
CB | Circuit breaker |
CL | Current-limiting |
CL-CB | Current-limiting circuit breaker |
DC | Direct current |
EPRI | Electric Power Research Institute |
FCLID | Fault-current limiting and interrupting device |
FDS | Fast-opening disconnecting switch |
FMS | Fast mechanical switch |
FTS | Fast-opening transfer switch |
GaN | Gallium nitride |
GTO | Gate turn-off thyristor |
HCB | Hybrid circuit breaker |
HCLID | Hybrid current-limiting interrupting device |
HEMT | High-electron-mobility transistor |
HSS | High speed switch |
HVDC | High-voltage direct-current |
IGBT | Insulated-gate bipolar transistor |
IGCT | Integrated gate-commutated thyristor |
JFET | Junction gate field-effect transistor |
L-C | Inductor-capacitor |
LCS | Line commutation switch |
LS | Load switch |
LV | Low voltage |
MCB | Mechanical circuit breaker |
MCCB | molded-case circuit breaker |
MCT | MOS-controlled thyristor |
MD | Mechanical disconnector |
MOS | Metal oxide semiconductor |
MOSFET | Metal-oxide-semiconductor field-effect transistor |
MOV | Metal oxide varistor |
MV | Medium voltage |
MVDC | Medium-voltage direct-current |
PTC | Positive temperature coefficient |
p.u. | Per-unit |
PWM | Pulse-width modulation |
RC | Resistor-capacitor |
RCD | Resistor-capacitor-diode |
RMS | Root mean square |
SAS | Semiconductor accessary switch |
SFCL | Superconductor fault current limiter |
Si | Silicon |
SiC | Silicon carbide |
SMS | Semiconductor main switch |
SPICE | Simulation Program with Integrated Circuit Emphasis |
SSCB | Solid-state circuit breaker |
SSFCL | Solid state fault current limiting |
SSSC | Static synchronous series compensator |
STATCOM | Static synchronous compensator |
STS | Semiconductor transfer switch |
THD | Total harmonic distortion |
WBG | Wide-band-gap |
ZCS | Zero current switching |
ZnO | Zinc oxide |
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Categories | Main Components | Advantages | Disadvantages | ||
---|---|---|---|---|---|
Fast breaking manner | One-time devices | Fuses [1,50] | Lowest size & cost | Poor maintenance, unclear melting time | |
Reusable components | FMS [2,9,10,11,13,14,15,16,51,52] | Small size, low power loss | Electric arc with contact erosion, low speed | ||
HCB/SSCB [12] | Fast, small arcing | Complex structure, relatively high cost | |||
Current limiting manner | Switched passive components | Resistive elements | Switched resistor [17,18,19,20] | Low cost, constant resistive current | High power dissipation |
Switched PTC resistors [2,21] | Auto-limiting | High power dissipation | |||
Switched superconductor devices [8,22,23,24,25,26] | Auto-limiting with resistive current | High cost, huge size | |||
With others | Switched inductor [26,29,30] | No extra heat, un-changeable current | Sensitive to changing of frequency | ||
Switched L-C [17,31,32,33,34,35] | No extra heat, relatively low impedance for L-C | Sensitive to changing of frequency | |||
Controlled passive & power devices | Semiconductor switches & energy absorbers | PWM control [36,38] | Simple structure, resistive current | High power dissipation of MOV | |
Gate voltage control [37] | Simple structure, resistive current | High power dissipation of semiconductors | |||
Other bridge concepts | Controlled bridge with inductor [40,41,42] | Controllable current, no additional heat | high current harmonics with thyristor | ||
SSSC [47] | No additional heat, controllable current, low THD | Complex structure, capacitor charging issues |
Type | Configuration 1 (HCB) | Configuration 2 (HCB) | Configuration 3 (SSCB) | |
---|---|---|---|---|
Power loss | Lowest | Low | Low with thyristor | |
Total clear time | About 5.5 ms | About 6.5 ms | Less than 0.4 ms | |
Peak current | About 15.7 kA | About 15.8 kA | About 1470 A | |
Component features | FMS | Carry Icu for milliseconds and break | Carry Icu for milliseconds, no need to break | N/A |
SMS | N/A | N/A | Carry 10 × In, no need to break | |
SAS | Carry Icu for milliseconds | Carry Icu for milliseconds | Carry 10 × In for microseconds and break | |
STS | N/A | Carry Icu for milliseconds and break | Carry 10 × In and break | |
Capacitor | Large film capacitor | Large film capacitor | N/A | |
Advantages | Lowest on-state loss | Low on-state loss No arc for FMS | Ultra-fast switching Acceptable on-state loss | |
Disadvantages | Large film capacitor Large MOV arrestor | Larger film capacitor Higher turn-off time | Complex structure |
Semiconductor Type | Thyristor | GTO | MCT | IGBT | Si MOSFET | SiC MOSFET/BJT/JFET | |
---|---|---|---|---|---|---|---|
Example part number | VS-ST1200C12K0P | DGT304RE | SMCTTA65N14A10 | NGTB40N120SWG | AUIRFSA8409-7P | C2M0040120D | |
Rated voltage | 1200 V | 1300 V | 1400 V | 1200 V | 40 V | 1200 V | |
Rated current | 1100 A | 390 A | 65 A | 40 A | 370 A | 40 A | |
Pulsed current | 25.7 kA | 4 kA | 6 kA | 200 A | 1440 A | 160 A | |
Reverse blocking | Yes | Yes | No | No | No | No | |
Loss parameters | 1.3 V | 2.0 V | 1.2 V | 2.4 V | 0.5 mΩ | 40 mΩ | |
Basic SSCB | SMS | × | √ | × | √ | × | √ |
Configuration 1 | SAS | √ | √ | × | × | × | × |
Configuration 2 | STS | × | × | × | × | √ | × |
SAS | √ | √ | × | × | × | × | |
Configuration 3 | SMS | √ | √ | √ | × | × | × |
STS | × | × | × | × | √ | × | |
SAS | × | √ | × | √ | × | × |
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Gu, C.; Wheeler, P.; Castellazzi, A.; Watson, A.J.; Effah, F. Semiconductor Devices in Solid-State/Hybrid Circuit Breakers: Current Status and Future Trends. Energies 2017, 10, 495. https://doi.org/10.3390/en10040495
Gu C, Wheeler P, Castellazzi A, Watson AJ, Effah F. Semiconductor Devices in Solid-State/Hybrid Circuit Breakers: Current Status and Future Trends. Energies. 2017; 10(4):495. https://doi.org/10.3390/en10040495
Chicago/Turabian StyleGu, Chunyang, Pat Wheeler, Alberto Castellazzi, Alan J. Watson, and Francis Effah. 2017. "Semiconductor Devices in Solid-State/Hybrid Circuit Breakers: Current Status and Future Trends" Energies 10, no. 4: 495. https://doi.org/10.3390/en10040495
APA StyleGu, C., Wheeler, P., Castellazzi, A., Watson, A. J., & Effah, F. (2017). Semiconductor Devices in Solid-State/Hybrid Circuit Breakers: Current Status and Future Trends. Energies, 10(4), 495. https://doi.org/10.3390/en10040495