Garcia-Perez, M.A.; Rodriguez-Galiano, V.; Sanchez-Rodriguez, E.; Egea-Cobrero, V.
Yield Estimation of Wheat Using Cropland Masks from European Common Agrarian Policy: Comparing the Performance of EVI2, NDVI, and MTCI in Spanish NUTS-2 Regions. Remote Sens. 2023, 15, 5423.
https://doi.org/10.3390/rs15225423
AMA Style
Garcia-Perez MA, Rodriguez-Galiano V, Sanchez-Rodriguez E, Egea-Cobrero V.
Yield Estimation of Wheat Using Cropland Masks from European Common Agrarian Policy: Comparing the Performance of EVI2, NDVI, and MTCI in Spanish NUTS-2 Regions. Remote Sensing. 2023; 15(22):5423.
https://doi.org/10.3390/rs15225423
Chicago/Turabian Style
Garcia-Perez, M. A., V. Rodriguez-Galiano, E. Sanchez-Rodriguez, and V. Egea-Cobrero.
2023. "Yield Estimation of Wheat Using Cropland Masks from European Common Agrarian Policy: Comparing the Performance of EVI2, NDVI, and MTCI in Spanish NUTS-2 Regions" Remote Sensing 15, no. 22: 5423.
https://doi.org/10.3390/rs15225423
APA Style
Garcia-Perez, M. A., Rodriguez-Galiano, V., Sanchez-Rodriguez, E., & Egea-Cobrero, V.
(2023). Yield Estimation of Wheat Using Cropland Masks from European Common Agrarian Policy: Comparing the Performance of EVI2, NDVI, and MTCI in Spanish NUTS-2 Regions. Remote Sensing, 15(22), 5423.
https://doi.org/10.3390/rs15225423