Order Article Reprints

Niu D, Wang Q, Li W, Chen C, Xu J, Jiang L, Feng C, Xiao H, Wang Q, Xu X, et al. The Influence of the Different Repair Methods on the Electrical Properties of the Normally off p-GaN HEMT. Micromachines. 2021; 12(2):131. https://doi.org/10.3390/mi12020131

Niu, Di, Quan Wang, Wei Li, Changxi Chen, Jiankai Xu, Lijuan Jiang, Chun Feng, Hongling Xiao, Qian Wang, Xiangang Xu, and et al. 2021. "The Influence of the Different Repair Methods on the Electrical Properties of the Normally off p-GaN HEMT" Micromachines 12, no. 2: 131. https://doi.org/10.3390/mi12020131

Niu, D., Wang, Q., Li, W., Chen, C., Xu, J., Jiang, L., Feng, C., Xiao, H., Wang, Q., Xu, X., & Wang, X. (2021). The Influence of the Different Repair Methods on the Electrical Properties of the Normally off p-GaN HEMT. Micromachines, 12(2), 131. https://doi.org/10.3390/mi12020131