Huang, X.; Cao, W.; Huang, C.; Chen, C.; Shi, Z.; Xu, W.
Electrical Stability Modeling Based on Surface Potential for a-InGaZnO TFTs under Positive-Bias Stress and Light Illumination. Micromachines 2023, 14, 842.
https://doi.org/10.3390/mi14040842
AMA Style
Huang X, Cao W, Huang C, Chen C, Shi Z, Xu W.
Electrical Stability Modeling Based on Surface Potential for a-InGaZnO TFTs under Positive-Bias Stress and Light Illumination. Micromachines. 2023; 14(4):842.
https://doi.org/10.3390/mi14040842
Chicago/Turabian Style
Huang, Xiaoming, Wei Cao, Chenyang Huang, Chen Chen, Zheng Shi, and Weizong Xu.
2023. "Electrical Stability Modeling Based on Surface Potential for a-InGaZnO TFTs under Positive-Bias Stress and Light Illumination" Micromachines 14, no. 4: 842.
https://doi.org/10.3390/mi14040842
APA Style
Huang, X., Cao, W., Huang, C., Chen, C., Shi, Z., & Xu, W.
(2023). Electrical Stability Modeling Based on Surface Potential for a-InGaZnO TFTs under Positive-Bias Stress and Light Illumination. Micromachines, 14(4), 842.
https://doi.org/10.3390/mi14040842