Gao, T.; Yin, C.; Chen, Y.; Chen, R.; Yan, C.; Liu, H.
Simulation of Total Ionizing Dose Effects Technique for CMOS Inverter Circuit. Micromachines 2023, 14, 1438.
https://doi.org/10.3390/mi14071438
AMA Style
Gao T, Yin C, Chen Y, Chen R, Yan C, Liu H.
Simulation of Total Ionizing Dose Effects Technique for CMOS Inverter Circuit. Micromachines. 2023; 14(7):1438.
https://doi.org/10.3390/mi14071438
Chicago/Turabian Style
Gao, Tianzhi, Chenyu Yin, Yaolin Chen, Ruibo Chen, Cong Yan, and Hongxia Liu.
2023. "Simulation of Total Ionizing Dose Effects Technique for CMOS Inverter Circuit" Micromachines 14, no. 7: 1438.
https://doi.org/10.3390/mi14071438
APA Style
Gao, T., Yin, C., Chen, Y., Chen, R., Yan, C., & Liu, H.
(2023). Simulation of Total Ionizing Dose Effects Technique for CMOS Inverter Circuit. Micromachines, 14(7), 1438.
https://doi.org/10.3390/mi14071438