Order Article Reprints

Chen L, Lu Z, Fu C, Bi Z, Que M, Sun J, Sun Y. A Comparative Study on the Degradation Behaviors of Ferroelectric Gate GaN HEMT with PZT and PZT/Al₂O₃ Gate Stacks. Micromachines. 2024; 15(1):101. https://doi.org/10.3390/mi15010101

Chen, Lixiang, Zhiqi Lu, Chaowei Fu, Ziqiang Bi, Miaoling Que, Jiawei Sun, and Yunfei Sun. 2024. "A Comparative Study on the Degradation Behaviors of Ferroelectric Gate GaN HEMT with PZT and PZT/Al₂O₃ Gate Stacks" Micromachines 15, no. 1: 101. https://doi.org/10.3390/mi15010101

Chen, L., Lu, Z., Fu, C., Bi, Z., Que, M., Sun, J., & Sun, Y. (2024). A Comparative Study on the Degradation Behaviors of Ferroelectric Gate GaN HEMT with PZT and PZT/Al₂O₃ Gate Stacks. Micromachines, 15(1), 101. https://doi.org/10.3390/mi15010101