Li, H.; Su, J.; Wang, R.; Liu, Z.; Xu, M.
Review of RF Device Behavior Model: Measurement Techniques, Applications, and Challenges. Micromachines 2024, 15, 46.
https://doi.org/10.3390/mi15010046
AMA Style
Li H, Su J, Wang R, Liu Z, Xu M.
Review of RF Device Behavior Model: Measurement Techniques, Applications, and Challenges. Micromachines. 2024; 15(1):46.
https://doi.org/10.3390/mi15010046
Chicago/Turabian Style
Li, Haode, Jiangtao Su, Ruijin Wang, Zhenyu Liu, and Mengmeng Xu.
2024. "Review of RF Device Behavior Model: Measurement Techniques, Applications, and Challenges" Micromachines 15, no. 1: 46.
https://doi.org/10.3390/mi15010046
APA Style
Li, H., Su, J., Wang, R., Liu, Z., & Xu, M.
(2024). Review of RF Device Behavior Model: Measurement Techniques, Applications, and Challenges. Micromachines, 15(1), 46.
https://doi.org/10.3390/mi15010046