Wang, X.; Mao, S.; Zhang, J.; Li, Z.; Deng, Q.; Ning, J.; Yang, X.; Wang, L.; Ji, Y.; Li, X.;
et al. MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope. Micromachines 2017, 8, 31.
https://doi.org/10.3390/mi8020031
AMA Style
Wang X, Mao S, Zhang J, Li Z, Deng Q, Ning J, Yang X, Wang L, Ji Y, Li X,
et al. MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope. Micromachines. 2017; 8(2):31.
https://doi.org/10.3390/mi8020031
Chicago/Turabian Style
Wang, Xiaodong, Shengcheng Mao, Jianfei Zhang, Zhipeng Li, Qingsong Deng, Jin Ning, Xudong Yang, Li Wang, Yuan Ji, Xiaochen Li,
and et al. 2017. "MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope" Micromachines 8, no. 2: 31.
https://doi.org/10.3390/mi8020031
APA Style
Wang, X., Mao, S., Zhang, J., Li, Z., Deng, Q., Ning, J., Yang, X., Wang, L., Ji, Y., Li, X., Liu, Y., Zhang, Z., & Han, X.
(2017). MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope. Micromachines, 8(2), 31.
https://doi.org/10.3390/mi8020031