Technology for Obtaining Sintered Components with Tailored Electromagnetic Features by Selective Recycling of Printed Circuit Boards
Abstract
:1. Introduction
2. Materials and Methods
2.1. Manufacturing and Characterization Equipment
- Sintering was performed by use of the Spark plasma sintering furnace HHP D (FCT Systeme Gmbh, Rauenstein, Germany).
- A simultaneous thermal analyzer—Thermogravimetry (TG)/Differential Scanning Calorimetry (DSC) type STA 449 F3 Jupiter, (NETZSCH, Selb, Germany)—allowed the determination of mass variations and thermal changes for different types of materials, including inhomogeneous materials.
- Hydrostatic density was determined utilizing XS204 Analytical Balance, characterized by the following specifications: maximum capacity of 220 g, precision of 0.1 mg, linearity of 0.2 mg, internal calibration, equipped with a density kit for solids and liquids, and an RS 232 interface. The measurements were conducted at a temperature of 25 °C.
- Chemical analysis was performed by use of the XRF spectrometer model WD-XRF S8 TIGER-1 kW (Bruker AXS GmbH, Berlin, Germany).
- Structural characterization was carried out by X-ray diffraction (XRD) using CuKα radiation (λ = 0.154 nm) with Ni filter Bruker AXS D8 Advance (Bruker AXS, Billerica, MA, USA). Diffraction patterns were recorded at room temperature in Bragg–Brentano geometry at an angle 2θ from 20° to 65° at a rate of 0.6°/min (2θ)/min.
- Scanning electron microscopy (SEM) was performed with a field emission and focused ion beam scanning electron microscope (SEM) model Tescan Lyra III XMU (Brno-Kohoutovice, Czech Republic).
- Shore hardness tests were performed with a common Microdurometer Vickers FM700 (Future-Tech Corp, Tokyo, Japan).
- Dielectric analysis was performed via broadband dialectic spectroscopy, by use of a Turn Key Dielectric Spectrometer BDS 40BDS (frequency band 3 μHz–3 GHz), with variable temperature control (Novocontrol Gmbh, Montabaur, Germany).
2.2. Powder Manufacturing Process
3. Results and Discussion
3.1. Thermal Analysis for Powders
3.2. Evaluation of Hydrostatic Density of Powders before Sintering Process
3.3. Chemical Analysis of Powders via Spectrometry with X-ray Fluorescence—XRF
3.4. X-ray Diffraction (XRD) Analysis of Disks
3.5. Evaluation of Vickers Hardness of Disks
3.6. SEM Images and Evaluation of the Chemical Composition of Disks Carried Out by the Use of the EDS Probe
- −
- The elements Al, Si, Ca, Cu, Mg, Fe, Cr, Ni, Sn and Pb were identified in all disk samples in all areas, e.g., Al (with a maximum percentage of 44.59% in the case of area 2 of P2, a value close to the maximum also being identified in the case of area 5 of P1, namely 44.52%); Si (with a maximum percentage of 47.42% in the case of area 2 of P3); Cr (with a maximum percentage of 18.9% in the case of area 3 of P1); Fe (with a maximum percentage of 68.09% in the case of area 5 of P1, and 62.37% in the case of area 7 of P1); Ni (with a maximum percentage of 19.96% in the case of area 2 of P1); and Cu (with a percentage of 9.98% in the case of area 1 of P3).
- −
- There are elements that appear only in limited areas: Ti, with a maximum percentage of 5.86% in the case of area 2 of P2; Zn, with a maximum percentage of 8.43% in the case of area 1 of P3; K, which appears only in the case of, e.g., area 1 of P2 with a percentage of 0.48%; Mn, which appears only in the case of, e.g., area 3 of P1 in a percentage of 0.85%; Al, which appears only in the case of, e.g., area 2 of P3 with a percentage of 0.63%; and Br, with a maximum percentage of 5.57% in the case of area 1 of P1.
- −
- The presence of precious metals is also found, such as the following: Ag, in all areas, with a minimum percentage of 0.59%, e.g., in P1—area 1, and a maximum percentage of 1.63% in P3—area 2; Pt, only in limited areas, with a maximum percentage of 0.89%, e.g., in the case of P1—area 2; and Au, in many areas, with a maximum percentage of 0.96%, e.g., in the case of P3—area 5.
3.7. Dielectric Tests
4. Conclusions
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
References
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Sample | ρ [g/cm3] |
---|---|
P1 | 0.6630 |
P2 | 0.6338 |
P3 | 0.6242 |
Element | Concentration (%) |
---|---|
Fe | 17.96 |
Si | 17.62 |
Br | 17.21 |
Cu | 13.46 |
Ca | 8.91 |
Pb | 8.28 |
Sn | 7.37 |
Ba | 3.20 |
Ni | 1.76 |
Zr | 1.55 |
Zn | 1.51 |
Cr | 1.17 |
Element | Concentration (%) |
---|---|
Ca | 25.16 |
Fe | 15.72 |
Cu | 13.91 |
Si | 12.69 |
Sn | 7.93 |
Pb | 7.68 |
Ba | 3.39 |
Br | 3.10 |
Cr | 2.68 |
Zn | 2.61 |
Mn | 1.88 |
Ni | 1.57 |
Zr | 0.69 |
Sr | 0.61 |
Ag | 0.38 |
Element | Concentration (%) |
---|---|
Ca | 27.19 |
Cu | 14.55 |
Si | 13.43 |
Sn | 9.93 |
Fe | 9.30 |
Pb | 8.84 |
Ba | 3.80 |
Br | 3.42 |
Cr | 3.07 |
Zn | 2.31 |
Ni | 1.59 |
Zr | 0.88 |
Sr | 0.70 |
Ag | 0.49 |
K | 0.36 |
Mn | 0.14 |
Sample | Crystallinity Degree [%] |
---|---|
P1 | 59 |
P2 | 35.4 |
P3 | 16.8 |
Sample | HV 0.1/10 [kgf/mm2] |
---|---|
P1 | 15.91 |
P2 | 13.64 |
P3 | 11.28 |
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Ciobanu, R.C.; Aradoaei, M.; Schreiner, C. Technology for Obtaining Sintered Components with Tailored Electromagnetic Features by Selective Recycling of Printed Circuit Boards. Crystals 2024, 14, 820. https://doi.org/10.3390/cryst14090820
Ciobanu RC, Aradoaei M, Schreiner C. Technology for Obtaining Sintered Components with Tailored Electromagnetic Features by Selective Recycling of Printed Circuit Boards. Crystals. 2024; 14(9):820. https://doi.org/10.3390/cryst14090820
Chicago/Turabian StyleCiobanu, Romeo Cristian, Mihaela Aradoaei, and Cristina Schreiner. 2024. "Technology for Obtaining Sintered Components with Tailored Electromagnetic Features by Selective Recycling of Printed Circuit Boards" Crystals 14, no. 9: 820. https://doi.org/10.3390/cryst14090820
APA StyleCiobanu, R. C., Aradoaei, M., & Schreiner, C. (2024). Technology for Obtaining Sintered Components with Tailored Electromagnetic Features by Selective Recycling of Printed Circuit Boards. Crystals, 14(9), 820. https://doi.org/10.3390/cryst14090820