He, J.; Zhu, Z.; Fan, X.; Chen, Y.; Liu, S.; Chen, D.
Few-Shot Learning for Fault Diagnosis: Semi-Supervised Prototypical Network with Pseudo-Labels. Symmetry 2022, 14, 1489.
https://doi.org/10.3390/sym14071489
AMA Style
He J, Zhu Z, Fan X, Chen Y, Liu S, Chen D.
Few-Shot Learning for Fault Diagnosis: Semi-Supervised Prototypical Network with Pseudo-Labels. Symmetry. 2022; 14(7):1489.
https://doi.org/10.3390/sym14071489
Chicago/Turabian Style
He, Jun, Zheshuai Zhu, Xinyu Fan, Yong Chen, Shiya Liu, and Danfeng Chen.
2022. "Few-Shot Learning for Fault Diagnosis: Semi-Supervised Prototypical Network with Pseudo-Labels" Symmetry 14, no. 7: 1489.
https://doi.org/10.3390/sym14071489
APA Style
He, J., Zhu, Z., Fan, X., Chen, Y., Liu, S., & Chen, D.
(2022). Few-Shot Learning for Fault Diagnosis: Semi-Supervised Prototypical Network with Pseudo-Labels. Symmetry, 14(7), 1489.
https://doi.org/10.3390/sym14071489