1. Introduction
With the development of manufacturing design technology, modern products have the characteristics of high reliability and a long lifespan. Under these usage conditions, life testing becomes increasingly difficult within a reasonable period due to the time and cost limitations. To conduct life testing in an effective way, the accelerated life test (ALT) has been introduced in practice, which provides a low-cost and quick method to obtain the failure information. In the ALT, in order to obtain the failure data, products are tested either under a harsher environment or under more intensive usage than the usual use conditions, and the common stress factors include the temperature, pressure, and voltage, among others. Data collected in such accelerated conditions are then extrapolated through a physically appropriate statistical model to estimate the lifetime distribution under normal use conditions. Generally, there are mainly three types of acceleration tests, namely the constant-stress ALT, the step-stress ALT, and the progressive-stress ALT. All these types of ALTs have been studied by a number of authors [
1,
2,
3,
4,
5]; for more details about the ALT, one can refer to the monograph by Nelson [
6].
Under accelerating life testing, when the acceleration factor has an unknown value, the partially accelerated life test (PALT) is usually conducted as a reasonable alternative to the life test, where the units are investigated under both accelerated and regular use conditions. There are mainly two types of PALTs, the constant-stress PALT and the step-stress PALT. In the constant-stress PALT, the units are divided into two groups; one group is assigned to run under the regular use conditions, while the other group is tested under accelerated conditions. For the step-stress PALT, the units are initially run under the regularuse conditions for a pre-specified period of time, and if a test unit does not fail for the specified time, it is then run under accelerated conditions until failure occurs or the observation is censored. PALTs have been discussed by several authors. For instance, Abdel-Hamid [
7] considered the parameter estimation of the Burr Type-XII distribution in a constant-stress PALT for progressively Type-II-censored data. Abdel-Hamid and Al-Hussaini [
8] studied the estimation problem in the step-stress PALT when the lifetime of the tested units under the regular use conditions followed a finite mixture of a general class of distributions. Abdel-Ghaly et al. [
9] investigated the maximum likelihood estimation (MLE) method to estimate the parameters of the Weibull distribution in the step-stress PALT. A similar problem was also studied by Ismail [
10] under the progressive hybrid Type-II censoring scheme. Cheng and Wang [
11] discussed the MLE of the Burr XII distribution under the constant-stress PALT when multiple censored data were observed.
In practice, the lifetime distributions with bathtub-shaped hazard functions have attracted the interest of many authors and provide appropriate conceptual models for some electronic and mechanical products, as well as the lifetimes of humans. Chen [
12] proposed a two-parameter distribution with a bathtub-shaped or increasing failure rate function. The survival function (SF), cumulative distribution function (CDF), probability density function (PDF), and hazard rate function (HRF) of the Chen distribution are given by
where
is the scale parameter and
is the shape parameter, respectively. In practice, the applicability of a model may partially be attributed to the fact that its reliability, hazard rate, and probability density functions all have nice expressions. Due to its flexible structural properties and practical significance, the Chen distribution has found wide applications in life test studies. It has been observed that the Chen distribution has a bathtub-shaped hazard function when
, and when
, it features an increasing hazard rate function. The case
corresponds to the exponential power distribution. Several authors have discussed the Chen distribution in different cases. For example, based on Type-II-censored samples, Chen [
12] constructed exact confidence intervals for the shape parameter and also obtained exact confidence regions for both model parameters. Rastogi and Tripathi [
13] discussed the parameter estimation problem of the Chen distribution for hybrid censored data. Wu [
14] investigated the MLE method to estimate the parameters of the Chen distribution under progressive Type-II censoring and also derived exact confidence intervals and confidence regions for the related parameters. Ahmed [
15] presented the Bayesian approach to estimate the parameters of the Chen distribution for progressively Type-II-censored data. Elshahhat and Rastogi [
16] considered the Bayesian life analysis of a generalized Chen’s population under progressive censoring.
In life testing, reliability analysis, and other related fields, censoring is a very common phenomenon, and the experiments are often terminated before all units fail due to the cost and time considerations. In such cases, the exact failure times are known for only a portion of the units under study. The most-common censoring schemes are Type-I and Type-II censoring, which, however, can only remove units at the termination point, lacking flexibility in practical life tests. Therefore, progressive censoring is further proposed to conduct the tests, which allows units to be removed at different testing stages. The strategy of progressive censoring is vital to planning duration experiments in the field of reliability and lifetime analysis and includes progressive Type-I and Type-II censoring as its special population cases. For details about the censoring scheme, the reader can refer to the recent review paper of Balakrishnan [
17] and the monograph of Balakrishnan and Aggarwala [
18], as well as the references therein. In this paper, we considered the constant-stress PALT applied to units whose lifetime under the use conditions was assumed to be the Chen distribution under a progressive Type-II censoring scheme. It is worth mentioning that, although there are many discussions that have focused on the inference of the Chen distribution such as the previously mentioned ones and others (e.g., Zhang and Gui [
19], Soliman et al. [
20]), the inference for the partially constant-stress accelerated life test of the Chen distribution has not been discussed in the literature. In addition, except for the traditional likelihood-based inferential approach, another aim of this paper was that the expectation–maximization estimation for the Chen model be proposed under the constant-stress PALT.
The rest of this article is organized as follows.
Section 2 provides a brief description of the constant-stress PALT and some basic assumptions.
Section 3 deals with the estimation problem of the MLEs of the parameters. The corresponding confidence intervals are proposed in
Section 4, and this section also discusses two parametric bootstrap confidence intervals. An illustration example and Monte Carlo simulation studies are presented in
Section 5 to investigate the performance the proposed results. Finally, some concluding remarks are addressed in
Section 6.
3. Maximum Likelihood Estimation
Based on (
1)–(
3), the log-likelihood function of
, say
ℓ, can be expressed as
where the notation ∝ means “be proportional to” without additive constant terms.
Taking the derivatives of
ℓ with respect to
and equating them to zero, one can derive the MLEs of the parameters
, and
from the following likelihood equations:
where
Based on the likelihood equations
and
in (
5), one has
which implies that
Therefore, using numerical iterative programs such as the Newton–Raphson algorithm to solve the nonlinear Equation (
7), the MLE of
can be calculated. Further, by substituting the MLE of
into (
6), the MLEs of
and
can be obtained. Alternatively, one can also use the expectation–maximization (EM) algorithm to deduce the MLEs of the unknown parameters. The EM algorithm is extensively used to the iterative computation of maximum likelihood estimates and is very useful in a variety of fields such as survival analysis, reliability theory, and other fields. The EM iteration alternates between performing an expectation step or E-step and a maximization step or M-step. The E-step creates a function of the expectation of the log-likelihood of the current estimation evaluation using the parameters, and the M-step calculates the parameters that maximize the expected log-likelihood found in the E-step. For more details, one can refer to the work of Dempster et al. [
21], where the authors first introduced the EM algorithm to handle some missing or incomplete data situations, and the monograph by McLachlan and Krishnan [
22], as well as the references therein.
In the constant-stress PALT, the progressively Type-II-censored samples can be viewed as an incomplete dataset in each life test stage. Therefore, the EM algorithm will provide a good alternative to the conventional iterative method in the process of numerically computing the MLEs.
For
, let
with
, represent the censored data under the normal use and accelerated conditions, respectively. We treated the censored observations as missing data. Thus, the combination of
forms the complete constant-stress PALT failure dataset, for which the likelihood function can be expressed as
The log-likelihood function of
, say
, can be expressed as
The MLEs of the parameters
, and
for the complete failure sample
can be derived by taking the derivatives for the log-likelihood function
with respect to
, and
and setting them to zero, which can be expressed as follows:
Furthermore, one has
where
and
represents
equivalent to
By substituting (
10) to
in (
9), one has
Therefore, it can be observed that the pseudo likelihood equations can be rewritten as a nonlinear function of .
Given
, for
, the conditional distribution of
follows a truncated Chen distribution with scale parameter
and shape parameter
, of which the density can be expressed as
For
and
, one has
Hence, an EM algorithm (Algorithm 1) to calculate the MLEs of the parameters
, and
is proposed as follows.
Algorithm 1 EM iterative algorithm. |
- Step 1
Let , and be the initial guess values of the MLEs for , and . - Step 2
In the th iterative:
(E-step) Replace any function of (say ) by , and the likelihood equations are replaced by
where
(M-step) The estimate of , namely , can be derived iteratively by solving the following nonlinear equations:
and the estimates of and , namely , can be further derived as
- Step 4
Stop the iteration, and find the EM-based estimates of , and when and for some given tolerance limit , for example .
|
Remark 1. From Wu [14], it is observed that, for samples , one has thatfollows the F distribution with and 2
degrees of freedom and is a strictly increasing function of β. Hence, for , one can choose the initial estimate of β from the following confidence interval:where is the right-tail percentile of the F distribution with a and b degrees of freedom and is the solution of β for equation . Meanwhile, one can also let equal the median of the distribution and find the root of β, which can also be utilized as the initial estimate for β.