Wu, Y.; Chen, R.; Li, Z.; Ye, M.; Dai, M.
SDD-YOLO: A Lightweight, High-Generalization Methodology for Real-Time Detection of Strip Surface Defects. Metals 2024, 14, 650.
https://doi.org/10.3390/met14060650
AMA Style
Wu Y, Chen R, Li Z, Ye M, Dai M.
SDD-YOLO: A Lightweight, High-Generalization Methodology for Real-Time Detection of Strip Surface Defects. Metals. 2024; 14(6):650.
https://doi.org/10.3390/met14060650
Chicago/Turabian Style
Wu, Yueyang, Ruihan Chen, Zhi Li, Minhua Ye, and Ming Dai.
2024. "SDD-YOLO: A Lightweight, High-Generalization Methodology for Real-Time Detection of Strip Surface Defects" Metals 14, no. 6: 650.
https://doi.org/10.3390/met14060650
APA Style
Wu, Y., Chen, R., Li, Z., Ye, M., & Dai, M.
(2024). SDD-YOLO: A Lightweight, High-Generalization Methodology for Real-Time Detection of Strip Surface Defects. Metals, 14(6), 650.
https://doi.org/10.3390/met14060650